Abstract: A non-transitory computer-readable storage medium storing a flow generation program that causes at least one computer to execute a process, the process includes based on first metadata that corresponds to a first problem of processing flow generation, selecting a processing flow that corresponds to a second problem with second metadata with a certain similarity level with respect to the first metadata by referring to a memory that stores a plurality pieces of metadata and a plurality of processing flows that correspond to each of a plurality of problems, the plurality of problems including the first problem and the second problem; and specifying a tree structure of the process flow that corresponds to the first problem based on genetic programming that uses the selected processing flow as an initial individual.

Abstract: A non-transitory computer-readable recording medium storing an arithmetic program of searching for a combination of a plurality of explanatory variables such that an objective variable satisfies a predetermined condition by evolving a plurality of individuals each identified by the plurality of explanatory variables, the arithmetic program causing a computer to execute processing including: setting a constraint on the combination of the plurality of explanatory variables and controlling an intermediate variable that varies the explanatory variables of each of the plurality of individuals independently of the constraint; and evaluating an objective function obtained using the explanatory variables varied by the intermediate variable.

Abstract: An information processing device includes: a memory; and a processor coupled to the memory and configured to: learn a classification rule that classifies an abnormal degree of a production facility from a text feature amount based on the text feature amount obtained from a number of texts included in a plurality of pieces of log data obtained in a predetermined process of the production facility and production history information of the production facility; extract a text feature amount of log data to be monitored obtained in the predetermined process of the production facility; and determine an abnormal degree of the production facility when the log data to be monitored is obtained based on the text feature amount and the classification rule.

Abstract: A storage medium storing an information processing program that causes a computer to execute a process that includes generating a solution set of a combination of the value and the index value by performing first multi-objective optimization by using a first objective function that searches for a value of the characteristic variable and a second objective function that searches for an index value that indicates reliability of the value; specifying an index value included in a combination that serves as a solution in a case where a characteristic variable is a certain value in the generated solution set; and generating a solution set of a combination of the respective values of the plurality of characteristic variables by performing second multi-objective optimization by using an objective function that searches for a value of each of a plurality of characteristic variables.

Abstract: A material evaluation device includes one or more memories; and one or more processors coupled to the one or more memories and the one or more processors configured to: store a certain number of hysteresis curves that, with respect to a change in a first physical quantity of N times at least one of a plurality of positions of a material, each represents a change in a second physical quantity of each time, the N being an integer equal to or greater than 2, extract points extracted by scanning each of the N hysteresis curves with a value of the second physical quantity for at least one of the plurality of positions, generate one-dimensional information regarding the second physical quantity by arraying the extracted points, and acquire a physical property value of the material by using the generated one-dimensional information.

Abstract: An information processing device includes one or more processors configured to: by executing single-objective optimization on a first objective function among a plurality of objective functions defined according to feeding orders of a plurality of objects into a work line, specify first feeding orders in which values of the first objective function are better than an initial feeding order, by executing the single-objective optimization on a second objective function, specify second feeding orders in which the values of the second objective function are better than the initial feeding order, and executing multi-objective optimization on the plurality of objective functions by using the first feeding orders and the second feeding orders.

Abstract: An information processing apparatus configured to generate an initial order for manufacturing a plurality of products by using a plurality of parts, generate a plurality of states in which the order of the plurality of parts, allocate the plurality of parts included in the range to the plurality of products, acquire the product quality of each of the plurality of products to which the plurality of parts is allocated, repeat order search that determines the order of the parts in the range based on the product quality while changing the position of the range in the initial order, and search for a first order of the plurality of parts by executing processing of determining the order of the parts in the initial order after changing the order in the range as a part of the initial order, while sequentially changing a position of the range in the initial order.

Abstract: An information processing method for causing a computer to perform multi-objective optimization, the information processing method includes: obtaining, by a multi-objective optimization method, a Pareto solution set from a model generated based on data for each of a plurality of objective functions regarding the multi-objective optimization; and updating the model by using a Pareto solution from among the obtained Pareto solution set, the Pareto solution being a solution that has a relatively large variance of values of the objective function in the model.

Abstract: An optimization apparatus configured to perform optimizing of an optimization problem represented by an objective function expression including a continuous variable composed of continuous value data and a discrete variable composed of discrete value data, the optimizing including: obtaining an n-th generation data value group including data values selected from the continuous value data; determining an evaluation value of each data value in the n-th generation data value group by performing optimization processing on the objective function expression by an annealing method using the n-th generation data value group; obtaining an (n+1)-th generation data value group based on the evaluation values by using a genetic algorithm, the (n+1)-th generation data value group being different from the n-th generation data value group and including data values selected from the continuous value data; and replacing the n-th generation data value group with the (n+1)-th generation data value group as the continuous variabl

Abstract: An optimization device of optimizing a shape of an object, the optimization device being configured to perform an optimization processing, the optimization processing including: obtaining an objective function equation based on a contribution to a predetermined characteristic of the object in each element of a plurality of elements, each of the plurality of elements being an element obtained by dividing the object arranged in a design region; and optimizing the shape of the object by determining, for the each element of the object, whether to arrange the each element of the object based on the obtained objective function equation.

Abstract: A quality determination method includes: in a quality determination space, mapping a quality of a package product in which a plurality of devices are assembled in accordance with a predetermined design condition, with use of each test result of each of the plurality of devices; and determining a quality of the package product, on a basis of mapping result of the mapping.

Abstract: A soft error inspection method for a semiconductor device includes: irradiating and scanning the semiconductor device with a laser beam or an electron beam; and measuring and storing a time of bit inversion for each of areas irradiated with the laser beam or the electron beam of the semiconductor device.

Abstract: An information processing device includes a processor configured to: calculate a principal component score of each piece of manufacturing data for each verification data by using an eigenvector obtained by performing principal component analysis on each piece of manufacturing data of a manufactured product and performing principal component analysis on each piece of manufacturing data of the verification data to which an OK or no-good label is attached; calculate determination accuracy in a case where OK or no good of each verification data is determined by using a number of dimensions of the principal component score, a combination of the principal component scores for the number of dimensions, and a determination threshold of a distance in a principal component space of the combination; and search for the number of dimensions, the combination, and the determination threshold that make the determination accuracy satisfy a predetermined condition as determination rules.

Abstract: A method of diagnosing a pipe includes diagnosing, by a computer, a state of a pipe from an updated model based on change in temperature of the pipe calculated from the model in a case where the pipe is heated in the model obtained by modeling a heat transfer behavior of an inside of the pipe containing deposition by using an equivalent circuit and change in temperature of the pipe measured in a case where the pipe is heated.

Abstract: An information processing device includes: a memory; and a processor coupled to the memory and configured to: learn a classification rule that classifies an abnormal degree of a production facility from a text feature amount based on the text feature amount obtained from a number of texts included in a plurality of pieces of log data obtained in a predetermined process of the production facility and production history information of the production facility; extract a text feature amount of log data to be monitored obtained in the predetermined process of the production facility; and determine an abnormal degree of the production facility when the log data to be monitored is obtained based on the text feature amount and the classification rule.

Abstract: A soft error inspection method for a semiconductor device includes: irradiating and scanning the semiconductor device with a laser beam or an electron beam; and measuring and storing a time of bit inversion for each of areas irradiated with the laser beam or the electron beam of the semiconductor device.

Abstract: A thermal analysis device includes a memory and a processor configured to perform estimation of whether a pair of components included in a target product has contact with each other by referring to first information obtained from design information of a product, the first information indicating whether two components have contact with each other, perform determination of a division number of the pair of components in a thermal network model by referring to second information indicating a relationship between a parameter regarding thermal transfer of components and a division number of the components in the thermal network model, perform generation of the thermal network model of the target product on the basis of a result of the estimation and another result of the determination, and perform thermal analysis based on the generated thermal network model of the target product.

Abstract: A quality determination method includes: in a quality determination space, mapping a quality of a package product in which a plurality of devices are assembled in accordance with a predetermined design condition, with use of each test result of each of the plurality of devices; and determining a quality of the package product, on a basis of mapping result of the mapping.

Abstract: A detector is the one which detects reflected electrons or secondary electrons emitted from a sample as a result of irradiation with an electron beam by an electron beam irradiation unit, and its one end is set into a non-contact state where it is separated from and faces the sample and the other end is supported on and fixed to a drive mechanism, and the drive mechanism freely moves the detector random positions three-dimensionally with respect to the sample. According to this configuration, it is possible to detect reflected electrons and secondary electrons scattered in random directions appropriately, and accurate evaluation of a crystal grain diameter in which no crystal grain boundary is overlooked and acquisition of an isotropic surface shape image are achieved.

Abstract: A physical properties measuring method includes: acquiring an experimental convergent beam electron diffraction image of a sample by using a transmission electron microscope; calculating Zernike moment intensities of the experimental convergent beam electron diffraction image; and comparing the Zernike moment intensities of the experimental convergent beam electron diffraction image with Zernike moment intensities of calculated convergent beam electron diffraction images calculated on changed physical properties of the sample.