Patents by Inventor Takuma Niizaka
Takuma Niizaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11821851Abstract: In an X-ray imaging apparatus, an image processor is configured to generate a super-resolved image having higher resolution in an X direction than a first fluoroscopic X-ray image and a second fluoroscopic X-ray image by dividing, in the X direction, a pixel value of a first pixel in the first fluoroscopic X-ray image based on pixel values of two pixels in the second fluoroscopic X-ray image that overlap the first pixel when the first fluoroscopic X-ray image and the second fluoroscopic X-ray image are shifted in the X direction by an amount corresponding to a movement amount (of an X-ray detection position) and displayed in an overlapping manner.Type: GrantFiled: December 20, 2018Date of Patent: November 21, 2023Assignee: Shimadzu CorporationInventor: Takuma Niizaka
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Patent number: 11706379Abstract: In an X-ray imaging apparatus (100), an image processor (5b) is configured to apply a super-resolution process to a first region (A1) in each of acquired images (Ia), the first region including a subject (S), and to increase a number of pixels according to an increase in resolution in the first region by application of the super-resolution process thereto by a simpler process than the super-resolution process with respect to a second region (A2) other than the first region in each of the acquired images.Type: GrantFiled: March 14, 2019Date of Patent: July 18, 2023Assignee: Shimadzu CorporationInventors: Daisuke Harada, Takuma Niizaka
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Publication number: 20220166942Abstract: In an X-ray imaging apparatus (100), an image processor (5b) is configured to apply a super-resolution process to a first region (A1) in each of acquired images (Ia), the first region including a subject (S), and to increase a number of pixels according to an increase in resolution in the first region by application of the super-resolution process thereto by a simpler process than the super-resolution process with respect to a second region (A2) other than the first region in each of the acquired images.Type: ApplicationFiled: March 14, 2019Publication date: May 26, 2022Inventors: Daisuke HARADA, Takuma NIIZAKA
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Publication number: 20220057340Abstract: In an X-ray imaging apparatus, an image processor is configured to generate a super-resolved image having higher resolution in an X direction than a first fluoroscopic X-ray image and a second fluoroscopic X-ray image by dividing, in the X direction, a pixel value of a first pixel in the first fluoroscopic X-ray image based on pixel values of two pixels in the second fluoroscopic X-ray image that overlap the first pixel when the first fluoroscopic X-ray image and the second fluoroscopic X-ray image are shifted in the X direction by an amount corresponding to a movement amount (of an X-ray detection position) and displayed in an overlapping mannerType: ApplicationFiled: December 20, 2018Publication date: February 24, 2022Applicant: Shimadzu CorporationInventor: Takuma NIIZAKA
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Patent number: 11002690Abstract: Between an X-ray source and a rotating stage 13, a marker member including a flat plate 21 formed with markers M and a support part 22 supporting the flat plate 21 is arranged. The formation positions of the markers M on the flat plate 21 are set to positions that allow the distance between the markers M to be most separated in an area in which both of the markers M are not superimposed on a projection image of a subject within the detection range of an X-ray detector 12 and that is constantly included within the detection range even when an X-ray focal point is moved. Also, the length of the support part 22 is adjusted to a length resulting in a side end of the detection range of the X-ray detector where the flat plate 21 and the markers M are not superimposed on the subject W on a projection image.Type: GrantFiled: July 3, 2017Date of Patent: May 11, 2021Assignee: Shimadzu CorporationInventors: Takuma Niizaka, Yasuyuki Keyaki
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Publication number: 20200124545Abstract: Between an X-ray source and a rotating stage 13, a marker member including a flat plate 21 formed with markers M and a support part 22 supporting the flat plate 21 is arranged. The formation positions of the markers M on the flat plate 21 are set to positions that allow the distance between the markers M to be most separated in an area in which both of the markers M are not superimposed on a projection image of a subject within the detection range of an X-ray detector 12 and that is constantly included within the detection range even when an X-ray focal point is moved. Also, the length of the support part 22 is adjusted to a length resulting in a side end of the detection range of the X-ray detector where the flat plate 21 and the markers M are not superimposed on the subject W on a projection image.Type: ApplicationFiled: July 3, 2017Publication date: April 23, 2020Inventors: Takuma NIIZAKA, Yasuyuki KEYAKI
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Patent number: 9336598Abstract: An unknown surface shape of a physical object can be extracted with good precision. Image data of a projective image that has been acquired by radiation projection to an object is acquired. Next, a predetermined mesh structure is used to acquire cross-sectional images of the subject from image data of the projective images by reconstruction using tomography. Lattice points constituting the mesh structure are then moved in conformity with the surface shape of the object, based on the cross-sectional image that has been acquired by reconstruction. Reconstruction is carried out again using the mesh whose lattice point positions have been corrected. Movement on the reconstruction of the lattice points is then repeated as many times as required.Type: GrantFiled: February 28, 2012Date of Patent: May 10, 2016Assignee: The University of TokyoInventors: Yutaka Ohtake, Hiromasa Suzuki, Takuma Niizaka, Daiki Yamanaka
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Publication number: 20140169651Abstract: An unknown surface shape of a physical object can be extracted with good precision. Image data of a projective image that has been acquired by radiation projection to an object is acquired. Next, a predetermined mesh structure is used to acquire cross-sectional images of the subject from image data of the projective images by reconstruction using tomography. Lattice points constituting the mesh structure are then moved in conformity with the surface shape of the object, based on the cross-sectional image that has been acquired by reconstruction. Reconstruction is carried out again using the mesh whose lattice point positions have been corrected. Movement on the reconstruction of the lattice points is then repeated as many times as required.Type: ApplicationFiled: February 28, 2012Publication date: June 19, 2014Applicant: The University of TokyoInventors: Yutaka Ohtake, Hiromasa Suzuki, Takuma Niizaka, Daiki Yamanaka