Abstract: The invention relates to an optical connector module that can accommodate well to a wide wavelength-band range and provide a high-precision connection by adjustment of only one lens. Operating to enter optical signals emerging from a plurality of input optical waveguides 10 and having a wavelength in the range of 1.2 &mgr;m to 1.7 &mgr;m in a plurality of output optical waveguides 20, the optical connector module uses one bilateral telecentric optical system 1 to provide optical connections of at least two light beams from the input optical waveguides 10 to the output optical waveguides 20.

Abstract: A near-field scanning microscope is constructed so that a probe is brought close to a specimen and is relatively moved with respect to the surface of said specimen to scan a region proximate to the surface of the specimen and light derived through the probe is detected by a photodetector to thereby measure the optical property of the specimen. This optical microscope is provided with a plurality of probes and a switching mechanism for selecting one of the plurality of probes to place a selected probe close to the specimen. In this way, measurements can be made under different conditions in regard to a particular specimen.

Abstract: A near-field scanning optical microscope is constructed so that a probe is placed close to a surface of a specimen and while the surface of the specimen is scanned with the probe, a region proximate to the surface of the specimen is measured with light. The microscope includes a mechanism for vibrating the probe in a direction nearly perpendicular to the surface of the specimen on scanning; a mechanism for detecting a distance between the surface of the specimen and the probe; and a mechanism for storing signals detected by scanning operation in the direction nearly perpendicular to the surface of the specimen as at least two measured data strings formed in accordance with a sampling table. In this way, the three-dimensional data on the surface of the specimen are acquired.

Abstract: A slide glass with a sample rested thereon is placed on an interior total reflection prism with a matching oil between them. A laser beam is applied through a prism to the sample, and evanescent light is generated on the sample surface. Above the sample, a probe supported at a free end of a cantilever is located, and an objective is provided above the probe. The objective has an angular aperture exceeding a vertical angle of the probe, where the angular aperture indicates an angle from a focal point of the objective to a diameter of entrance pupil. A scattering light detection lens barrel is provided above the objective, and cooperates with the objective to constitute a scattering light detection optical system. The optical system detects scattering light generated when the probe is introduced to the evanescent light.

Abstract: A scanning probe microscope includes a probe having a minute aperture formed in a distal end thereof. The probe allows light to propagate therethrough and is located close to a sample. A moving device is provided for relatively moving the probe across a surface of the sample, and an observation optical system is provided for optically observing the sample. A light source emits a light beam for generating evanescent waves, and a beam irradiation device is provided for irradiating the light beam on the sample so that the light beam is totally reflected by an optical interface of the sample. The beam irradiation means and the observation optical system share an objective located on a side of the sample opposite to the probe. A light detecting device is provided for detecting an intensity of the light introduced into the probe through the aperture formed in the distal end of the probe.