Patents by Inventor Takeshi Fukuma

Takeshi Fukuma has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11947715
    Abstract: A control device according to an embodiment includes: a winding unit (30, 3001) that unwinds a wire having one end movably held by a user in a direction of the one end and winds the wire by an elastic force in a direction away from the one end, a wire lock unit (30, 3002) that locks unwinding of the wire from the winding unit, and a control unit (100) that controls an operation by the wire lock unit of locking the unwinding according to a relationship between a position of a virtual object disposed in a virtual space and a position, in the virtual space, corresponding to a position of the one end in a real space.
    Type: Grant
    Filed: May 14, 2021
    Date of Patent: April 2, 2024
    Assignee: SONY GROUP CORPORATION
    Inventors: Tsuyoshi Ishikawa, Takeshi Ogita, Yohei Fukuma, Taha Moriyama, Ikuo Yamano
  • Patent number: 11941177
    Abstract: An information processing device is provided which includes a first acquisition unit (214) configured to acquire a control command, inputted by a first user, including positional information for designating a presentation position at which to present a tactile stimulus by a tactile presentation device and mode information for designating a mode of the tactile stimulus, a generation unit (218) configured to generate a tactile control signal for presenting the tactile stimulus to the presentation position in response to the control command, and a first distribution unit (222) configured to distribute the tactile control signal to the tactile presentation device worn on a body of a second user, in which the first distribution unit distributes, according to a predetermined rule, the tactile control signal related to the control command inputted by each of a plurality of the first users to the tactile presentation device.
    Type: Grant
    Filed: January 15, 2021
    Date of Patent: March 26, 2024
    Assignee: SONY GROUP CORPORATION
    Inventors: Ryo Yokoyama, Takeshi Ogita, Osamu Ito, Yohei Fukuma, Ayumi Nakagawa
  • Patent number: 10215686
    Abstract: The objective of the present invention is to provide a corrosion resistance evaluation method and evaluation device that make it possible to estimate crevice corrosion depth and pitting depth in a short period of time. A corrosion resistance evaluation method according to the present invention is characterized in that the surface potential of a metal under evaluation is measured in a state in which the metal is immersed in a usage-environment liquid, the surface potential distribution of the metal is determined, the surface potential differences in the microstructure of the metal are calculated on the basis of the surface potential distribution, and the corrosion rate of crevice corrosion and corrosion rate of pitting are predicted using the maximum surface potential difference from among the calculated surface potential differences as an evaluation index for corrosion evaluation.
    Type: Grant
    Filed: July 22, 2013
    Date of Patent: February 26, 2019
    Assignee: Hitachi, Ltd.
    Inventors: Kyoko Hombo, Kenya Ohashi, Masahiro Itoh, Mitsuharu Ikeda, Takeshi Fukuma, Naritaka Kobayashi, Shoichiro Ogata
  • Patent number: 9535088
    Abstract: A signal detection circuit includes: a VCO that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit that multiplies the input signal by the reference signal; and an HPF that removes a DC component from a signal output from the multiplication circuit.
    Type: Grant
    Filed: March 4, 2014
    Date of Patent: January 3, 2017
    Assignee: NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
    Inventors: Takeshi Fukuma, Kazuki Miyata
  • Publication number: 20160146719
    Abstract: The objective of the present invention is to provide a corrosion resistance evaluation method and evaluation device that make it possible to estimate crevice corrosion depth and pitting depth in a short period of time. A corrosion resistance evaluation method according to the present invention is characterized in that the surface potential of a metal under evaluation is measured in a state in which the metal is immersed in a usage-environment liquid, the surface potential distribution of the metal is determined, the surface potential differences in the microstructure of the metal are calculated on the basis of the surface potential distribution, and the corrosion rate of crevice corrosion and corrosion rate of pitting are predicted using the maximum surface potential difference from among the calculated surface potential differences as an evaluation index for corrosion evaluation.
    Type: Application
    Filed: July 22, 2013
    Publication date: May 26, 2016
    Inventors: Kyoko HOMBO, Kenya OHASHI, Masahiro ITOH, Mitsuharu IKEDA, Takeshi FUKUMA, Naritaka KOBAYASHI, Shoichiro OGATA
  • Publication number: 20160047841
    Abstract: A signal detection circuit includes: a VCO that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit that multiplies the input signal by the reference signal; and an HPF that removes a DC component from a signal output from the multiplication circuit.
    Type: Application
    Filed: March 4, 2014
    Publication date: February 18, 2016
    Inventors: Takeshi FUKUMA, Kazuki MIYATA
  • Patent number: 9110093
    Abstract: Provided is a sealed AFM cell in which measurement accuracy does not decrease and the types of observation liquids are not limited. A sealed AFM cell according to the present invention includes: a cantilever including a probe; a sample holder for fixing the sample; a scanner for moving the sample holder; a lid part which holds the cantilever so as to position the probe near a measurement surface of the sample; and a main body part which is a component for holding the scanner and positioned opposite the lid part with the sample in between, in which the lid part and the main body part are joined via a sealing liquid to seal the observation liquid inside a space formed by the lid part, the main body part, and the sealing liquid, the sealing liquid being different from the observation liquid and not in contact with the observation liquid.
    Type: Grant
    Filed: November 15, 2012
    Date of Patent: August 18, 2015
    Assignee: NATIONAL UNIVERSITY CORPORATION KANAZAWA UNIVERSITY
    Inventors: Takeshi Fukuma, Hitoshi Asakawa, Yukitoshi Katagiri
  • Publication number: 20140289910
    Abstract: Provided is a sealed AFM cell in which measurement accuracy does not decrease and the types of observation liquids are not limited. A sealed AFM cell according to the present invention includes: a cantilever including a probe; a sample holder for fixing the sample; a scanner for moving the sample holder; a lid part which holds the cantilever so as to position the probe near a measurement surface of the sample; and a main body part which is a component for holding the scanner and positioned opposite the lid part with the sample in between, in which the lid part and the main body part are joined via a sealing liquid to seal the observation liquid inside a space formed by the lid part, the main body part, and the sealing liquid, the sealing liquid being different from the observation liquid and not in contact with the observation liquid.
    Type: Application
    Filed: November 15, 2012
    Publication date: September 25, 2014
    Inventors: Takeshi Fukuma, Hitoshi Asakawa, Yukitoshi Katagiri
  • Patent number: 8839461
    Abstract: A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential.
    Type: Grant
    Filed: September 12, 2012
    Date of Patent: September 16, 2014
    Assignee: National University Corporation Kanazawa University
    Inventors: Takeshi Fukuma, Naritaka Kobayashi
  • Publication number: 20140223614
    Abstract: A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential.
    Type: Application
    Filed: September 12, 2012
    Publication date: August 7, 2014
    Inventors: Takeshi Fukuma, Naritaka Kobayashi
  • Publication number: 20130232648
    Abstract: To measure surface potentials in a liquid, the in-liquid potential measurement device according to the present invention includes: a cantilever having a probe at its free end; a displacement measurement unit that measures a voltage corresponding to a displacement of a tip of the cantilever; an AC source that applies an AC voltage between the probe and the sample; and a signal detection unit. A frequency of the AC voltage is 10 kHz or higher. The signal detection unit detects, from the voltage measured by the displacement measurement unit, an amplitude of a frequency component having the same frequency as that of the AC voltage, an amplitude of a frequency component having double frequency of that of the AC voltage, and a frequency component having the same phase as that of the frequency of the AC voltage.
    Type: Application
    Filed: July 29, 2011
    Publication date: September 5, 2013
    Inventors: Takeshi Fukuma, Naritaka Kobayashi, Hitoshi Asakawa
  • Patent number: 8505111
    Abstract: Provided is a cantilever excitation device capable of preventing complication of resonance characteristics by a simple configuration. A cantilever excitation device (1) is provided with a cantilever (7), a cantilever holder (3) for holding the cantilever (7), and a piezoelectric vibrator (5) attached to the cantilever holder (3). The cantilever holder (3) includes a holder main part (11) (first part) having an acoustic impedance different from that of the piezoelectric vibrator (5) for transmitting vibration of the piezoelectric vibrator by elastic deformation and an attachment piece (13) (second part) having the acoustic impedance different from that of the first part for forming a material boundary to block propagation of an acoustic wave between the same and the first part. The first and second parts are interposed between the piezoelectric vibrator (5) and the cantilever (7).
    Type: Grant
    Filed: August 6, 2010
    Date of Patent: August 6, 2013
    Assignee: National University Corporation Kanazawa University
    Inventors: Hitoshi Asakawa, Takeshi Fukuma
  • Patent number: 8387159
    Abstract: The present invention provides a fast-operating and stable scanning probe microscope configured to detect the interaction between a probe and a sample to avoid generation of a harmonic component. An oscillation circuit (31) generates an excitation phase signal indicative of the phase of an excitation signal. An excitation signal generation circuit (33) generates an excitation signal from the excitation phase signal. A complex signal generation circuit (35) generates a complex signal from a displacement signal. A vector calculation circuit (37) calculates the argument of the complex signal. A subtracting phase comparator (39) compares the argument with the phase of the excitation phase signal by subtraction. The amount of the interaction between a probe device and a sample is obtained using the subtracting phase comparator (39). The result of the comparison carried out by the subtracting phase comparator (39) may be output as a difference in phase between the displacement signal and the excitation signal.
    Type: Grant
    Filed: July 16, 2009
    Date of Patent: February 26, 2013
    Assignees: National University Corporation
    Inventors: Takeshi Fukuma, Yuji Mitani
  • Patent number: 8341760
    Abstract: An atomic force microscope (AFM) (1) is one type of SPM, and detects a resonance frequency shift as an amount of interaction between a probe and a sample. The AFM (1) performs distance modulation control while performing feedback control of a probe-sample distance so as to keep the amount of interaction constant. The distance modulation control varies the probe-sample distance at a distance modulation frequency higher than a response speed of the feedback control. The AFM (1) further acquires the interaction amounts detected during the variation of the probe-sample distance by the distance modulation control while performing relative scanning between the probe and the sample, and detects a distribution of the interaction amounts in a three-dimensional space having a dimension within a scanning range and a thickness within a variation range of the probe-sample distance.
    Type: Grant
    Filed: January 14, 2010
    Date of Patent: December 25, 2012
    Assignees: National University Corporation
    Inventors: Takeshi Fukuma, Yasumasa Ueda
  • Patent number: 8323139
    Abstract: A vehicle drive device includes a case with a case main body portion accommodating the speed change mechanism, and a connection case portion connecting the engine and the case main body portion and having a diameter increased toward the engine; a hydraulic pressure control device that is provided under the speed change mechanism, and controls a hydraulic pressure to be supplied to the speed change mechanism; and an electric pump that generates the hydraulic pressure to be supplied to the speed change mechanism through the hydraulic pressure control device.
    Type: Grant
    Filed: October 16, 2009
    Date of Patent: December 4, 2012
    Assignee: Aisin AW Co., Ltd.
    Inventors: Nobukazu Ike, Yasunari Muranaka, Takeshi Fukuma, Shinichiro Iga, Shingo Uozumi
  • Publication number: 20120192320
    Abstract: Provided is a cantilever excitation device capable of preventing complication of resonance characteristics by a simple configuration. A cantilever excitation device (1) is provided with a cantilever (7), a cantilever holder (3) for holding the cantilever (7), and a piezoelectric vibrator (5) attached to the cantilever holder (3). The cantilever holder (3) includes a holder main part (11) (first part) having an acoustic impedance different from that of the piezoelectric vibrator (5) for transmitting vibration of the piezoelectric vibrator by elastic deformation and an attachment piece (13) (second part) having the acoustic impedance different from that of the first part for forming a material boundary to block propagation of an acoustic wave between the same and the first part. The first and second parts are interposed between the piezoelectric vibrator (5) and the cantilever (7).
    Type: Application
    Filed: August 6, 2010
    Publication date: July 26, 2012
    Inventors: Hitoshi Asakawa, Takeshi Fukuma
  • Patent number: 8217367
    Abstract: A scanner device is provided which enables high-frequency scanning and can increase the speed of a scanning probe microscope. A scanner device (1) used for a scanning probe microscope includes a Z actuator (7) which scans an object to be scanned in a scanning direction, and a Z actuator holder (11) which holds the Z actuator (7). The Z actuator holder (11) holds the Z actuator (7) at a plurality of holding line parts which extend in the scanning direction and are separated from each other. For example, the Z actuator (7) has a rectangular cross-section, and the four edges of the Z actuator (7) are held by the Z actuator holder (11). The Z actuator (7) is pressed into a holding hole (29) of the Z actuator holder (11).
    Type: Grant
    Filed: May 29, 2009
    Date of Patent: July 10, 2012
    Assignee: National University Corporation Kanazawa University
    Inventors: Takeshi Fukuma, Toshio Ando, Yasutaka Okazaki
  • Publication number: 20120151637
    Abstract: The present invention provides a fast-operating and stable scanning probe microscope configured to detect the interaction between a probe and a sample to avoid generation of a harmonic component. An oscillation circuit (31) generates an excitation phase signal indicative of the phase of an excitation signal. An excitation signal generation circuit (33) generates an excitation signal from the excitation phase signal. A complex signal generation circuit (35) generates a complex signal from a displacement signal. A vector calculation circuit (37) calculates the argument of the complex signal. A subtracting phase comparator (39) compares the argument with the phase of the excitation phase signal by subtraction. The amount of the interaction between a probe device and a sample is obtained using the subtracting phase comparator (39). The result of the comparison carried out by the subtracting phase comparator (39) may be output as a difference in phase between the displacement signal and the excitation signal.
    Type: Application
    Filed: July 16, 2009
    Publication date: June 14, 2012
    Applicant: NATIONAL UNIVERSITY CORP. KANAZAWA UNIVERSITY
    Inventors: Takeshi Fukuma, Yuji Mitani
  • Patent number: 8166848
    Abstract: A transmission case includes a housing that accommodates a starting device, the housing having rib portions on an inner surface; and a speed change mechanism case connected to the housing, the speed change mechanism case accommodating a speed change mechanism, wherein a thin wall portion is provided in the housing by a groove formed in the housing, and the transmission case is structured such that stress is concentrated on the thin wall portion by at least one of the rib portions when an impact load is applied to the transmission case.
    Type: Grant
    Filed: March 6, 2009
    Date of Patent: May 1, 2012
    Assignee: Aisin AW Co., Ltd.
    Inventors: Shingo Uozumi, Nobukazu Ike, Takeshi Fukuma, Masataka Kameyama, Ryota Sato
  • Publication number: 20120030845
    Abstract: An atomic force microscope (AFM) (1) is one type of SPM, and detects a resonance frequency shift as an amount of interaction between a probe and a sample. The AFM (1) performs distance modulation control while performing feedback control of a probe-sample distance so as to keep the amount of interaction constant. The distance modulation control varies the probe-sample distance at a distance modulation frequency higher than a response speed of the feedback control. The AFM (1) further acquires the interaction amounts detected during the variation of the probe-sample distance by the distance modulation control while performing relative scanning between the probe and the sample, and detects a distribution of the interaction amounts in a three-dimensional space having a dimension within a scanning range and a thickness within a variation range of the probe-sample distance.
    Type: Application
    Filed: January 14, 2010
    Publication date: February 2, 2012
    Inventors: Takeshi Fukuma, Yasumasa Ueda