Abstract: Even when a large current is intentionally flowed during a high-temperature conduction of a semiconductor element, there is a problem in that an overcurrent state is detected to stop current. In the present invention, an overcurrent detector 4 detects overcurrent when an input voltage Vin reaches a threshold voltage Vth, and outputs an overcurrent detection signal c to a gate driving unit 3. On the other hand, when a temperature detection signal a and a current control signal b are input, a transistor 52 is conducted, and the input voltage Vin of the overcurrent detector 4 becomes zero. In this case, the input voltage Vin of the overcurrent detector 4 does not reach the threshold voltage Vth. Therefore, the output of the drive signal output from the gate driving unit 3 is not stopped. For this reason, a large current can flow in a drain current Ids.

Abstract: Even when a large current is intentionally flowed during a high-temperature conduction of a semiconductor element, there is a problem in that an overcurrent state is detected to stop current. In the present invention, an overcurrent detector 4 detects overcurrent when an input voltage Vin reaches a threshold voltage Vth, and outputs an overcurrent detection signal c to a gate driving unit 3. On the other hand, when a temperature detection signal a and a current control signal b are input, a transistor 52 is conducted, and the input voltage Vin of the overcurrent detector 4 becomes zero. In this case, the input voltage Vin of the overcurrent detector 4 does not reach the threshold voltage Vth. Therefore, the output of the drive signal output from the gate driving unit 3 is not stopped. For this reason, a large current can flow in a drain current Ids.