Patents by Inventor Takeo Anazawa

Takeo Anazawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9831335
    Abstract: Provided is a semiconductor apparatus includes: a gate electrode disposed inside a trench and opposedly facing a p type base region with a gate insulating film interposed therebetween on a portion of a side wall; a shield electrode disposed inside the trench and positioned between the gate electrode and a bottom of the trench; an electric insulating region disposed inside the trench, the electric insulating region expanding between the gate electrode and the shield electrode, and further expanding along the side wall and the bottom of the trench so as to separate the shield electrode from the side wall and the bottom; a source electrode electrically connected to an n+ type source region and the shield electrode, wherein the shield electrode has a high resistance region positioned on an n+ drain region side, and a low resistance region positioned on a gate electrode side.
    Type: Grant
    Filed: February 20, 2015
    Date of Patent: November 28, 2017
    Assignee: SHINDENGEN ELECTRIC MANUFACTURING CO., LTD.
    Inventors: Masato Kishi, Yuji Watanabe, Toshiyuki Takemori, Takeo Anazawa, Toshitaka Akimoto
  • Publication number: 20170222037
    Abstract: Provided is a semiconductor apparatus includes: a gate electrode disposed inside a trench and opposedly facing a p type base region with a gate insulating film interposed therebetween on a portion of a side wall; a shield electrode disposed inside the trench and positioned between the gate electrode and a bottom of the trench; an electric insulating region disposed inside the trench, the electric insulating region expanding between the gate electrode and the shield electrode, and further expanding along the side wall and the bottom of the trench so as to separate the shield electrode from the side wall and the bottom; a source electrode electrically connected to an n+ type source region and the shield electrode, wherein the shield electrode has a high resistance region positioned on an n+ drain region side, and a low resistance region positioned on a gate electrode side.
    Type: Application
    Filed: February 20, 2015
    Publication date: August 3, 2017
    Applicant: Shindengen Electric Manufacturing Co., Ltd.
    Inventors: Masato KISHI, Yuji WATANABE, Toshiyuki TAKEMORI, Takeo ANAZAWA, Toshitaka AKIMOTO
  • Patent number: 5693966
    Abstract: Propagation delay times of an input signal from an input terminal to respective gates are equalized and accelerated with a power MOS transistor that includes a plurality of transistor blocks. The transistor blocks are formed by sources being connected to each other by a first electric conductive layer (8.sub.2, 8.sub.4, 8.sub.6 and 10), drains being connected to each other by a second electric conductive layer (8.sub.1, 8.sub.3, 8.sub.5 and 9), and gates (6) consisting of a continuous semiconductor layer. The transistor has a third electric conductive layer (11) being connected to a gate terminal Gin and laminated on the gates. The third electric conductive layer laminated on the gates functions to equalize and accelerate propagation delay times of an input signal from an input terminal to the respective gates.
    Type: Grant
    Filed: January 16, 1996
    Date of Patent: December 2, 1997
    Assignee: Motorola, Inc.
    Inventors: Takeo Anazawa, Hidetaka Fukazawa