Abstract: It is an object of the present invention to provide a technique capable of performing user estimation without making the user aware of it. The appliance has a first sensor input unit that inputs a plurality of control commands for controlling an operation, and estimates the user based on the control command input to the first sensor input unit and an operation feature amount at the time of inputting the control command. The first sensor input unit includes a touch panel. The operation feature amount includes an operation position of the touch panel, an electrostatic capacitance value corresponding to a pressing of the touch panel, and a time-dependent change pattern thereof.

Abstract: There is a need to acquire more reliable profile information without relying on only the personal subjective judgment on the profile information. Profile information about a dweller is automatically extracted by evaluating and comprehensively determining each of feature amounts concerning the dweller from sensing data acquired from a sensor or a usage log concerning an equipment instrument in a living space based on a criterion for the feature amounts predetermined for a profile item. The reliability of the self-reported profile information is evaluated by comparing and verifying the automatically extracted profile information with the self-reported profile information supplied by the dweller.

Abstract: It is an object of the present invention to provide a technique capable of performing user estimation without making the user aware of it. The appliance has a first sensor input unit that inputs a plurality of control commands for controlling an operation, and estimates the user based on the control command input to the first sensor input unit and an operation feature amount at the time of inputting the control command. The first sensor input unit includes a touch panel. The operation feature amount includes an operation position of the touch panel, an electrostatic capacitance value corresponding to a pressing of the touch panel, and a time-dependent change pattern thereof.

Abstract: There is a need to acquire more reliable profile information without relying on only the personal subjective judgment on the profile information. Profile information about a dweller is automatically extracted by evaluating and comprehensively determining each of feature amounts concerning the dweller from sensing data acquired from a sensor or a usage log concerning an equipment instrument in a living space based on a criterion for the feature amounts predetermined for a profile item. The reliability of the self-reported profile information is evaluated by comparing and verifying the automatically extracted profile information with the self-reported profile information supplied by the dweller.

Abstract: A microcomputer includes a bus, a CPU (Central Processing Unit) coupled to the bus, a RAM (Random-access Memory) coupled to the bus, and an AD (Analog-to-Digital) converter coupled to the bus. The AD converter includes a switching circuit for switching between an analog signal and a reference potential, a first DA (Digital-to-Analog) converter including a plurality of first capacitors each having one end that can be individually coupled to the switching circuit and the other end coupled to a common output line, one or a plurality of testing capacitors that are dedicated for testing, each having one end to which the reference potential or a potential obtained by dividing the reference potential can be individually inputted, and a control circuit. In a normal mode, the control circuit determines a digital value corresponding to the analog signal, based on the output line.

Abstract: To determine the accuracy of an AD converter more simply than in the related art, a semiconductor device includes a successive approximation AD converter. The AD converter includes one or a plurality of testing capacitors used in a test mode, separately from a C-DAC used for AD conversion in a normal mode. In the test mode, the accuracy of a capacitor under test among a plurality of capacitors configuring the C-DAC is determined by comparing a potential occurring in the capacitor under test and a potential occurring in the testing capacitors.

Abstract: To determine the accuracy of an AD converter more simply than in the related art, a semiconductor device includes a successive approximation AD converter. The AD converter includes one or a plurality of testing capacitors used in a test mode, separately from a C-DAC used for AD conversion in a normal mode. In the test mode, the accuracy of a capacitor under test among a plurality of capacitors configuring the C-DAC is determined by comparing a potential occurring in the capacitor under test and a potential occurring in the testing capacitors.