Abstract: According to one embodiment, a memory system includes a nonvolatile memory, a random access memory and a controller. When writing n?1 data portions of a first unit that are included in n?1 error correction code frames of a first size, respectively, in the nonvolatile memory, the controller generates a second error correction code that constitutes an error correction code frame of a second size together with the n?1 data portions of the first unit and a second data portion to be written into the nonvolatile memory by encoding the n?1 data portions of the first unit and the second data portion, and writes the second data portion and the second error correction code into the nonvolatile memory.

Abstract: According to one embodiment, a memory system includes a non-volatile memory including first and second block groups, and a controller that performs a first write operation for the first block group and the first or a second write operation for the second block group. A first or second number of bits is written into a memory cell in the first or the second write operation. The second number of bits is larger than the first number of bits. The controller allocates a block to a buffer as a write destination block in the first write operation based on a degree of wear-out of at least one block, and writes data from an external device into the buffer in the first write operation.

Abstract: A memory system includes a memory device having a memory cell array, and a controller. The memory cell array includes a plurality of first units and at least one second unit. The second unit includes the plurality of first units. The controller counts a first number of times of read operation for each of the plurality of first units, and, in response to the first number of times for one first unit among the plurality of first units reaching a first value, updates a second number of times for the second unit that includes the one first unit. In response to the second number of times reaching a second value, the controller determines whether to rewrite data stored in at least one of the first units included in the second unit.

Abstract: According to one embodiment, a memory system includes a non-volatile memory, and a memory controller. The memory controller receives a write request for data, and determines a unit of a logical-to-physical address conversion which is a conversion between a logical address associated with the data and a physical address of the non-volatile memory into which the data is to be written, according to a size of the data.

Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes blocks each containing memory cells. The controller is configured to instruct the semiconductor memory to execute a first operation and a second operation. In the first operation and the second operation, the semiconductor memory selects at least one of the blocks, and applies at least one voltage to all memory cells contained in said selected blocks. A number of blocks to which said voltage is applied per unit time in the second operation is larger than that in the first operation.

Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes blocks each containing memory cells. The controller is configured to instruct the semiconductor memory to execute a first operation and a second operation. In the first operation and the second operation, the semiconductor memory selects at least one of the blocks, and applies at least one voltage to all memory cells contained in said selected blocks. A number of blocks to which said voltage is applied per unit time in the second operation is larger than that in the first operation.

Abstract: According to one embodiment, the semiconductor memory medium includes a first memory cell, a first word line coupled to the first memory cell, and a row decoder coupled to the first word line. A write operation is executed multiple times on the first memory cell within a first period from after an execution of an erase operation to an execution of a next erase operation. The write operation includes at least one of program loops each including a program operation and a verify operation. In the verify operation, the row decoder applies a verify voltage to the first word line. The verify voltage is set in accordance with a number of executed write operations on the first memory cell within the first period.

Abstract: According to one embodiment, the semiconductor memory medium includes a first memory cell, a first word line coupled to the first memory cell, and a row decoder coupled to the first word line. A write operation is executed multiple times on the first memory cell within a first period from after an execution of an erase operation to an execution of a next erase operation. The write operation includes at least one of program loops each including a program operation and a verify operation. In the verify operation, the row decoder applies a verify voltage to the first word line. The verify voltage is set in accordance with a number of executed write operations on the first memory cell within the first period.

Abstract: According to one embodiment, a memory system includes: a memory chip including a first memory block and first word lines, the first memory block including a first memory string which includes first memory cells that are coupled in series, the first word lines being respectively coupled to gates of the first memory cells; a memory controller coupled to an external device, controlling the memory chip, and capable of performing an error checking and correcting process of data. When a write instruction is received from the external device, the memory controller is configured to perform a write operation on a second memory cell which is one of the first memory cells, and to perform a read verify operation including a read process and the ECC process on a third memory cell which is one of the first memory cells.

Abstract: A memory system includes a non-volatile memory and a controller that includes a toggle encoder configured to encode first data having a first bit length and a first number of toggles, into second data having a second bit length longer than the first bit length and a second number of toggles smaller than the first number of toggles, and transmit the second data to the non-volatile memory. The memory system may further include a toggle decoder configured to decode third data received from the non-volatile memory into fourth data, the third data having the second bit length and the second number of toggles and the fourth data having the first bit length and the first number of toggles.

Abstract: A memory system comprises a nonvolatile memory having a plurality of memory cells and a memory controller for controlling the nonvolatile memory. The plurality of memory cells is divided into different groups, and each group is assigned a threshold read count value from a predetermined range of read count values. The memory controller includes a counter which tracks a read count for each group, a determination circuit configured to compare the read count for each group tracked by the counter to the assigned threshold read count value for the group, and a nonvolatile memory read/write circuit configured to read data from the group when the determination circuit indicates the read count for the group has reached the assigned threshold read count value.

Abstract: According to one embodiment, the semiconductor memory medium includes a first memory cell, a first word line coupled to the first memory cell, and a row decoder coupled to the first word line. A write operation is executed multiple times on the first memory cell within a first period from after an execution of an erase operation to an execution of a next erase operation. The write operation includes at least one of program loops each including a program operation and a verify operation. In the verify operation, the row decoder applies a verify voltage to the first word line. The verify voltage is set in accordance with a number of executed write operations on the first memory cell within the first period.

Abstract: A memory system includes a nonvolatile memory including a plurality of blocks, in each of which a plurality of memory cells is arranged between bit lines and a source line, and a memory controller configured to control an operation of the nonvolatile memory. The memory controller is configured to issue a warming command to the nonvolatile memory when a temperature of the nonvolatile memory is lower than a first temperature, and the nonvolatile memory, in response to the warming command, causes current to flow through at least one bit line connected to memory cells of a first block.

Abstract: A memory system includes a non-volatile memory and a controller that includes a toggle encoder configured to encode first data having a first bit length and a first number of toggles, into second data having a second bit length longer than the first bit length and a second number of toggles smaller than the first number of toggles, and transmit the second data to the non-volatile memory. The memory system may further include a toggle decoder configured to decode third data received from the non-volatile memory into fourth data, the third data having the second bit length and the second number of toggles and the fourth data having the first bit length and the first number of toggles.

Abstract: A memory system comprises a nonvolatile memory having a plurality of memory cells and a memory controller for controlling the nonvolatile memory. The plurality of memory cells is divided into different groups, and each group is assigned a threshold read count value from a predetermined range of read count values. The memory controller includes a counter which tracks a read count for each group, a determination circuit configured to compare the read count for each group tracked by the counter to the assigned threshold read count value for the group, and a nonvolatile memory read/write circuit configured to read data from the group when the determination circuit indicates the read count for the group has reached the assigned threshold read count value.

Abstract: According to one embodiment, a memory system includes: a memory chip including a first memory block and first word lines, the first memory block including a first memory string which includes first memory cells that are coupled in series, the first word lines being respectively coupled to gates of the first memory cells; a memory controller coupled to an external device, controlling the memory chip, and capable of performing an error checking and correcting process of data. When a write instruction is received from the external device, the memory controller is configured to perform a write operation on a second memory cell which is one of the first memory cells, and to perform a read verify operation including a read process and the ECC process on a third memory cell which is one of the first memory cells.

Abstract: According to one embodiment, a memory system includes a nonvolatile memory, a random access memory and a controller. When writing n?1 data portions of a first unit that are included in n?1 error correction code frames of a first size, respectively, in the nonvolatile memory, the controller generates a second error correction code that constitutes an error correction code frame of a second size together with the n?1 data portions of the first unit and a second data portion to be written into the nonvolatile memory by encoding the n?1 data portions of the first unit and the second data portion, and writes the second data portion and the second error correction code into the nonvolatile memory.

Abstract: According to one embodiment, the semiconductor memory medium includes a first memory cell, a first word line coupled to the first memory cell, and a row decoder coupled to the first word line. A write operation is executed multiple times on the first memory cell within a first period from after an execution of an erase operation to an execution of a next erase operation. The write operation includes at least one of program loops each including a program operation and a verify operation. In the verify operation, the row decoder applies a verify voltage to the first word line. The verify voltage is set in accordance with a number of executed write operations on the first memory cell within the first period.

Abstract: A memory system includes a nonvolatile memory, a buffer, and a controller. The buffer can temporarily store a plurality of data bits to be written to the nonvolatile memory. The controller can write the plurality of data bits, read from the buffer, to the nonvolatile memory; write a plurality of intermediate parity bits to the buffer, but not to the nonvolatile memory, wherein each of the plurality of intermediate parity bits is associated with an error correction process on each of the plurality of data bits; and write, to the nonvolatile memory, an accumulated parity bit that is an integration of the plurality of intermediate parity bits.

Abstract: A memory system includes a nonvolatile memory that has a plurality of physical blocks, and a memory controller circuit configured to execute encoding of data to be written in the nonvolatile memory and decoding of data read from the nonvolatile memory, execute garbage collection for the nonvolatile memory, and determine whether or not decoding and encoding is to be executed, for data which is read from a valid cluster of a physical block targeted for garbage collection.