Patents by Inventor Takuho Maeda
Takuho Maeda has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11257205Abstract: An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.Type: GrantFiled: December 20, 2016Date of Patent: February 22, 2022Assignee: MITUTOYO CORPORATIONInventors: Gyokubu Cho, Koichi Komatsu, Akira Takada, Hiroyuki Yoshida, Takashi Hanamura, Takuho Maeda, Makoto Kaieda, Isao Tokuhara
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Patent number: 10163201Abstract: A hardness tester includes a memory associating and storing a parts program having defined measurement conditions with respect to a sample, including a test position, and an image file acquired by capturing an image of the shape of the sample; an image acquirer acquiring image data of the sample to be measured; a pattern matcher performing a pattern matching process on the image data of the sample using the image file associated with the parts program; a determiner determining whether an image file exists which has a shape related to the image data of the sample; a retriever retrieving the parts program associated with the image file having a related shape; and a measurer measuring hardness of the sample based on the retrieved parts program.Type: GrantFiled: August 30, 2016Date of Patent: December 25, 2018Assignee: MITUTOYO CORPORATIONInventors: Takeshi Sawa, Takashi Hanamura, Akira Takada, Takuho Maeda
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Patent number: 10102631Abstract: A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.Type: GrantFiled: March 30, 2016Date of Patent: October 16, 2018Assignee: MITUTOYO CORPORATIONInventors: Hiroyuki Yoshida, Akira Takada, Makoto Kaieda, Gyokubu Cho, Koichi Komatsu, Hidemitsu Asano, Takashi Hanamura, Takuho Maeda, Isao Tokuhara
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Patent number: 10027885Abstract: An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on, a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes an individual determination results display region displaying individual determination results for each measurement position; and an overall determination results display region displaying overall determination results for the measured object as a unit. The image measuring apparatus is configured to display the individual determination results and the overall determination results together.Type: GrantFiled: July 13, 2015Date of Patent: July 17, 2018Assignee: MITUTOYO CORPORATIONInventors: Gyokubu Cho, Akira Takada, Takashi Hanamura, Takuho Maeda
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Publication number: 20170178315Abstract: An image measuring method performed with an image measuring device measuring a dimension of a measured object from an image of the measured object captured by an image capturer. The method executes a standard reference object measurement measuring a dimension of the standard reference object with the image measuring device; a standard reference dimension input inputting a dimension of the standard reference object specified by a device other than the image measuring device; a preset value calculation calculating a preset value from the dimension of the measured standard reference object and from a dimension of the standard reference object measured by a predetermined measurement tool; a measurement measuring a dimension of a measured object other than the standard reference object using the image measuring device; and a correction correcting the dimension of the measured object other than the standard reference object measured by the image measuring device.Type: ApplicationFiled: December 20, 2016Publication date: June 22, 2017Applicant: MITUTOYO CORPORATIONInventors: Gyokubu CHO, Koichi KOMATSU, Akira TAKADA, Hiroyuki YOSHIDA, Takashi HANAMURA, Takuho MAEDA, Makoto KAIEDA, Isao TOKUHARA
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Publication number: 20170076436Abstract: A hardness tester includes a memory associating and storing a parts program having defined measurement conditions with respect to a sample, including a test position, and an image file acquired by capturing an image of the shape of the sample; an image acquirer acquiring image data of the sample to be measured; a pattern matcher performing a pattern matching process on the image data of the sample using the image file associated with the parts program; a determiner determining whether an image file exists which has a shape related to the image data of the sample; a retriever retrieving the parts program associated with the image file having a related shape; and a measurer measuring hardness of the sample based on the retrieved parts program.Type: ApplicationFiled: August 30, 2016Publication date: March 16, 2017Applicant: MITUTOYO CORPORATIONInventors: Takeshi SAWA, Takashi HANAMURA, Akira TAKADA, Takuho MAEDA
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Publication number: 20160295207Abstract: A distance in a scanning direction between a first set of edges which face each other and exhibit an opposite change between light and dark is measured by an image measuring machine, and a bias correction value is calculated based on a difference between a measured value and a true value. Using the bias correction value, detection point correction values, which are correction values in various directions of edge detection points detected by a scan of a measured object using the image measuring machine, are calculated; a correction amount used in correction of the edge detection points is specified based on the detection point correction value in each direction; and the edge detection points are corrected using the correction amount.Type: ApplicationFiled: March 30, 2016Publication date: October 6, 2016Applicant: MITUTOYO CORPORATIONInventors: Hiroyuki YOSHIDA, Akira TAKADA, Makoto KAIEDA, Gyokubu CHO, Koichi KOMATSU, Hidemitsu ASANO, Takashi HANAMURA, Takuho MAEDA, Isao TOKUHARA
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Publication number: 20160131474Abstract: A non-contact surface-shape measuring method uses a white light interferometer optical head that divides, through a beam splitter, light emitted from a white light source into reference light for a reference mirror and measurement light for a measured object surface; obtains an image having interference fringes generated from an optical path difference of light reflecting from the reference mirror and light reflecting from the measured object surface; and is displaced for scanning in a vertical direction with respect to the measured object surface in order to obtain the image having interference fringes. While the white light interferometer optical head is displaced in a scanning direction, a position of the optical head in the scanning direction is detected, and the image having interference fringes is obtained at predetermined spatial intervals in the scanning direction.Type: ApplicationFiled: October 30, 2015Publication date: May 12, 2016Applicant: MITUTOYO CORPORATIONInventors: Takeshi SAEKI, Yutaka WATANABE, Takuho MAEDA
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Publication number: 20160021306Abstract: An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on, a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes an individual determination results display region displaying individual determination results for each measurement position; and an overall determination results display region displaying overall determination results for the measured object as a unit. The image measuring apparatus is configured to display the individual determination results and the overall determination results together.Type: ApplicationFiled: July 13, 2015Publication date: January 21, 2016Applicant: MITUTOYO CORPORATIONInventors: Gyokubu CHO, Akira TAKADA, Takashi HANAMURA, Takuho MAEDA
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Publication number: 20160019687Abstract: An image measuring apparatus is configured such that an image of a measured object placed on a stage is captured by a camera, the captured image is displayed on a captured image display screen, and determination results based on results of a measurement are displayed in an overview list separately from the captured image of the measured object. The image measuring apparatus includes a selector selecting measurement results that include determination results on the list; and an emphasis displayer providing an emphasis display on the captured image display screen for a measurement position corresponding to the selected measurement results.Type: ApplicationFiled: July 13, 2015Publication date: January 21, 2016Applicant: MITUTOYO CORPORATIONInventors: Gyokubu CHO, Akira TAKADA, Takashi HANAMURA, Takuho MAEDA
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Patent number: 8553181Abstract: According to one embodiment, a liquid crystal display device includes a first substrate including pixel electrodes disposed, respectively, in a first color pixel on one end side of an active area and in a second color pixel on the other end side of the active area, a light-shield layer which surrounds the first color pixel and the second color pixel and extends to a peripheral area surrounding the active area, a first color filter disposed in the first color pixel, a second color filter disposed in the second color pixel, a dummy color filter which is stacked on the light-shield layer in the peripheral area, creates a distance between second color filter and the dummy color filter and is continuous with the first color filter.Type: GrantFiled: June 5, 2012Date of Patent: October 8, 2013Assignee: Japan Display Central Inc.Inventors: Eishi Yamakawa, Sakae Yoshida, Daichi Hosokawa, Junichi Kobayashi, Takuho Maeda, Atsushi Yamazaki
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Publication number: 20130027645Abstract: According to one embodiment, a liquid crystal display device includes a first substrate including pixel electrodes disposed, respectively, in a first color pixel on one end side of an active area and in a second color pixel on the other end side of the active area, a light-shield layer which surrounds the first color pixel and the second color pixel and extends to a peripheral area surrounding the active area, a first color filter disposed in the first color pixel, a second color filter disposed in the second color pixel, a dummy color filter which is stacked on the light-shield layer in the peripheral area, creates a distance between second color filter and the dummy color filter and is continuous with the first color filter.Type: ApplicationFiled: June 5, 2012Publication date: January 31, 2013Inventors: Eishi YAMAKAWA, Sakae Yoshida, Daichi Hosokawa, Junichi Kobayashi, Takuho Maeda, Atsushi Yamazaki