Abstract: A walking state measurement device according to the present invention includes: at least one memory storing a set of instructions; and at least one processor configured to execute the set of instructions to: estimate a floor reaction force by use of at least either of motion data and lower limb vertical load data of a walker, and outputting the floor reaction force as floor reaction force data; and calculate a walking state of the walker by use of at least either of the motion data and the floor reaction force data, and outputting the walking state.

Abstract: Provided is to determine a walking state when a target person uses a stick. A walking state determination device according to an embodiment of the present invention includes: an acquisition unit that acquires feature information indicating a feature of a motion of a target person when using a stick, based on first measurement data acquired from a first sensor installed at the stick and second measurement data acquired from a second sensor installed at the target person; and a determination unit that determines a walking state of the target person, based on the acquired feature information.

Abstract: A body weight estimation device includes: a data reception unit that receives gait data including the gait characteristics of a walking person; a first calculation unit that extracts a feature quantity based on the gait characteristics of the walking person from the gait data; a second calculation unit that generates a learning model by learning a correlation between the feature quantity extracted by the first calculation unit and body weight information about the walking person, using the gait data as sample data; and an estimation unit that estimates the body weight information associated with the gait data of an estimation target by inputting the gait data of the estimation target to the learning model.

Abstract: Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface.

Abstract: A walking state measurement device according to the present invention includes: at least one memory storing a set of instructions; and at least one processor configured to execute the set of instructions to: estimate a floor reaction force by use of at least either of motion data and lower limb vertical load data of a walker, and outputting the floor reaction force as floor reaction force data; and calculate a walking state of the walker by use of at least either of the motion data and the floor reaction force data, and outputting the walking state.

Abstract: Provided is to determine a walking state when a target person uses a stick. A walking state determination device according to an embodiment of the present invention includes: an acquisition unit that acquires feature information indicating a feature of a motion of a target person when using a stick, based on first measurement data acquired from a first sensor installed at the stick and second measurement data acquired from a second sensor installed at the target person; and a determination unit that determines a walking state of the target person, based on the acquired feature information.

Abstract: An information processing device according to the present invention, includes: an information accumulation unit which receives and accumulates control-target information that includes information related to a control target and an environment including the control target; a prediction-equation-set learning and generation unit which learns and generates a prediction-equation set to be used for determination of an operation quantity of the control target based on the control-target information accumulated in the information accumulation unit; and an operation-quantity determination unit which receives input information needed for determination of an operation quantity of the control target, constructs a predictive-control model of the control target based on the prediction-equation set, the control-target information accumulated in the information accumulation unit, the control-target information received, and the input information, and determines an operation quantity used for control of the control target.

Abstract: Provided are a reference scale and dimension measurement system that make it possible to maintain accurate measurement even if the reference scale is not disposed or projected on a measurement surface.

Abstract: An information processing device according to the present invention, includes: an information accumulation unit which receives and accumulates control-target information that includes information related to a control target and an environment including the control target; a prediction-equation-set learning and generation unit which learns and generates a prediction-equation set to be used for determination of an operation quantity of the control target based on the control-target information accumulated in the information accumulation unit; and an operation-quantity determination unit which receives input information needed for determination of an operation quantity of the control target, constructs a predictive-control model of the control target based on the prediction-equation set, the control-target information accumulated in the information accumulation unit, the control-target information received, and the input information, and determines an operation quantity used for control of the control target.

Abstract: An image generation apparatus is provided with: a resolution sensitivity conversion unit which generates different weight-averaged images by performing convolution operations on the infrared image with plural different weighted-filter images, and generates a resolution-sensitivity-converted image by adding luminance differences between the weight-averaged images to luminance values of the infrared image; a luminance shift calculating unit which sets the most frequently appearing luminance value of the resolution-sensitivity-converted image to an intermediate value in an enlarged range and as an intermediate luminance value, and generates a luminance-shifted image obtained by linearly shifting luminance values of the resolution-sensitivity-converted image in such a manner that the shifting corresponds to the intermediate luminance value and the enlarged range; and a luminance arithmetic operation unit which generates an arithmetically processed image by performing an arithmetic operation based on luminance dif

Abstract: A device is provided with a luminance histogram calculation unit which generates a luminance histogram showing appearance frequency of luminance values contained within the infrared image and determines a luminance value corresponding to a peak in the luminance histogram as a background luminance level of the background; a luminance shift calculation unit which sets the background luminance value as an intermediate value in luminance range width of the infrared image and generates a luminance shift image by linearly shifting other luminance values in the infrared image based on the intermediate value; a reversed image processing unit which generates a reversed shift image wherein the luminance level of the luminance shift image is reversed; and a luminance calculation processing unit which generates a calculation-processed image by performing calculation processing based on the difference in the luminance values at corresponding positions in the luminance shift image and the reversed shift image.

Abstract: An image generation apparatus is provided with: a resolution sensitivity conversion unit which generates different weight-averaged images by performing convolution operations on the infrared image with plural different weighted-filter images, and generates a resolution-sensitivity-converted image by adding luminance differences between the weight-averaged images to luminance values of the infrared image; a luminance shift calculating unit which sets the most frequently appearing luminance value of the resolution-sensitivity-converted image to an intermediate value in an enlarged range and as an intermediate luminance value, and generates a luminance-shifted image obtained by linearly shifting luminance values of the resolution-sensitivity-converted image in such a manner that the shifting corresponds to the intermediate luminance value and the enlarged range; and a luminance arithmetic operation unit which generates an arithmetically processed image by performing an arithmetic operation based on luminance dif

Abstract: A device is provided with a luminance histogram calculation unit which generates a luminance histogram showing appearance frequency of luminance values contained within the infrared image and determines a luminance value corresponding to a peak in the luminance histogram as a background luminance level of the background; a luminance shift calculation unit which sets the background luminance value as an intermediate value in luminance range width of the infrared image and generates a luminance shift image by linearly shifting other luminance values in the infrared image based on the intermediate value; a reversed image processing unit which generates a reversed shift image wherein the luminance level of the luminance shift image is reversed; and a luminance calculation processing unit which generates a calculation-processed image by performing calculation processing based on the difference in the luminance values at corresponding positions in the luminance shift image and the reversed shift image.

Abstract: In this pattern inspection device, the optical scanning section scans the inspected pattern using a laser beam. A photoelectric image processing section generates an image of the inspected pattern. A reference image generation section calculates the gray level of each pixel according to the number of sub-pixels belonging to the pattern developed in each pixel and calculates the pattern width for the inspected pattern and the reference data with treating the count obtained by dividing the gray level by the gray level step count as the width of the pattern developed in that pixel.

Abstract: A method and an apparatus are presented for correcting corner images of an integrated circuit pattern, for example, in an real image produced by optical scanning and deleting defects from the corner sections. Design data describing rectangular or trapezoidal patterns are expanded in a design data expansion section in multi-level gradations to produce a reference data for each pixel having resolution capability less than the inspection resolution capability. In a reference image forming section, based on the edge position of the real image, the reference data are processed to produce a reference image by rounding off the corner section and the line width while maintaining multi-level gradations. The boundary regions are blended using optical point spread functions obtained from the real image.

Abstract: In this pattern inspection device, the optical scanning section scans the inspected pattern using the laser beam, the photoelectric image processing section generates the image of the inspected pattern, and the reference image generation section determines the edge boundary condition by convolution operation of the optical point spread function corresponding to the laser beam strength and the inspected pattern image and detects the edge position. The reference image generation section further calculates the gray level of each pixel according to the number of sub-pixels belonging to the pattern developed in each pixel and calculates the pattern width for the inspected pattern and the reference data with treating the count obtained by dividing the gray level by the gray level step count as the width of the pattern developed in that pixel.

Abstract: A reference image forming method is used in a pattern inspection apparatus for scanning a pattern formed on an object to be inspected on the basis of design data with a laser beam having a predetermined wavelength, focusing transmitted light passing through the object on a light-receiving element by using an objective lens, forming a real image from pattern information obtained from the light-receiving element, and comparing the real image with a reference image obtained by imaging the design data, thereby detecting a defect in the object. In this method, reference data is formed by developing the design data as a pattern made of multilevel gradation values on pixels having a resolution higher than an inspection resolution. A reference image is formed by increasing or decreasing the width of each pattern of the reference data as a multilevel gradation pattern with a precision higher than the inspection resolution on the basis of an edge position of a corresponding pattern in the real image.