Patents by Inventor Takehiro Imai

Takehiro Imai has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8958067
    Abstract: A light scattering particle counter that improves the signal-to-noise ratio by attenuating the high frequency noise component while suppressing the attenuation of the signal component by irradiating a sample fluid with a laser beam La to form a particle detection area, detecting a particle with a multi-channel light detecting element that receives scattered light Ls from a particle passing through the particle detection area, and with low pass filters having time constants ?c, ?m, ?e that are set to depend on beam diameter of the laser beam La and flow velocity of the fluid which flows through each divided area, to count particles in the sample fluid.
    Type: Grant
    Filed: November 5, 2013
    Date of Patent: February 17, 2015
    Assignee: Rion Co., Ltd.
    Inventors: Masaki Shimmura, Takehiro Imai, Takuya Tabuchi
  • Publication number: 20140285802
    Abstract: [Subject] To offer a light scattering particle counter that improves the SN ratio by sufficiently attenuating the high frequency noise component while suppressing the attenuation of the signal component. [Means for Solving the Problems] A light scattering particle counter which irradiates a laser beam La to a sample fluid and forms a particle detection area 13, a multi-channel light detecting element receives scattered light Ls from a particle passing through the particle detection area and detects the particle, the time constants ?c, ?m, ?e of the low pass filters F1, F2, F3, F4, F5 are set depending on the beam diameter of the laser beam La and the flow velocity of the fluid which flows through each divided area.
    Type: Application
    Filed: November 5, 2013
    Publication date: September 25, 2014
    Applicant: Rion Co., Ltd.
    Inventors: Masaki SHIMMURA, Takehiro IMAI, Takuya TABUCHI
  • Patent number: 8497989
    Abstract: A particle counting method that can count the number of the particles precisely. The method discriminates a wave pattern of the scattered light from a normal particle (subject of the counting) and a wave pattern of the light scattered by the agitation such as a floating particle, a radiation or changes in the intensity of the light. In one embodiment, a method for counting particles is disclosed which irradiates a light to a sample gas, detects a scattered light from a particle included in the sample gas by a photoelectric conversion device, counts the number of the particles of every particle size division by the output voltage wave pattern of the photoelectric conversion device, calculate a time difference (Ta?T1) from a point (T1) being a peak of output voltage wave pattern and a point (Ta) being a falling detection threshold (A), when the time difference (Ta?T1) is beyond counting cancellation time (B), the output voltage wave pattern is not counted as a particle.
    Type: Grant
    Filed: November 30, 2011
    Date of Patent: July 30, 2013
    Assignee: Rion Co., Ltd.
    Inventors: Takehiro Imai, Tomonobu Matsuda, Toshiyuki Abe, Tsutomu Nakajima
  • Publication number: 20120133936
    Abstract: A particle counting method that can count the number of the particles precisely. The method discriminates a wave pattern of the scattered light from a normal particle (subject of the counting) and a wave pattern of the light scattered by the agitation such as a floating particle, a radiation or changes in the intensity of the light. In one embodiment, a method for counting particles is disclosed which irradiates a light to a sample gas, detects a scattered light from a particle included in the sample gas by a photoelectric conversion device, counts the number of the particles of every particle size division by the output voltage wave pattern of the photoelectric conversion device, calculate a time difference (Ta?T1) from a point (T1) being a peak of output voltage wave pattern and a point (Ta) being a falling detection threshold (A), when the time difference (Ta?T1) is beyond counting cancellation time (B), the output voltage wave pattern is not counted as a particle.
    Type: Application
    Filed: November 30, 2011
    Publication date: May 31, 2012
    Applicant: RION CO., LTD.
    Inventors: Takehiro IMAI, Tomonobu MATSUDA, Toshiyuki ABE, Tsutomu NAKAJIMA
  • Patent number: 8013865
    Abstract: An image generation system including: a drawing section which draws an object to generate image data; and an overdrive effect processing section which performs overdrive effect processing for the generated image data and generates image data to be output to a display section. The overdrive effect processing section performs the overdrive effect processing based on differential image data between image data generated in a Kth frame and image data generated in a Jth frame (K>J).
    Type: Grant
    Filed: September 14, 2009
    Date of Patent: September 6, 2011
    Assignee: Namco Bandai Games Inc.
    Inventors: Takehiro Imai, Toshihiro Kushizaki, Naohiro Saito, Shigeki Tomisawa, Yoshihito Iwanaga
  • Publication number: 20100156918
    Abstract: An image generation system including: a drawing section which draws an object to generate image data; and an overdrive effect processing section which performs overdrive effect processing for the generated image data and generates image data to be output to a display section. The overdrive effect processing section performs the overdrive effect processing based on differential image data between image data generated in a Kth frame and image data generated in a Jth frame (K>J).
    Type: Application
    Filed: September 14, 2009
    Publication date: June 24, 2010
    Applicant: NAMCO BANDAI GAMES INC.
    Inventors: Takehiro IMAI, Toshihiro KUSHIZAKI, Naohiro SAITO, Shigeki TOMISAWA, Yoshihito IWANAGA
  • Patent number: 7609276
    Abstract: An image generation system including: a drawing section which draws an object to generate image data; and an overdrive effect processing section which performs overdrive effect processing for the generated image data and generates image data to be output to a display section. The overdrive effect processing section performs the overdrive effect processing based on differential image data between image data generated in a Kth frame and image data generated in a Jth frame (K>J).
    Type: Grant
    Filed: July 14, 2006
    Date of Patent: October 27, 2009
    Assignee: Namco Bandai Games Inc.
    Inventors: Takehiro Imai, Toshihiro Kushizaki, Naohiro Saito, Shigeki Tomisawa, Yoshihito Iwanaga
  • Publication number: 20070019003
    Abstract: An image generation system including: a drawing section which draws an object to generate image data; and an overdrive effect processing section which performs overdrive effect processing for the generated image data and generates image data to be output to a display section. The overdrive effect processing section performs the overdrive effect processing based on differential image data between image data generated in a Kth frame and image data generated in a Jth frame (K>J).
    Type: Application
    Filed: July 14, 2006
    Publication date: January 25, 2007
    Applicant: NAMCO BANDAI Games Inc.
    Inventors: Takehiro Imai, Toshihiro Kushizaki, Naohiro Saito, Shigeki Tomisawa, Yoshihito Iwanaga
  • Patent number: 5310425
    Abstract: A toner concentration detecting device for detecting a toner concentration of a two component developer including a differential transformer which is connected with a phase detecting circuit. A variable capacitance diode is connected between the primary coil and the secondary coil and a variable resistor is provided to supply the variable capacitance diode with a DC voltage to vary the capacitance of the diode. The variable resistor and DC voltage are located at a remote location from the transformer.
    Type: Grant
    Filed: February 9, 1993
    Date of Patent: May 10, 1994
    Assignee: TDK Corporation
    Inventors: Shiro Nakagawa, Taisuke Domon, Takehiro Imai, Eiji Takahishi
  • Patent number: 5065625
    Abstract: A humidity meter includes a humidity-frequency converter which is essentially a pulse oscillator, the frequency of which depends upon the impedance of a humidity sensor, a pulse width modulator for adjusting pulse width of an output pulse of the converter for assuring a linear relationship between humidity and the output signal, and an integrator for integrating the output of the pulse width modulator to provide an output signal as a DC level. A feedback path is provided to apply the output signal to the pulse width modulator for assuring a linear output irrespective of the exponential characteristics of the humidity sensor.
    Type: Grant
    Filed: May 2, 1990
    Date of Patent: November 19, 1991
    Assignee: TDK Corporation
    Inventors: Shiro Nakagawa, Taisuke Domon, Takehiro Imai, Atsuko Tsuchida