Patents by Inventor Takeki Andoh

Takeki Andoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and device for testing wafers
    Patent number: 10295591
    Abstract: Circuits and methods for testing wafers are disclosed herein. An embodiment of a method includes electrically contacting a first probe and a second probe to a wafer. A gas is blown in the areas proximate the first probe and the second probe. An electric potential is then applied between the first probe and the second probe while the gas is being blown.
    Type: Grant
    Filed: January 2, 2013
    Date of Patent: May 21, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Takeki Andoh, Hiroshi Kubota
  • METHOD AND DEVICE FOR TESTING WAFERS
    Publication number: 20140184259
    Abstract: Circuits and methods for testing wafers are disclosed herein. An embodiment of a method includes electrically contacting a first probe and a second probe to a wafer. A gas is blown in the areas proximate the first probe and the second probe. An electric potential is then applied between the first probe and the second probe while the gas is being blown.
    Type: Application
    Filed: January 2, 2013
    Publication date: July 3, 2014
    Applicant: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Takeki Andoh, Hiroshi Kubota