Patents by Inventor Takehiro Hato

Takehiro Hato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240053405
    Abstract: In a state estimation method of an embodiment, from time series data representing a time change of a main physical quantity concerning an estimation target, a local maximum and minimum values of the main physical quantity, and an inter-extreme-value time from an extreme value to the next extreme value are extracted. In the state estimation method, a state change speed of the estimation target is calculated based on relationship data representing the relationship of the state change speed with the local maximum and minimum values and the extracted local maximum and minimum values. In the state estimation method, a state change amount of the estimation target is calculated for each inter-extreme-value time based on the extracted inter-extreme-value time and the calculated state change speed.
    Type: Application
    Filed: February 14, 2023
    Publication date: February 15, 2024
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Atsuro OONISHI, Takehiro HATO, Hideki ITO
  • Patent number: 11249028
    Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
    Type: Grant
    Filed: October 26, 2020
    Date of Patent: February 15, 2022
    Assignee: KABUSHIKI KAISHA TOSHIBA
    Inventors: Takahiro Kamikawa, Hiroshi Ohno, Takehiro Hato
  • Publication number: 20210041372
    Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
    Type: Application
    Filed: October 26, 2020
    Publication date: February 11, 2021
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Takahiro KAMIKAWA, Hiroshi OHNO, Takehiro HATO
  • Patent number: 10901134
    Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.
    Type: Grant
    Filed: February 28, 2019
    Date of Patent: January 26, 2021
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Hiroshi Ohno, Takahiro Kamikawa, Takehiro Hato, Hiroya Kano
  • Patent number: 10852243
    Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
    Type: Grant
    Filed: September 4, 2018
    Date of Patent: December 1, 2020
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Takahiro Kamikawa, Hiroshi Ohno, Takehiro Hato
  • Patent number: 10620389
    Abstract: An optical inspection apparatus includes an imaging optical system facing an inspection target, a light guide, a plurality of light sources, and a plurality of mirror surfaces. The light guide has a plurality of corner portions and extending along an optical axis of the imaging optical system. The plurality of light sources face a first end face of the light guide at positions corresponding to the plurality of corner portions. The plurality of mirror surfaces are respectively provided on second end faces of the light guide. Each of the mirror surfaces is oblique relative to the optical axis. The mirror surfaces are configured to reflect light entered into the light guide from the light sources toward the inspection target.
    Type: Grant
    Filed: August 30, 2019
    Date of Patent: April 14, 2020
    Assignee: Kabushiki Kaisha Toshiba
    Inventors: Takahiro Kamikawa, Hiroshi Ohno, Takehiro Hato
  • Publication number: 20200088933
    Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.
    Type: Application
    Filed: February 28, 2019
    Publication date: March 19, 2020
    Applicant: KABUSHIKI KAISHA TOSHIBA
    Inventors: Hiroshi OHNO, Takahiro KAMIKAWA, Takehiro HATO, Hiroya KANO
  • Publication number: 20190219515
    Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.
    Type: Application
    Filed: September 4, 2018
    Publication date: July 18, 2019
    Applicant: Kabushiki Kaisha Toshiba
    Inventors: Takahiro KAMIKAWA, Hiroshi Ohno, Takehiro Hato
  • Publication number: 20090235733
    Abstract: According to one aspect of the invention, there is provided a metal disk discrimination apparatus including: two magnetic sensors configured to sandwich a target metal disk, the magnetic sensor including: a core having: leg portions exhibiting opposite magnetic polarities, the leg portion having an end face facing the target metal disk, and a connection portion magnetically connecting the leg portions; and coils respectively wound on the leg portions; an oscillation circuit that passes an alternating current through the coil; and a signal processing unit that determines a shape of the target metal disk by comparing an output signal of the magnetic sensors with a reference value, the output signal corresponding to a change in impedance of the coils. A radius of curvature of the end face in a part adjacent to another end face is not larger than a radius of the target metal disk.
    Type: Application
    Filed: January 29, 2009
    Publication date: September 24, 2009
    Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA TEC KABUSHIKI KAISHA
    Inventors: Takehiro Hato, Toshikatsu Akiba, Kazumi Kotani