Abstract: A device for testing semiconductor devices includes a group of probes arranged to correspond to at least a row of electrode terminals which are formed on each of the semiconductor devices, a printed plate having an opening in which the semiconductor device is positioned and a conductive pattern, four guide members made of insulating material and having a face on which a plurality of grooves are formed to hole and arrange the probes at the same pitch as that of the electrode terminals, and a positioning member and an upper guide which position the guide members relative to the semiconductor device and the printed plate to electrically and detachably contact the probes with the electrode terminals and the conductive lines along the rim of the opening of the printed plate.

Abstract: A counterpressure liquid filling device for a container (1) comprises a gas discharge passage (9a) for discharging the pressurized gas of the container (1) into the atmosphere, the gas discharge passage (9a) being branched into a first branch discharge conduit (12), one end of which is communicated with the neck of the container (1), and a second branch discharge passage (13), one end of which is communicated with the container at a position where the quantity of the liquid to be filled is determined, the other ends of both the first branch discharge conduit (12) and the second branch discharge passage (13) being communicated with a valve operating chamber (11). A gas flow control valve (10) is housed in the valve operating chamber (11).