Abstract: A space temperature scanner capable of measuring a temperature distribution in a space without requiring troublesome device installation work or complex data processing is disclosed. The space temperature scanner (scanner 100) of the present invention includes a bar-shaped portable support member 110, attachment units 120 arranged along a straight line on the support member 110, and thermocouple units 130 that can be removably attached to the attachment units 120. The thermocouple units 130 can be selectively attached to some or all of the attachment units 120 when temperature measurement is to be performed.

Abstract: This disclosure provides a heat exchanger that can more efficiently remove the frost attached to the heat exchanger. A configuration of a heat exchanger according to the present invention includes a heat transfer member (e.g., a fin) that performs heat exchange with air, wherein the heat transfer member (e.g., the fin) includes, in a vicinity of an upstream-side edge in an air traveling direction, a plurality of linear protruding portions that are formed in parallel to the edge.

Abstract: This disclosure provides a heat exchanger that can more efficiently remove the frost attached to the heat exchanger. A configuration of a heat exchanger according to the present invention includes a heat transfer member (e.g., a fin) that performs heat exchange with air, wherein the heat transfer member (e.g., the fin) includes, in a vicinity of an upstream-side edge in an air traveling direction, a plurality of linear protruding portions that are formed in parallel to the edge.

Abstract: [Problem] Many oxide-ion conductors exhibit high functionality at high temperatures due to the large weight and charge of oxide ions, and it has been difficult to achieve the functionality at low temperatures. [Solution] A perovskite oxide having hydride ion conductivity, at least 1 at % of the oxide ions (O2?) contained in a titanium-containing perovskite oxide being substituted with hydride ions (H?). This oxide, in which negatively charged hydride ions (H?) are used for the ionic conduction, has both hydride ion conductivity and electron conductivity. As a starting material, the titanium-containing perovskite oxide is kept together with a powder of an alkali metal or alkaline-earth metal hydride selected from LiH, CaH2, SrH2, and BaH2 in a temperature range of 300° C. or higher and lower than the melting point of the hydride in a vacuum or an inert gas atmosphere to substitute some of the oxide ions in the oxide with the hydride ions, resulting in the introduction of the hydride ions into oxygen sites.

Abstract: [Problem] Many oxide-ion conductors exhibit high functionality at high temperatures due to the large weight and charge of oxide ions, and it has been difficult to achieve the functionality at low temperatures. [Solution] A perovskite oxide having hydride ion conductivity, at least 1 at % of the oxide ions (O2?) contained in a titanium-containing perovskite oxide being substituted with hydride ions (H?). This oxide, in which negatively charged hydride ions (H?) are used for the ionic conduction, has both hydride ion conductivity and electron conductivity. As a starting material, the titanium-containing perovskite oxide is kept together with a powder of an alkali metal or alkaline-earth metal hydride selected from LiH, CaH2, SrH2, and BaH2 in a temperature range of 300° C. or higher and lower than the melting point of the hydride in a vacuum or an inert gas atmosphere to substitute some of the oxide ions in the oxide with the hydride ions, resulting in the introduction of the hydride ions into oxygen sites.

Abstract: A method for inspecting a light-emitting element for a defect includes (a) measuring a light output of a light-emitting element while injecting a current into the light-emitting element, (b) setting a drive current according to an injected current and a measured light output, (c) measuring a light output while injecting the set drive current into the light-emitting element in a forward direction, and (d) determining whether or not the light-emitting element has a defect, according to the light output measured in step (c).

Abstract: An optical element includes an optical section having at least one of an emission section and a photodetection section, a sealing member that surrounds at least a part of the optical section through an internal space, an electrode that is electrically connected to the optical section, a conductive member that is contained in the sealing member and conductively connected to the electrode, a substrate that is disposed opposite to an optical surface provided at the optical section, and a wiring that is formed on the substrate and conductively connected to the conductive member, wherein the optical surface is at least one of a plane of light emission and a plane of light incidence.

Abstract: An optical element includes an optical section having at least one of an emission section and a photodetection section, a sealing member that surrounds at least a part of the optical section through an internal space, an electrode that is electrically connected to the optical section, a conductive member that is contained in the sealing member and conductively connected to the electrode, a substrate that is disposed opposite to an optical surface provided at the optical section, and a wiring that is formed on the substrate and conductively connected to the conductive member, wherein the optical surface is at least one of a plane of light emission and a plane of light incidence.