Abstract: A method of treating systemic sclerosis in a patient administers an IL-23 specific antibody, e.g., guselkumab, at an initial dose and subsequent doses in order for the patient to respond to the antibody and meet one or more of the clinical endpoints.

Abstract: A plurality of unit MISFET elements connected in parallel with each other to make up a power MISFET are formed in an LDMOSFET forming region on a main surface of a semiconductor substrate. A control circuit that controls a gate voltage of the power MISFET is formed in a driver circuit region on the main surface of the semiconductor substrate. A wiring structure having a plurality of wiring layers made of the same metal material is formed on the semiconductor substrate. The gate electrodes of the plurality of unit MISFET elements formed in the LDMOSFET forming region are electrically connected to each other via gate wirings formed in all of the plurality of wiring layers made of the same metal material.

Abstract: A plurality of unit MISFET elements connected in parallel with each other to make up a power MISFET are formed in an LDMOSFET forming region on a main surface of a semiconductor substrate. A control circuit that controls a gate voltage of the power MISFET is formed in a driver circuit region on the main surface of the semiconductor substrate. A wiring structure having a plurality of wiring layers made of the same metal material is formed on the semiconductor substrate. The gate electrodes of the plurality of unit MISFET elements formed in the LDMOSFET forming region are electrically connected to each other via gate wirings formed in all of the plurality of wiring layers made of the same metal material.

Abstract: A plurality of unit MISFET elements connected in parallel with each other to make up a power MISFET are formed in an LDMOSFET forming region on a main surface of a semiconductor substrate. A control circuit that controls a gate voltage of the power MISFET is formed in a driver circuit region on the main surface of the semiconductor substrate. A wiring structure having a plurality of wiring layers made of the same metal material is formed on the semiconductor substrate. The gate electrodes of the plurality of unit MISFET elements formed in the LDMOSFET forming region are electrically connected to each other via gate wirings formed in all of the plurality of wiring layers made of the same metal material.

Abstract: A plurality of unit MISFET elements connected in parallel with each other to make up a power MISFET are formed in an LDMOSFET forming region on a main surface of a semiconductor substrate. A control circuit that controls a gate voltage of the power MISFET is formed in a driver circuit region on the main surface of the semiconductor substrate. A wiring structure having a plurality of wiring layers made of the same metal material is formed on the semiconductor substrate. The gate electrodes of the plurality of unit MISFET elements formed in the LDMOSFET forming region are electrically connected to each other via gate wirings formed in all of the plurality of wiring layers made of the same metal material.

Abstract: A plurality of unit MISFET elements connected in parallel with each other to make up a power MISFET are formed in an LDMOSFET forming region on a main surface of a semiconductor substrate. A control circuit that controls a gate voltage of the power MISFET is formed in a driver circuit region on the main surface of the semiconductor substrate. A wiring structure having a plurality of wiring layers made of the same metal material is formed on the semiconductor substrate. The gate electrodes of the plurality of unit MISFET elements formed in the LDMOSFET forming region are electrically connected to each other via gate wirings formed in all of the plurality of wiring layers made of the same metal material.

Abstract: A plurality of unit MISFET elements connected in parallel with each other to make up a power MISFET are formed in an LDMOSFET forming region on a main surface of a semiconductor substrate. A control circuit that controls a gate voltage of the power MISFET is formed in a driver circuit region on the main surface of the semiconductor substrate. A wiring structure having a plurality of wiring layers made of the same metal material is formed on the semiconductor substrate. The gate electrodes of the plurality of unit MISFET elements formed in the LDMOSFET forming region are electrically connected to each other via gate wirings formed in all of the plurality of wiring layers made of the same metal material.

Abstract: To provide a method for producing an organic compound having a sulfo group by efficiently hydrolyzing an organic compound having a fluorosulfonyl group with a small number of steps with a small quantity of waste liquid. A method for producing an organic compound having a sulfo group, which comprises bringing an organic compound having a fluorosulfonyl group into contact with subcritical water at from 200 to 320° C. to convert the fluorosulfonyl group into a sulfo group.

Abstract: To provide a method for producing an organic compound having a sulfo group by efficiently hydrolyzing an organic compound having a fluorosulfonyl group with a small number of steps with a small quantity of waste liquid. A method for producing an organic compound having a sulfo group, which comprises bringing an organic compound having a fluorosulfonyl group into contact with subcritical water at from 200 to 320° C. to convert the fluorosulfonyl group into a sulfo group.

Abstract: A signal line is formed in the a-th layer (a?2) of a multi-layered interconnect layer and a redistribution layer. A plain line is formed in the b-th layer (b<a) of the multi-layered interconnect layer and the redistribution layer and overlaps with the signal line when seen in a plan view. Two coplanar lines that are formed in the c-th layer (b?c?a) of the multi-layered interconnect layer and the redistribution layer, extend in parallel to the signal line when seen in a plan view, and interpose the signal line therebetween. A distance h from the signal line to the plain line is smaller than a distance w from the signal line to the coplanar lines. A power supply line, a ground line, and another signal line are not located within the range of the height equal to the distance w from the signal line above the signal line.

Abstract: The present invention provides an improved manufacturing stability of a semiconductor device provided with a spiral inductor. The semiconductor device 100 includes a silicon substrate 101, an element isolating oxide film embedded within the silicon substrate 101, a first insulating interlayer provided on the silicon substrate 101, a spiral inductor 120 provided on the first insulating interlayer, and a shielding layer, which is provided between the spiral inductor 120 and the silicon substrate 101, and elongates toward a direction along the surface of the substrate to provide a shield between the spiral inductor 120 and the silicon substrate 101. Then, a plurality of substrate remaining regions 131 formed by the silicon substrate 101 partially remaining in the element isolating oxide film in a form of islands from the upper viewpoint are selectively provided right under the polysilicon 105 in the region for forming the spiral inductor 120.

Abstract: The present invention provides an improved manufacturing stability of a semiconductor device provided with a spiral inductor. The semiconductor device 100 includes a silicon substrate 101, an element isolating oxide film embedded within the silicon substrate 101, a first insulating interlayer provided on the silicon substrate 101, a spiral inductor 120 provided on the first insulating interlayer, and a shielding layer, which is provided between the spiral inductor 120 and the silicon substrate 101, and elongates toward a direction along the surface of the substrate to provide a shield between the spiral inductor 120 and the silicon substrate 101. Then, a plurality of substrate remaining regions 131 formed by the silicon substrate 101 partially remaining in the element isolating oxide film in a form of islands from the upper viewpoint are selectively provided right under the polysilicon 105 in the region for forming the spiral inductor 120.

Abstract: A semiconductor device includes a semiconductor substrate, and a multi-layered wiring arrangement formed on the semiconductor substrate and having insulating interlayers stacked in order thereon. A first inductor is formed on one of the insulating layers of the multi-layered wiring arrangement. A second inductor has a smaller size than the first inductor, and is formed on the same insulating interlayer as the first inductor, so that the second inductor is arranged inside of the first inductor.