Patents by Inventor Takeshi Ishigaki

Takeshi Ishigaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20050007143
    Abstract: A semiconductor system includes a plurality of semiconductor chips, a first group of wirings, a second group of wirings and a connection rearrange wiring section. The first group of wirings interconnect the plurality of semiconductor chips. The second group of wirings are used for redundancy and interconnect the plurality of semiconductor chips. The connection rearrange wiring section includes a connection test circuit and connection rearrange circuit. The connection test circuit makes a test for connection between the plurality of semiconductor chips by means of the first group of wirings. The connection rearrange circuit makes unusable a wiring of the first group in which poor connection occurs and rearranges the connection between the semiconductor chips by use of the wiring of the second group when the poor connection is detected in the wiring of the first group by the connection test circuit.
    Type: Application
    Filed: July 29, 2004
    Publication date: January 13, 2005
    Inventor: Takeshi Ishigaki
  • Patent number: 6788070
    Abstract: A semiconductor system includes a plurality of semiconductor chips, a first group of wirings, a second group of wirings and a connection rearrange wiring section. The first group of wirings interconnect the plurality of semiconductor chips. The second group of wirings are used for redundancy and interconnect the plurality of semiconductor chips. The connection rearrange wiring section includes a connection test circuit and connection rearrange circuit. The connection test circuit makes a test for connection between the plurality of semiconductor chips by means of the first group of wirings. The connection rearrange circuit makes unusable a wiring of the first group in which poor connection occurs and rearranges the connection between the semiconductor chips by use of the wiring of the second group when the poor connection is detected in the wiring of the first group by the connection test circuit.
    Type: Grant
    Filed: June 6, 2002
    Date of Patent: September 7, 2004
    Assignee: Kabushiki Kaisha Toshiba
    Inventor: Takeshi Ishigaki
  • Publication number: 20040087574
    Abstract: Disclosed are novel spiro derivatives and their medical uses, especially as adhesion molecule inhibitors useful for therapies of inflammatory diseases.
    Type: Application
    Filed: March 25, 2003
    Publication date: May 6, 2004
    Inventors: Toshiya Takahashi, Takeshi Ishigaki, Miyuki Funahashi, Koji Taniguchi, Masayuki Kaneko, Mie Kainoh, Hiroyuki Meguro
  • Publication number: 20040039040
    Abstract: Disclosed are novel urea derivatives and their medical uses, especially as adhesion molecule inhibitors useful for therapies of inflammatory diseases.
    Type: Application
    Filed: March 14, 2003
    Publication date: February 26, 2004
    Inventors: Toshiya Takahashi, Takeshi Ishigaki, Miyuki Funahashi, Koji Taniguchi, Masayuki Kaneko, Mie Kainoh, Hiroyuki Meguro
  • Publication number: 20030197515
    Abstract: A semiconductor system includes a plurality of semiconductor chips, a first group of wirings, a second group of wirings and a connection rearrange wiring section. The first group of wirings interconnect the plurality of semiconductor chips. The second group of wirings are used for redundancy and interconnect the plurality of semiconductor chips. The connection rearrange wiring section includes a connection test circuit and connection rearrange circuit. The connection test circuit makes a test for connection between the plurality of semiconductor chips by means of the first group of wirings. The connection rearrange circuit makes unusable a wiring of the first group in which poor connection occurs and rearranges the connection between the semiconductor chips by use of the wiring of the second group when the poor connection is detected in the wiring of the first group by the connection test circuit.
    Type: Application
    Filed: June 6, 2002
    Publication date: October 23, 2003
    Inventor: Takeshi Ishigaki
  • Patent number: 6555559
    Abstract: The present invention provides novel PGI2 derivatives and an anti Helicobacter agent, a platelet function potentiating agent or a cervical ripening agent containing any of the derivatives.
    Type: Grant
    Filed: August 1, 2000
    Date of Patent: April 29, 2003
    Assignee: Toray Industries, Inc.
    Inventors: Hisanori Wakita, Naohiro Yamada, Hitoshi Hatakeyama, Takeshi Ishigaki, Noriyuki Hirano, Takeshi Mori