Patents by Inventor Takeshi Setomaru

Takeshi Setomaru has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11933802
    Abstract: There is provided an automatic analysis device with a structure in which a measurement unit is less susceptible to disturbance as compared to a device in the related art, and a method of designing the automatic analysis device. A first rotation axis 301 of a reaction disk 1, a second rotation axis 302 of a reagent disk 9, and a measurement unit are arranged on the same straight line 311 when an automatic analysis device 100 is viewed from an upper surface side, the first rotation axis 301 of the reaction disk 1 is arranged between the second rotation axis 302 of the reagent disk 9 and the measurement unit, and the measurement unit is arranged on a front side to be accessed by a user of the automatic analysis device 100.
    Type: Grant
    Filed: March 5, 2020
    Date of Patent: March 19, 2024
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Akihiro Yasui, Takeshi Setomaru, Akinori Kiyokawa, Masashi Fukaya
  • Publication number: 20230194556
    Abstract: Provided are an automatic analyzer and a maintenance method for an automatic analyzer that can reduce an operation of a user relating to maintenance in a plurality of maintenance operation processes. The automatic analyzer includes an analysis unit 111 including a plurality of components and configured to analyze a specimen, and an overall control unit 134 configured to control an operation of the analysis unit 111. The analysis unit 111 is provided with a sensor that monitors states of the components, and when the sensor detects that an operator executed a specific operation on the components, the overall control unit 134 requests confirmation as to whether execution status of a maintenance operation needs to be updated.
    Type: Application
    Filed: February 25, 2021
    Publication date: June 22, 2023
    Inventors: Masahiro SHIROTANI, Akihiro YASUI, Takeshi SETOMARU
  • Publication number: 20230160917
    Abstract: An automatic analyzer includes: a plurality of dispensing units; and a plurality of pump units connected to the respective dispensing units. Each of the plurality of pump units includes: a syringe tube that has a liquid port at one end and an opening at another end; a syringe base that is attached to the opening at the other end of the syringe tube; a plunger that penetrates the syringe base and whose tip end is inserted inside the syringe tube; a seal piece that is configured to seal a gap between the plunger and the syringe base; an actuator; and a power transmission mechanism that connects the actuator and the plunger. Each plunger of the plurality of pump units has an individually set diameter and a different thickness. At least one of the syringe base and the syringe tube represents the diameter of the corresponding plunger in appearance.
    Type: Application
    Filed: February 3, 2021
    Publication date: May 25, 2023
    Inventors: Shunsuke MIYAMOTO, Hiroyuki MISHIMA, Hajime YAMAZAKI, Takeshi SETOMARU, Akihiro YASUI
  • Publication number: 20220178959
    Abstract: Provided is an automatic analysis device, a cooling box, and a cooling method for a reagent in the automatic analysis device capable of suppressing dew condensation on the outside of the reagent cooling box without increasing an outer diameter of the cooling box and without affecting a reagent temperature. The automatic analysis device 100 is a device that is configured to measure physical properties of reaction liquid in which a sample and a reagent are dispensed respectively and reacted in a reaction container 30, and includes a reagent cooling box 24 that is configured to store a reagent container 106 housing the reagent, and a heating unit that is disposed on an outer peripheral part of the reagent cooling box 24 to heat the outer peripheral part.
    Type: Application
    Filed: March 4, 2020
    Publication date: June 9, 2022
    Inventors: Satoshi NAKAJIMA, Akihiro YASUI, Takeshi SETOMARU
  • Publication number: 20220170956
    Abstract: There is provided an automatic analysis device with a structure in which a measurement unit is less susceptible to disturbance as compared to a device in the related art, and a method of designing the automatic analysis device. A first rotation axis 301 of a reaction disk 1, a second rotation axis 302 of a reagent disk 9, and a measurement unit are arranged on the same straight line 311 when an automatic analysis device 100 is viewed from an upper surface side, the first rotation axis 301 of the reaction disk 1 is arranged between the second rotation axis 302 of the reagent disk 9 and the measurement unit, and the measurement unit is arranged on a front side to be accessed by a user of the automatic analysis device 100.
    Type: Application
    Filed: March 5, 2020
    Publication date: June 2, 2022
    Inventors: Akihiro YASUI, Takeshi SETOMARU, Akinori KIYOKAWA, Masashi FUKAYA
  • Publication number: 20220018861
    Abstract: Provided are a device and a method capable of determining an optimal retrieving condition of a specimen rack according to various situations, when an error occurs in any specimen among a plurality of specimens mounted on the specimen rack. When the error occurs in a specimen accommodated in a specimen container mounted on the specimen rack, conveyance of the specimen rack is controlled on the basis of information about the specimen having the error and a specimen accommodated in another specimen container on the specimen rack on which the specimen container with the specimen accommodated therein is mounted, and the retrieval condition of the specimen rack.
    Type: Application
    Filed: December 13, 2019
    Publication date: January 20, 2022
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Takeshi Setomaru, Hiroyuki Mishima
  • Publication number: 20220018867
    Abstract: In an automatic analysis device, it is possible during specimen analysis to add/deposit one rack at a time without stopping the analysis, and it is easy to ascertain the analysis sequence. The analyzer has an analysis module, a rack transport module for transporting a specimen rack in which a specimen container storing a specimen is loaded, and a control device. The rack transport module includes a rack supply part for supplying a specimen rack, a rack accommodating part for accommodating a specimen rack, a rack transport line for transporting a specimen rack supplied from the rack supply part, a dispensing line for transporting a specimen rack to the analysis module, and a rack rotor for transferring a specimen rack between the rack transport line and the dispensing line. Operation of the rack supply part for supplying a specimen rack can be stopped independently of the operation of the analysis module.
    Type: Application
    Filed: February 4, 2020
    Publication date: January 20, 2022
    Inventors: Kohei HIROKI, Akihiro YASUI, Takeshi SETOMARU
  • Publication number: 20220011333
    Abstract: Provided is an automatic analysis system in which a conveying line 104 and a plurality of dispensation lines 209, 309 are disposed not to be parallel, and a device layout of analysis modules 200, 300 disposed with a specimen rack distribution module 100 therebetween is line-symmetric with respect to a straight line 100A passing through the rotation center of a standby disc 106. Accordingly, even when the automatic analysis system has a configuration for providing specimens from a common specimen rack distribution module to a plurality of analysis modules, the conveyance efficiency of a specimen rack is raised and user accessibility is good.
    Type: Application
    Filed: December 2, 2019
    Publication date: January 13, 2022
    Inventors: Satoshi NAKAJIMA, Akihiro YASUI, Takeshi SETOMARU
  • Publication number: 20210389337
    Abstract: The present invention comprises: an incubator disk 22 upon which a plurality of reaction containers holding a reaction solution being an analyte and a reagent that have been mixed and reacted are mounted; a immunoassay unit 23 that measures the physical properties of the reaction solution; and a planning unit 103 that determines the order for measurement of analyte requested to be executed by the immunoassay unit 23. Measurement by the immunoassay unit 23 includes items having different measurement times. When measurement of sequence items having the longest measurement time will occur at least a prescribed number of times in a row, said prescribed number being at least two, the planning unit 103 provides at least one empty cycle after measurement has occurred at least the prescribed number of times.
    Type: Application
    Filed: December 2, 2019
    Publication date: December 16, 2021
    Applicant: HITACHI HIGH-TECH CORPORATION
    Inventors: Tsukasa SUENARI, Masashi AKUTSU, Hiroyuki MISHIMA, Takeshi SETOMARU, Akihiro YASUI
  • Patent number: 10073111
    Abstract: The present invention achieves an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen container installation section is small and which can be moved without being removed from a specimen installation section. The directions of movement of a probe guard are the vertical direction of a specimen container erection mechanism and the horizontal direction within an upper region of the specimen container erection mechanism, and a specimen container can be accessed without the need to move the probe guard to outside the upper region of the specimen container erection mechanism. Accordingly, it is possible to achieve an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen installation section is small and which can be moved without being removed from a specimen container erection mechanism.
    Type: Grant
    Filed: June 10, 2015
    Date of Patent: September 11, 2018
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takeshi Setomaru, Hideyasu Chiba
  • Patent number: 9689883
    Abstract: To provide an automated analyzer with a built-in, user-friendly printer that can avoid contamination of printed paper of the printer by having a housing front wall 102 provided in a recessed manner from a front end 101 of a housing upper portion that has disposed thereon a sample disc 110, a reagent disc 120, a reaction disc, a sample dispensing mechanism, and a reagent dispensing mechanism, and by having a printer 200 and a paper receptacle 210 disposed on the housing front wall. The front end portion of the housing upper portion that projects beyond the housing front wall serves as eaves, thereby preventing a sample or a reagent that may be spilled on the housing upper portion from staining the printer or printing paper.
    Type: Grant
    Filed: July 31, 2014
    Date of Patent: June 27, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Takashi Yamamoto, Takeshi Setomaru, Hideyasu Chiba
  • Publication number: 20170153259
    Abstract: The present invention achieves an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen container installation section is small and which can be moved without being removed from a specimen installation section. The directions of movement of a probe guard are the vertical direction of a specimen container erection mechanism and the horizontal direction within an upper region of the specimen container erection mechanism, and a specimen container can be accessed without the need to move the probe guard to outside the upper region of the specimen container erection mechanism. Accordingly, it is possible to achieve an automatic analysis device which has a probe guard for which the range of motion for accessing a specimen installation section is small and which can be moved without being removed from a specimen container erection mechanism.
    Type: Application
    Filed: June 10, 2015
    Publication date: June 1, 2017
    Inventors: Takeshi SETOMARU, Hideyasu CHIBA
  • Patent number: 9575085
    Abstract: In an automatic analysis device, when an external force acts on a probe guard 26 in a horizontal direction, the probe guard 26 moves in a direction escaping from the external force around a center portion 47 of a test body container installing mechanism 1, and the probe guard 26 is separated from a fixed position. An outer circumferential wall 29 of the probe guard 26 invades a test body sampling mechanism track 28, and thus a risk that a sampling nozzle 23 of a test body sampling mechanism 5 invades the test body container installing mechanism 1 is avoided by the outer circumferential wall 29. When the probe guard 26 is separated from the fixed position, this is detected, and thus the operation of the test body sampling mechanism 5 and the test body container installing mechanism 1 is stopped.
    Type: Grant
    Filed: January 24, 2014
    Date of Patent: February 21, 2017
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Takeshi Setomaru, Masato Ishizawa, Hideyasu Chiba
  • Publication number: 20160195562
    Abstract: To provide an automated analyzer with a built-in, user-friendly printer that can avoid contamination of printed paper of the printer by having a housing front wall 102 provided in a recessed manner from a front end 101 of a housing upper portion that has disposed thereon a sample disc 110, a reagent disc 120, a reaction disc, a sample dispensing mechanism, and a reagent dispensing mechanism, and by having a printer 200 and a paper receptacle 210 disposed on the housing front wall. The front end portion of the housing upper portion that projects beyond the housing front wall serves as eaves, thereby preventing a sample or a reagent that may be spilled on the housing upper portion from staining the printer or printing paper.
    Type: Application
    Filed: July 31, 2014
    Publication date: July 7, 2016
    Inventors: Mitsuru OONUMA, Yoko SATO, Takashi YAMAMOTO, Takeshi SETOMARU, Hideyasu CHIBA
  • Publication number: 20160195563
    Abstract: A panel holding base holding an operating panel disposed on a front-face side of a device upper part of an automated analyzer is inclined so as to rise from a lower end side on the front-face side toward an upper end side, and has a shape with increasingly narrower width from the lower end side toward the upper end side. As a result, increased operating panel operability and improved access to a sample disc or a reagent disc are simultaneously achieved.
    Type: Application
    Filed: July 29, 2014
    Publication date: July 7, 2016
    Inventors: Mitsuru OONUMA, Yoko SATO, Takashi YAMAMOTO, Takeshi SETOMARU, Hideyasu CHIBA
  • Publication number: 20150346230
    Abstract: In an automatic analysis device, when an external force acts on a probe guard 26 in a horizontal direction, the probe guard 26 moves in a direction escaping from the external force around a center portion 47 of a test body container installing mechanism 1, and the probe guard 26 is separated from a fixed position. An outer circumferential wall 29 of the probe guard 26 invades a test body sampling mechanism track 28, and thus a risk that a sampling nozzle 23 of a test body sampling mechanism 5 invades the test body container installing mechanism 1 is avoided by the outer circumferential wall 29. When the probe guard 26 is separated from the fixed position, this is detected, and thus the operation of the test body sampling mechanism 5 and the test body container installing mechanism 1 is stopped.
    Type: Application
    Filed: January 24, 2014
    Publication date: December 3, 2015
    Inventors: Takeshi SETOMARU, Masato ISHIZAWA, Hideyasu CHIBA
  • Patent number: 8697014
    Abstract: A specimen rack can be used for specimen containers irrespective of kinds thereof and irrespective of whether or not the specimen containers are rotated. An adapter is used for an automatic analyzer and a specimen pre-processing device and is adapted for a specimen rack capable of holding specimen containers. The adapter is provided with a specimen rack mounting section inserted and fixed to an adapter insertion section of a specimen rack body, a specimen container positioning section for holding the specimen containers, and a sleeve.
    Type: Grant
    Filed: September 3, 2009
    Date of Patent: April 15, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Kouichi Suzuki, Nobuo Suzuki, Seiji Nomura, Tadashi Oishi, Takeshi Setomaru
  • Patent number: D720079
    Type: Grant
    Filed: December 9, 2013
    Date of Patent: December 23, 2014
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Takashi Yamamoto, Takeshi Setomaru, Hideyasu Chiba
  • Patent number: D721820
    Type: Grant
    Filed: December 9, 2013
    Date of Patent: January 27, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Takashi Yamamoto, Takeshi Setomaru, Hideyasu Chiba
  • Patent number: D729399
    Type: Grant
    Filed: December 9, 2013
    Date of Patent: May 12, 2015
    Assignee: Hitachi High-Technologies Corporation
    Inventors: Mitsuru Oonuma, Yoko Sato, Takashi Yamamoto, Takeshi Setomaru, Hideyasu Chiba