Patents by Inventor Takeshi Iwasawa

Takeshi Iwasawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Photometric apparatus
    Patent number: 6509963
    Abstract: It is possible to enhance accuracy in photometry measurements without an increase in unnecessary actual measurement data and design value data in the case where on a low ambient luminance side, an output of a first light sensor, which receives light collected from a large area, is linear and an output of a second light sensor, which receives light collected from a small area, is non-linear. The number of luminance measurement points used for performing measurement with the second light sensor is set at low ambient luminance values to be larger than the number of luminance measurement points used for performing measurements with the first light sensor.
    Type: Grant
    Filed: December 19, 2000
    Date of Patent: January 21, 2003
    Assignee: Seiko Instruments Inc.
    Inventors: Hajime Oda, Takeshi Iwasawa
  • Photometric apparatus
    Publication number: 20010012105
    Abstract: It is possible to enhance accuracy in photometry measurements without an increase in unnecessary actual measurement data and design value data in the case where on a low ambient luminance side, an output of a first light sensor, which receives light collected from a large area, is linear and an output of a second light sensor, which receives light collected from a small area, is non-linear. The number of luminance measurement points used for performing measurement with the second light sensor is set at low ambient luminance values to be larger than the number of luminance measurement points used for performing measurements with the first light sensor.
    Type: Application
    Filed: December 18, 2000
    Publication date: August 9, 2001
    Inventors: Hajime Oda, Takeshi Iwasawa