Patents by Inventor Takuma KATOU

Takuma KATOU has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9513282
    Abstract: Provided are a sample analyzer and sample analyzing method capable of performing proper and efficient analysis by fitting measurement items of a sample to the patient. A sample analyzer 1 obtains a patient ID and measurement order from a laboratory host 10 based on the sample ID read from a barcode label T1 of a sample container T via a barcode reader B1, and the measurement items of the obtained measurement order are recorded in a work list. The sample analyzer 1 also prepares revised measurement items based on past measurement results corresponding to the obtained patient ID. The sample analyzer 1 replaces the measurement items of the work list with the revised measurement items when the revised measurement items satisfy predetermined conditions, and measures and analyzes the sample according to the replacement measurement items.
    Type: Grant
    Filed: March 5, 2013
    Date of Patent: December 6, 2016
    Assignee: Sysmex Corporation
    Inventors: Takuma Katou, Daigo Fukuma, Yuichi Hamada
  • Publication number: 20130262143
    Abstract: Provided are a sample analyzer and sample analyzing method capable of performing proper and efficient analysis by fitting measurement items of a sample to the patient. A sample analyzer 1 obtains a patient ID and measurement order from a laboratory host 10 based on the sample ID read from a barcode label T1 of a sample container T via a barcode reader B1, and the measurement items of the obtained measurement order are recorded in a work list. The sample analyzer 1 also prepares revised measurement items based on past measurement results corresponding to the obtained patient ID. The sample analyzer 1 replaces the measurement items of the work list with the revised measurement items when the revised measurement items satisfy predetermined conditions, and measures and analyzes the sample according to the replacement measurement items.
    Type: Application
    Filed: March 5, 2013
    Publication date: October 3, 2013
    Applicant: SYSMEX CORPORATION
    Inventors: Takuma KATOU, Daigo FUKUMA, Yuichi HAMADA