Patents by Inventor Takehiro Hato
Takehiro Hato has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240053405Abstract: In a state estimation method of an embodiment, from time series data representing a time change of a main physical quantity concerning an estimation target, a local maximum and minimum values of the main physical quantity, and an inter-extreme-value time from an extreme value to the next extreme value are extracted. In the state estimation method, a state change speed of the estimation target is calculated based on relationship data representing the relationship of the state change speed with the local maximum and minimum values and the extracted local maximum and minimum values. In the state estimation method, a state change amount of the estimation target is calculated for each inter-extreme-value time based on the extracted inter-extreme-value time and the calculated state change speed.Type: ApplicationFiled: February 14, 2023Publication date: February 15, 2024Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Atsuro OONISHI, Takehiro HATO, Hideki ITO
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Patent number: 11249028Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.Type: GrantFiled: October 26, 2020Date of Patent: February 15, 2022Assignee: KABUSHIKI KAISHA TOSHIBAInventors: Takahiro Kamikawa, Hiroshi Ohno, Takehiro Hato
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Publication number: 20210041372Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.Type: ApplicationFiled: October 26, 2020Publication date: February 11, 2021Applicant: Kabushiki Kaisha ToshibaInventors: Takahiro KAMIKAWA, Hiroshi OHNO, Takehiro HATO
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Patent number: 10901134Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.Type: GrantFiled: February 28, 2019Date of Patent: January 26, 2021Assignee: Kabushiki Kaisha ToshibaInventors: Hiroshi Ohno, Takahiro Kamikawa, Takehiro Hato, Hiroya Kano
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Patent number: 10852243Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.Type: GrantFiled: September 4, 2018Date of Patent: December 1, 2020Assignee: Kabushiki Kaisha ToshibaInventors: Takahiro Kamikawa, Hiroshi Ohno, Takehiro Hato
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Patent number: 10620389Abstract: An optical inspection apparatus includes an imaging optical system facing an inspection target, a light guide, a plurality of light sources, and a plurality of mirror surfaces. The light guide has a plurality of corner portions and extending along an optical axis of the imaging optical system. The plurality of light sources face a first end face of the light guide at positions corresponding to the plurality of corner portions. The plurality of mirror surfaces are respectively provided on second end faces of the light guide. Each of the mirror surfaces is oblique relative to the optical axis. The mirror surfaces are configured to reflect light entered into the light guide from the light sources toward the inspection target.Type: GrantFiled: August 30, 2019Date of Patent: April 14, 2020Assignee: Kabushiki Kaisha ToshibaInventors: Takahiro Kamikawa, Hiroshi Ohno, Takehiro Hato
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Publication number: 20200088933Abstract: According to one embodiment, an optical inspection apparatus including: an imaging optical system; one or more light sources; a light guide which extends cylindrically along an optical axis of the imaging optical system and whose end face is opposed to the one or more light sources; a total reflecting surface formed on an inner surface of the light guide to totally internally reflect light struck into the light guide from the end face; a mirror surface formed on an outer surface of the light guide to reflect light struck into the light guide from the one or more light sources, toward the inspection target; and a transmission surface formed on the inner surface of the light guide to transmit the light reflected by the mirror surface, toward the inspection target.Type: ApplicationFiled: February 28, 2019Publication date: March 19, 2020Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Hiroshi OHNO, Takahiro KAMIKAWA, Takehiro HATO, Hiroya KANO
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Publication number: 20190219515Abstract: An apparatus for inspecting object surface according to an embodiment includes: an imaging device including an imaging area; an optical source; and a group of optical devices including a mirror and a lens, and causing a reflected light other than a regular reflection light from an object to be reflected by a mirror surface of the mirror, and to form an image in the imaging area of the imaging device through the lens, the regular reflection light being caused by a light incident to a surface of the object from the optical source, wherein the optical source, the mirror, the lens, and the imaging device are arranged in such a manner that the regular reflection light is not incident to the imaging area of the imaging device through the mirror and the lens.Type: ApplicationFiled: September 4, 2018Publication date: July 18, 2019Applicant: Kabushiki Kaisha ToshibaInventors: Takahiro KAMIKAWA, Hiroshi Ohno, Takehiro Hato
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Publication number: 20090235733Abstract: According to one aspect of the invention, there is provided a metal disk discrimination apparatus including: two magnetic sensors configured to sandwich a target metal disk, the magnetic sensor including: a core having: leg portions exhibiting opposite magnetic polarities, the leg portion having an end face facing the target metal disk, and a connection portion magnetically connecting the leg portions; and coils respectively wound on the leg portions; an oscillation circuit that passes an alternating current through the coil; and a signal processing unit that determines a shape of the target metal disk by comparing an output signal of the magnetic sensors with a reference value, the output signal corresponding to a change in impedance of the coils. A radius of curvature of the end face in a part adjacent to another end face is not larger than a radius of the target metal disk.Type: ApplicationFiled: January 29, 2009Publication date: September 24, 2009Applicants: KABUSHIKI KAISHA TOSHIBA, TOSHIBA TEC KABUSHIKI KAISHAInventors: Takehiro Hato, Toshikatsu Akiba, Kazumi Kotani