Patents by Inventor Takeshi Kondoh

Takeshi Kondoh has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20230281293
    Abstract: An authentication system using an information encoding article that includes an information code, the authentication system includes a detection unit capable of reading the information code, an information acquisition unit configured to acquire first information regarding a concentration distribution in an encoding region before and after the application of an external stimulus, and an authentication unit configured to execute authentication by using at least both second information acquired prior to the first information and regarding the concentration distribution in the encoding region and the first information, wherein the information encoding article having the encoding region where the information code is formed, the concentration distribution in the encoding region, to be read by the detection unit, changing upon application of the external stimulus to the encoding region.
    Type: Application
    Filed: March 1, 2023
    Publication date: September 7, 2023
    Inventors: HIROSHI SAITO, YUICHIRO MIYAUCHI, TAKAHISA ONO, TAKESHI KONDOH, MASARU SUGITA, MASANORI SEKI, RYUICHI OTSU
  • Publication number: 20230277708
    Abstract: An information acquisition system of acquiring information regarding disinfection includes a detection unit configured to detect a variable information code in which a pattern before application of a disinfectant represents a first information code and a pattern after the application of the disinfectant represents a second information code different from the first information code, one or more memories, and one or more processors in communication with the detection unit and with the one or more memories, wherein the one or more processors and the one or more memories are configured to acquire information regarding the disinfection in response to detection of at least the second information code by the detection unit.
    Type: Application
    Filed: March 1, 2023
    Publication date: September 7, 2023
    Inventors: HIROSHI SAITO, TAKAHISA ONO, YUICHIRO MIYAUCHI, TAKESHI KONDOH, MASARU SUGITA, MASANORI SEKI, RYUICHI OTSU
  • Publication number: 20150323303
    Abstract: A calculation apparatus that integrates a differential phase image and obtains a phase image includes a weighting unit and an integration unit. The weighting unit performs weighting of a differential phase image that has a plurality of differential phase values, each of the differential phase values being obtained by using intensity information of a plurality of pixels included in one intensity distribution formed by a differential interferometer, and obtains a weighted differential phase image. The integration unit integrates the weighted differential phase image and obtains a phase image. The weighting unit performs weighting of the differential phase values in accordance with a position in the differential phase image, such that at least a part of differential phase values in end parts of the differential phase image is weighted more lightly than a differential phase value in a central part of the differential phase image.
    Type: Application
    Filed: May 5, 2015
    Publication date: November 12, 2015
    Inventor: Takeshi Kondoh
  • Patent number: 9080858
    Abstract: A wavefront measuring apparatus includes an optical element forming a periodic pattern by light, a detector having pixels to detect the light, and a computer computing, based on detection results of the detector, wavefront information at positions in a wavefront of the light transmitted through or reflected by a specimen. The detector detects a first periodic pattern formed by the light, and a second periodic pattern formed by the light and shifted in phase from the first periodic pattern. The computer computes the wavefront information at one of the positions by using a result detected in a first pixel of the pixels when detecting the first periodic pattern, a result detected in a second pixel of the pixels when detecting the first periodic pattern, the second pixel being positioned within three pixels from the first pixel, and a result detected in the first pixel when detecting the second periodic pattern.
    Type: Grant
    Filed: September 9, 2014
    Date of Patent: July 14, 2015
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takeshi Kondoh
  • Publication number: 20150178960
    Abstract: In an X-ray tomography apparatus, a tomographic image of a subject is acquired using a subject projection image detected by a detector in a state in which the subject is in a field of view of the detector and a plurality of reference projection images detected by the detector in a state in which the subject is not in the field of view of the detector. The detector detects the subject projection image and the reference projection image at a plurality of projection angles, and the operation unit is configured to acquire a background image using a plurality of reference projection images, acquire a projection image of subject information using the subject projection image and the background image for each of the projection angles, and acquire tomographic image of the subject information from the projection image of the subject information for each of the projection angles.
    Type: Application
    Filed: December 16, 2014
    Publication date: June 25, 2015
    Inventor: Takeshi Kondoh
  • Publication number: 20140376004
    Abstract: A wavefront measuring apparatus includes an optical element forming a periodic pattern by light, a detector having pixels to detect the light, and a computer computing, based on detection results of the detector, wavefront information at positions in a wavefront of the light transmitted through or reflected by a specimen. The detector detects a first periodic pattern formed by the light, and a second periodic pattern formed by the light and shifted in phase from the first periodic pattern. The computer computes the wavefront information at one of the positions by using a result detected in a first pixel of the pixels when detecting the first periodic pattern, a result detected in a second pixel of the pixels when detecting the first periodic pattern, the second pixel being positioned within three pixels from the first pixel, and a result detected in the first pixel when detecting the second periodic pattern.
    Type: Application
    Filed: September 9, 2014
    Publication date: December 25, 2014
    Inventor: Takeshi Kondoh
  • Patent number: 8908824
    Abstract: An imaging apparatus includes, a diffraction grating that diffracts an electromagnetic wave emitted from an electromagnetic wave source, a shield grating including a shield portion that prevents transmission of the electromagnetic wave and a plurality of transmission portions that allows the electromagnetic wave to transmit therethrough, and a detector that detects the electromagnetic wave transmitted through the transmission portions of the shield grating. The diffraction grating forms an interference pattern in a grid pattern by diffracting the electromagnetic wave; the shield grating has the plurality of transmission portions arranged two-dimensionally; and a ratio of an area of the transmission portion to the area of a unit pattern composed of a portion of the shield portion and one transmission portion of the plurality of transmission portions is larger than 0.25.
    Type: Grant
    Filed: October 12, 2011
    Date of Patent: December 9, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takeshi Kondoh
  • Patent number: 8859977
    Abstract: A wavefront measuring apparatus includes an optical element forming a periodic pattern by light, a detector having pixels to detect the light, and a computer computing, based on detection results of the detector, wavefront information at positions in a wavefront of the light transmitted through or reflected by a specimen. The detector detects a first periodic pattern formed by the light, and a second periodic pattern formed by the light and shifted in phase from the first periodic pattern. The computer computes the wavefront information at one of the positions by using a result detected in a first pixel of the pixels when detecting the first periodic pattern, a result detected in a second pixel of the pixels when detecting the first periodic pattern, the second pixel being positioned within three pixels from the first pixel, and a result detected in the first pixel when detecting the second periodic pattern.
    Type: Grant
    Filed: July 30, 2012
    Date of Patent: October 14, 2014
    Assignee: Canon Kabushiki Kaisha
    Inventor: Takeshi Kondoh
  • Publication number: 20140286475
    Abstract: An interferometer includes a diffraction grating that forms a first pattern by diffracting X-rays; a shield grating that forms a second pattern by blocking one or more of the X-rays forming the first pattern; a detector that detects information on the second pattern by detecting X-rays from the shield grating; and a scanning unit that shifts relative positions of an object and a measurable range. In the interferometer, the detector acquires a first detection result by performing a detection while the measurable range and the object take first relative positions and acquires a second detection result by performing a detection while the measurable range and the object take second relative positions. In the interferometer, the scanning unit shifts the relative positions of the measurable range and the object so that a pattern of the first detection result and a pattern of the second detection result pattern have continuity.
    Type: Application
    Filed: June 5, 2014
    Publication date: September 25, 2014
    Inventors: Takashi Nakamura, Takeshi Kondoh
  • Publication number: 20130032727
    Abstract: A wavefront measuring apparatus includes an optical element forming a periodic pattern by light, a detector having pixels to detect the light, and a computer computing, based on detection results of the detector, wavefront information at positions in a wavefront of the light transmitted through or reflected by a specimen. The detector detects a first periodic pattern formed by the light, and a second periodic pattern formed by the light and shifted in phase from the first periodic pattern. The computer computes the wavefront information at one of the positions by using a result detected in a first pixel of the pixels when detecting the first periodic pattern, a result detected in a second pixel of the pixels when detecting the first periodic pattern, the second pixel being positioned within three pixels from the first pixel, and a result detected in the first pixel when detecting the second periodic pattern.
    Type: Application
    Filed: July 30, 2012
    Publication date: February 7, 2013
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Takeshi Kondoh
  • Publication number: 20120093297
    Abstract: An imaging apparatus includes, a diffraction grating that diffracts an electromagnetic wave emitted from an electromagnetic wave source, a shield grating including a shield portion that prevents transmission of the electromagnetic wave and a plurality of transmission portions that allows the electromagnetic wave to transmit therethrough, and a detector that detects the electromagnetic wave transmitted through the transmission portions of the shield grating. The diffraction grating forms an interference pattern in a grid pattern by diffracting the electromagnetic wave; the shield grating has the plurality of transmission portions arranged two-dimensionally; and a ratio of an area of the transmission portion to the area of a unit pattern composed of a portion of the shield portion and one transmission portion of the plurality of transmission portions is larger than 0.25.
    Type: Application
    Filed: October 12, 2011
    Publication date: April 19, 2012
    Applicant: CANON KABUSHIKI KAISHA
    Inventor: Takeshi Kondoh
  • Patent number: 6255423
    Abstract: A pressure sensitive adhesive composition comprising: (A) a carboxyl group containing copolymer obtained by solution polymerization of (a) a carboxyl group containing polymerizable monomer and (b) another monomer copolymerizable with the monomer (a); (B) a neutralizer; and (C) a crosslinking agent. This pressure sensitive adhesive composition is suitable for use in a wafer surface protective sheet employed for protecting a circuit pattern formed on a wafer surface from cutting debris, etc. at the time of polishing the back of the wafer. When this pressure sensitive adhesive composition is used, not only is the voltage of peel electrification extremely low at the time of stripping of the pressure sensitive adhesive sheet but also, even if the pressure sensitive adhesive remains on the wafer surface, the residual pressure sensitive adhesive can easily be removed by washing with water.
    Type: Grant
    Filed: September 26, 2000
    Date of Patent: July 3, 2001
    Assignee: Lintec Corporation
    Inventors: Kiichiro Kato, Takeshi Kondoh, Kazuhiro Takahashi
  • Patent number: 6180742
    Abstract: A pressure sensitive adhesive composition comprising: (A) a carboxyl group containing copolymer obtained by solution polymerization of (a) a carboxyl group containing polymerizable monomer and (b) another monomer copolymerizable with the monomer (a); (B) a neutralizer; and (C) a crosslinking agent. This pressure sensitive adhesive composition is suitable for use in a wafer surface protective sheet employed for protecting a circuit pattern formed on a wafer surface from cutting debris, etc. at the time of polishing the back of the wafer. When this pressure sensitive adhesive composition is used, not only is the voltage of peel electrification extremely low at the time of stripping of the pressure sensitive adhesive sheet but also, even if the pressure sensitive adhesive remains on the wafer surface, the residual pressure sensitive adhesive can easily be removed by washing with water.
    Type: Grant
    Filed: February 12, 1998
    Date of Patent: January 30, 2001
    Assignee: Lintec Corporation
    Inventors: Kiichiro Kato, Takeshi Kondoh, Kazuhiro Takahashi
  • Patent number: 6156423
    Abstract: A layer of base material has a film layer and a barrier layer on the film layer, and also adhesive tape has the base material and an adhesive layer on the barrier layer. Thus, they do not have any fish-eye or foreign substance on their surfaces, so that accuracy in thickness are improved and contamination of a material to be adhered with the adhesive layer is also improved.
    Type: Grant
    Filed: April 10, 1998
    Date of Patent: December 5, 2000
    Assignee: Lintec Corporation
    Inventors: Kouichi Nagamoto, Takeshi Kondoh, Kazuhiro Takahashi, Katsuhisa Taguchi, Kazuyoshi Ebe
  • Patent number: 6040048
    Abstract: An energy beam curable hydrophilic pressure sensitive adhesive composition comprising a hydrophilic pressure sensitive adhesive (A) and an energy beam polymerizable compound (B), optionally together with a photopolymerization initiator (C) added according to necessity. Thus, a pressure sensitive adhesive composition suitable for use in a wafer surface protective sheet is provided, which enables easy removal of any residual pressure sensitive adhesive by washing with water, even if the pressure sensitive adhesive remains on the wafer surface after peeling of the pressure sensitive adhesive sheet.
    Type: Grant
    Filed: August 27, 1998
    Date of Patent: March 21, 2000
    Assignee: Lintec Corporation
    Inventors: Kiichiro Kato, Takeshi Kondoh, Katsuhisa Taguchi, Kazuhiro Takahashi
  • Patent number: 5942578
    Abstract: An energy beam curable pressure sensitive adhesive composition is disclosed which comprises at least two energy beam curable copolymers having energy beam polymerizable groups in side chains thereof. This energy beam curable pressure sensitive adhesive composition has satisfactory adhesive strength before the irradiation with energy beam and can be cured by the irradiation with energy beam to a degree such that the amount of adhesive residue remaining on an adherend after peeling is extremely small. Further, the above composition ensures excellent expansibility at the expanding step and excellent recognition at the time of pickup. Still further, the above composition exhibits high work efficiency because of very low pickup strength at the bonding step, irrespective of the execution of the expanding step.
    Type: Grant
    Filed: April 18, 1997
    Date of Patent: August 24, 1999
    Assignee: Lintec Corp.
    Inventors: Hayato Noguchi, Takeshi Kondoh