Patents by Inventor Takeshi Shoda
Takeshi Shoda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10377883Abstract: The present invention provides a rubber composition for a tire having improved workability and abrasion resistance. A rubber composition for a tire according to the present invention comprises: a polybutadiene which has: (A) a Mooney viscosity (ML1+4,100° C.) being 43 or more; (B) a ratio (Tcp/ML1+4,100° C.) of 5 wt % toluene solution viscosity (Tcp) to Mooney viscosity (ML1+4,100° C.) being 0.9 to 2.3; (C) a stress relaxation time (T80) being 10.0 to 40.0 seconds, which is a time until a torque is attenuated by 80% when the torque at the end of ML1+4,100° C. measurement is 100%; and (D) a molecular weight distribution (Mw/Mn) being 2.50 to 4.00; another rubber (ii); and a rubber reinforcing material (iii).Type: GrantFiled: February 19, 2015Date of Patent: August 13, 2019Assignees: UBE INDUSTRIES, LTD., SUMITOMO RUBBER INDUSTRIES, LTD.Inventors: Mitsuharu Ambe, Yuuto Kanou, Takeshi Shoda, Takahiro Mabuchi, Toshifumi Haba
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Patent number: 9676881Abstract: The present invention provides a polybutadiene having improved workability and abrasion resistance. A polybutadiene according to the present invention has: (A) a Mooney viscosity (ML1+4,100° C.) being 43 or more; (B) a ratio (Tcp/ML1+4,100° C.) of 5 wt % toluene solution viscosity (Tcp) to Mooney viscosity (ML1+4,100° C.) being 0.9 to 2.3; (C) a stress relaxation time (T80) being 10.0 to 40.0 seconds, which is a time until a torque is attenuated by 80% when the torque at the end of ML1+4,100° C.measurement is 100%; and (D) a molecular weight distribution (Mw/Mn) being 2.50 to 4.00.Type: GrantFiled: February 19, 2015Date of Patent: June 13, 2017Assignee: UBE INDUSTRIES, LTD.Inventors: Mitsuharu Ambe, Yuuto Kanou, Takeshi Shoda
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Publication number: 20170107358Abstract: The present invention provides a rubber composition for a tire having improved workability and abrasion resistance. A rubber composition for a tire according to the present invention comprises: a polybutadiene which has: (A) a Mooney viscosity (ML1+4,100° C.) being 43 or more; (B) a ratio (Tcp/ML1+4,100° C.) of 5 wt % toluene solution viscosity (Tcp) to Mooney viscosity (ML1+4,100° C.) being 0.9 to 2.3; (C) a stress relaxation time (T80) being 10.0 to 40.0 seconds, which is a time until a torque is attenuated by 80% when the torque at the end of ML1+4,100° C. measurement is 100%; and (D) a molecular weight distribution (Mw/Mn) being 2.50 to 4.00; another rubber (ii); and a rubber reinforcing material (iii).Type: ApplicationFiled: February 19, 2015Publication date: April 20, 2017Applicants: UBE INDUSTRIES, LTD., SUMITOMO RUBBER INDUSTRIES, LTD.Inventors: Mitsuharu AMBE, Yuuto KANOU, Takeshi SHODA, Takahiro MABUCHI, Toshifumi HABA
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Publication number: 20170015766Abstract: The present invention provides a polybutadiene having improved workability and abrasion resistance. A polybutadiene according to the present invention has: (A) a Mooney viscosity (ML1+4,100° C.) being 43 or more; (B) a ratio (Tcp/ML1+4,100° C.) of 5 wt % toluene solution viscosity (Tcp) to Mooney viscosity (ML1+4,100° C.) being 0.9 to 2.3; (C) a stress relaxation time (T80) being 10.0 to 40.0 seconds, which is a time until a torque is attenuated by 80% when the torque at the end of ML1+4,100° C.measurement is 100%; and (D) a molecular weight distribution (Mw/Mn) being 2.50 to 4.00.Type: ApplicationFiled: February 19, 2015Publication date: January 19, 2017Applicant: UBE INDUSTRIES, LTD.Inventors: Mitsuharu AMBE, Yuuto KANOU, Takeshi SHODA
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Patent number: 8283401Abstract: Provided by using a catalyst containing an yttrium compound is conjugated diene polymer with very low solution viscosity, improved workability, high degree of branching, and high content of cis-1,4 structures. Also provided is a rubber composition utilizing the polymer and allowing excellent dispersion of reinforcing agent. According to a method of manufacturing a conjugated diene polymer characterized by polymerizing a conjugated diene at 50 to 120° C. in the presence of a catalyst obtained from (A) an yttrium compound, (B) an ionic compound consisting of a non-coordinating anion and a cation, and (C) an organoaluminum compound, the conjugated diene polymer has the following characteristics that: (1) a ratio (Tcp/ML1+4) between a 5 wt % toluene solution viscosity (Tcp) measured at 25° C. and a Mooney viscosity (ML1+4) at 100° C. is 0.1 to 1.2; and (2) a content of cis-1,4 structures is 80% or higher, and a content of 1,2 structures is lower than 5%.Type: GrantFiled: December 4, 2009Date of Patent: October 9, 2012Assignee: UBE Industries, LtdInventors: Masato Murakami, Koji Shiba, Takeshi Shoda, Mitsuharu Anbe
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Publication number: 20110269899Abstract: Provided by using a catalyst containing an yttrium compound is conjugated diene polymer with very low solution viscosity, improved workability, high degree of branching, and high content of cis-1,4 structures. Also provided is a rubber composition utilizing the polymer and allowing excellent dispersion of reinforcing agent. According to a method of manufacturing a conjugated diene polymer characterized by polymerizing a conjugated diene at 50 to 120° C. in the presence of a catalyst obtained from (A) an yttrium compound, (B) an ionic compound consisting of a non-coordinating anion and a cation, and (C) an organoaluminum compound, the conjugated diene polymer has the following characteristics that: (1) a ratio (Tcp/ML1+4) between a 5 wt % toluene solution viscosity (Tcp) measured at 25° C. and a Mooney viscosity (ML1+4) at 100° C. is 0.1 to 1.2; and (2) a content of cis-1,4 structures is 80% or higher, and a content of 1,2 structures is lower than 5%.Type: ApplicationFiled: December 4, 2009Publication date: November 3, 2011Applicant: UBE INDUSTRIES, LTD.Inventors: Masato Murakami, Koji Shiba, Takeshi Shoda, Mitsuharu Anbe
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Patent number: 7702979Abstract: An object of the invention is to drastically reduce the area overhead in a semiconductor integrated circuit incorporating a test configuration that uses a partially rotational scan circuit. To achieve this, in the semiconductor integrated circuit incorporating the test configuration that comprises a combinational circuit (3) and a scan chain (2) constructed by connecting a plurality of scan flip-flops (5) in a chain, the scan chain (2) is divided into a plurality of sub scan-chains (20a to 20n) each of which has a partially rotational scan (PRS) function and a test response compaction (MISR) function. By performing a scan test in a plurality of steps while changing the combination of the sub scan-chains to be set as PRS and the sub scan-chains to be set as MISR, the test can be performed without having to provide a test response compactor separately from the scan chain, and thus the area overhead can be reduced.Type: GrantFiled: April 5, 2006Date of Patent: April 20, 2010Assignee: Semiconductor Technology Academic Research CenterInventors: Masayuki Arai, Kazuhiko Iwasaki, Satoshi Fukumoto, Takeshi Shoda, Junichi Nishimoto
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Patent number: 7299394Abstract: The purpose of the invention is to determine an optimum initial value to be input to a test pattern generator in order to achieve efficient testing of an integrated circuit. To achieve this purpose, a minimum test length is obtained by performing a fault simulation and a reverse-order fault simulation using an arbitrarily given initial value; the next initial value that is likely to yield a test length shorter than the minimum test length is computed and a fault simulation is performed using the thus computed initial value; and the next initial value that is likely to yield a test length shorter than that test length is computed and a fault simulation is performed using the thus computed initial value. By repeating this process, an initial value that yields the shortest test length is obtained.Type: GrantFiled: March 28, 2003Date of Patent: November 20, 2007Assignee: Semiconductor Technology Academic Research CenterInventors: Ken-ichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Takeshi Shoda, Masayuki Sato
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Publication number: 20060282730Abstract: An object of the invention is to drastically reduce the area overhead in a semiconductor integrated circuit incorporating a test configuration that uses a partially rotational scan circuit. To achieve this, in the semiconductor integrated circuit incorporating the test configuration that comprises a combinational circuit (3) and a scan chain (2) constructed by connecting a plurality of scan flip-flops (5) in a chain, the scan chain (2) is divided into a plurality of sub scan-chains (20a to 20n) each of which has a partially rotational scan (PRS) function and a test response compaction (MISR) function. By performing a scan test in a plurality of steps while changing the combination of the sub scan-chains to be set as PRS and the sub scan-chains to be set as MISR, the test can be performed without having to provide a test response compactor separately from the scan chain, and thus the area overhead can be reduced.Type: ApplicationFiled: April 5, 2006Publication date: December 14, 2006Applicant: SEMICONDUCTOR TECHNOLOGY ACADEMIC RESEARCH CENTERInventors: Masayuki Arai, Kazuhiko Iwasaki, Satoshi Fukumoto, Takeshi Shoda, Junichi Nishimoto
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Publication number: 20040088626Abstract: The purpose of the invention is to determine an optimum initial value to be input to a test pattern generator in order to achieve efficient testing of an integrated circuit. To achieve this purpose, a minimum test length is obtained by performing a fault simulation and a reverse-order fault simulation using an arbitrarily given initial value; the next initial value that is likely to yield a test length shorter than the minimum test length is computed and a fault simulation is performed using the thus computed initial value; and the next initial value that is likely to yield a test length shorter than that test length is computed and a fault simulation is performed using the thus computed initial value. By repeating this process, an initial value that yields the shortest test length is obtained.Type: ApplicationFiled: March 28, 2003Publication date: May 6, 2004Applicant: Semiconductor Tchnology Academic Research CenterInventors: Ken-ichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Takeshi Shoda, Masayuki Sato
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Patent number: 6114451Abstract: In a rubber blend consisting of:a polybutadiene blend (A)+(B) composed of:(A) not less than 30% by weight but less than 70% by weight of a high molecular weight polybutadiene comprising as the main component a polybutadiene having an intrinsic viscosity [.eta.] of 3.0 to 7.0 as measured in toluene at 30.degree. C. and a cis-1,4-configuration content of at least 80% and(B) more than 30% by weight but not more than 70% by weight of a low molecular weight polybutadiene comprising, as the main component, a polybutadiene having an intrinsic viscosity [.eta.] of 0.1 to 0.5 as measured in toluene at 30.degree. C., and(C) a diene type rubber other than the above components (A) and (B),the rubber blend (A)+(B) is contained in a proportion of 35 to 95 percent by total weight of rubber blend (A)+(B)+(C), thereby providing a rubber blend suitable for a tire; said blend being greatly improved in wet skid performance and ice skid performance with retention of the abrasion resistance of a conventional polybutadiene.Type: GrantFiled: August 19, 1998Date of Patent: September 5, 2000Assignees: Ube Industries, Ltd., Bridgestone CorporationInventors: Takeshi Shoda, Naomi Okamoto, Koji Ohkawa
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Patent number: 5895798Abstract: A liquid rubber composition including a 1,2-polybutadiene resin component dispersed in the form of fine particles in a liquid rubber component in a weight ratio of 1:100 to 50:100 has a high dispersion stability and a low specific gravity and is useful for forming a cured rubber article having a high elastic modulus and a satisfactory mechanical strength and ultimate elongation.Type: GrantFiled: October 6, 1997Date of Patent: April 20, 1999Assignee: Ube Industries, Ltd.Inventors: Naomi Okamoto, Takeshi Shoda