Abstract: A cooling device includes a surrounding member, an air inlet, an air outlet, and a flow-path-formation mechanism. The surrounding member is configured to surround an engine. The air inlet is formed in the surrounding member. The air outlet is formed in the surrounding member and is to be coupled to an intake pipe of the engine. The flow-path-formation mechanism is configured to form a flow path that allows outside air to circulate to the air outlet from the air inlet when a temperature of the engine or a temperature inside the surrounding member is greater than or equal to a predetermined temperature.

Abstract: A cooling device includes a surrounding member, an air inlet, an air outlet, and a flow-path-formation mechanism. The surrounding member is configured to surround an engine. The air inlet is formed in the surrounding member. The air outlet is formed in the surrounding member and is to be coupled to an intake pipe of the engine. The flow-path-formation mechanism is configured to form a flow path that allows outside air to circulate to the air outlet from the air inlet when a temperature of the engine or a temperature inside the surrounding member is greater than or equal to a predetermined temperature.

Abstract: An optical pickup has a laser light source, beam splitter, collimator lens, reflection mirror, objective lens and photo detector are mounted in a case. An objective lens actuator includes a magnetic member and magnet. The optical pickup may become contaminated by uncured adhesive remaining at the edges of the adhesive surfaces of the magnet and the magnetic member that is transferred to the optical pickup via finger cots or tweezers, etc. In an adhesion step between the magnet and the magnetic member, in which part of a groove near to the center of the surface has a small depth and part of the groove near to the outer circumference of the surface has a large depth, an adhesive is drawn toward the center of the surface of the magnetic member by a capillary phenomenon and is prevented from spreading along the outer edge of the surface.

Abstract: An optical pickup has a laser light source, beam splitter, collimator lens, reflection mirror, objective lens and photo detector are mounted in a case. An objective lens actuator includes a magnetic member and magnet. The optical pickup may become contaminated by uncured adhesive remaining at the edges of the adhesive surfaces of the magnet and the magnetic member that is transferred to the optical pickup via finger cots or tweezers, etc. In an adhesion step between the magnet and the magnetic member, in which part of a groove near to the center of the surface has a small depth and part of the groove near to the outer circumference of the surface has a large depth, an adhesive is drawn toward the center of the surface of the magnetic member by a capillary phenomenon and is prevented from spreading along the outer edge of the surface.

Abstract: To provide a salty taste enhancer which exerts a flavor enhancing effect comparable to sodium chloride without imparting any undesirable flavor such as harsh taste or odd smell, a method for producing the same, a kelp extract comprising the salty taste enhancer, and a food or drink having enhanced salty taste and flavor which comprises the salty taste enhancer or the kelp extract. A salty taste enhancer which comprises a volatile component with a molecular weight of less than 200 derived from a kelp.

Abstract: The present invention provides a semiconductor memory device that includes: a fuse circuit having multiple fuse elements; and a fuse selection circuit connected to an internal address signal line that receives an address signal externally inputted. The fuse circuit is connected to the fuse selection circuit to receive an output from the fuse selection circuit, is supplied with an externally inputted trigger signal that permits nonvolatile recording of the fuse elements, and, in response to the output and the trigger signal, records the fuse element corresponding to the internal address signal line among the plurality of fuse elements while recording at least one of the plurality of fuse elements other than the fuse element thus recorded.

Abstract: The present invention provides a semiconductor memory device that includes: a fuse circuit having multiple fuse elements; and a fuse selection circuit connected to an internal address signal line that receives an address signal externally inputted. The fuse circuit is connected to the fuse selection circuit to receive an output from the fuse selection circuit, is supplied with an externally inputted trigger signal that permits nonvolatile recording of the fuse elements, and, in response to the output and the trigger signal, records the fuse element corresponding to the internal address signal line among the plurality of fuse elements while recording at least one of the plurality of fuse elements other than the fuse element thus recorded.

Abstract: The present invention provides a semiconductor memory device that includes: a fuse circuit having multiple fuse elements; and a fuse selection circuit connected to an internal address signal line that receives an address signal externally inputted. The fuse circuit is connected to the fuse selection circuit to receive an output from the fuse selection circuit, is supplied with an externally inputted trigger signal that permits nonvolatile recording of the fuse elements, and, in response to the output and the trigger signal, records the fuse element corresponding to the internal address signal line among the plurality of fuse elements while recording at least one of the plurality of fuse elements other than the fuse element thus recorded.

Abstract: The present invention provides a semiconductor memory device that includes: a fuse circuit having multiple fuse elements; and a fuse selection circuit connected to an internal address signal line that receives an address signal externally inputted. The fuse circuit is connected to the fuse selection circuit to receive an output from the fuse selection circuit, is supplied with an externally inputted trigger signal that permits nonvolatile recording of the fuse elements, and, in response to the output and the trigger signal, records the fuse element corresponding to the internal address signal line among the plurality of fuse elements while recording at least one of the plurality of fuse elements other than the fuse element thus recorded.

Abstract: A semiconductor device having a fuse evaluation circuit is provided. Fuse evaluation circuit (100) can include, a reference voltage generation circuit (110), a fuse circuit (120-n), and a fuse evaluation control circuit (130). Fuse circuit (120-n) can include a fuse (Fn) and evaluation transistor (Tn) arranged in-series and providing an evaluation node (Nn) at their connection. Reference voltage generation circuit (110) can provide a reference voltage (VG1) at a control gate of evaluation transistor (Tn). Fuse evaluation control circuit (130) can vary the impedance of the evaluation transistor (Tn) by varying the potential of reference voltage (VG1). Fuse evaluation circuit (100) can evaluate the condition of fuse (Fn) accordingly.

Abstract: A semiconductor device having a fuse evaluation circuit is provided. Fuse evaluation circuit (100) can include, a reference voltage generation circuit (110), a fuse circuit (120-n), and a fuse evaluation control circuit (130). Fuse circuit (120-n) can include a fuse (Fn) and evaluation transistor (Tn) arranged in series and providing an evaluation node (Nn) at their connection. Reference voltage generation circuit (110) can provide a reference voltage (VG1) at a control gate of evaluation transistor (Tn). Fuse evaluation control circuit (130) can vary the impedance of the evaluation transistor (Tn) by varying the potential of reference voltage (VG1). Fuse evaluation circuit (100) can evaluate the condition of fuse (Fn) accordingly.

Abstract: An OS signal generation circuitry comprises a plurality of OS signal generating circuits receiving corresponding address bits of an address so as to generate individual OS signals, respectively, which are supplied to an OR circuit for generating an original OS signal. This original OS signal is supplied to a rising detection circuit, which outputs a second OS signal generated on the basis of the detected rising of the original OS signal and having a substantially constant width. Another OR circuit receives the original OS signal and the second OS signal and generates an output OS signal having the constant OS width. Accordingly, the OS signal can have the OS width which does not vary dependently upon the number of address bits actually changing their logical level.

Abstract: A probe for an in-circuit emulator comprising a flexible substrate composed of a base film, a pattern provided on a central portion of the base film, plastic parts mounted on both ends of the base film, a connecting element detachably provided at one end of the flexible substrate, and reinforcing members mounted on the plastic parts.

Abstract: A probe for an in-circuit emulator comprises flexible substrates, pins provided at one end of the substrates for connecting the flexible substrates with an LSI package, a base mounted on the flexible substrates and having a penetration hole for holding the pins, and a presser plate mounted on the flexible substrates and having a hole, characterized in that the base and presser plate sandwich the flexible substrates and pins for connecting the flexible substrates with the pins.