Patents by Inventor Takuma Niizaka

Takuma Niizaka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11821851
    Abstract: In an X-ray imaging apparatus, an image processor is configured to generate a super-resolved image having higher resolution in an X direction than a first fluoroscopic X-ray image and a second fluoroscopic X-ray image by dividing, in the X direction, a pixel value of a first pixel in the first fluoroscopic X-ray image based on pixel values of two pixels in the second fluoroscopic X-ray image that overlap the first pixel when the first fluoroscopic X-ray image and the second fluoroscopic X-ray image are shifted in the X direction by an amount corresponding to a movement amount (of an X-ray detection position) and displayed in an overlapping manner.
    Type: Grant
    Filed: December 20, 2018
    Date of Patent: November 21, 2023
    Assignee: Shimadzu Corporation
    Inventor: Takuma Niizaka
  • Patent number: 11706379
    Abstract: In an X-ray imaging apparatus (100), an image processor (5b) is configured to apply a super-resolution process to a first region (A1) in each of acquired images (Ia), the first region including a subject (S), and to increase a number of pixels according to an increase in resolution in the first region by application of the super-resolution process thereto by a simpler process than the super-resolution process with respect to a second region (A2) other than the first region in each of the acquired images.
    Type: Grant
    Filed: March 14, 2019
    Date of Patent: July 18, 2023
    Assignee: Shimadzu Corporation
    Inventors: Daisuke Harada, Takuma Niizaka
  • Publication number: 20220166942
    Abstract: In an X-ray imaging apparatus (100), an image processor (5b) is configured to apply a super-resolution process to a first region (A1) in each of acquired images (Ia), the first region including a subject (S), and to increase a number of pixels according to an increase in resolution in the first region by application of the super-resolution process thereto by a simpler process than the super-resolution process with respect to a second region (A2) other than the first region in each of the acquired images.
    Type: Application
    Filed: March 14, 2019
    Publication date: May 26, 2022
    Inventors: Daisuke HARADA, Takuma NIIZAKA
  • Publication number: 20220057340
    Abstract: In an X-ray imaging apparatus, an image processor is configured to generate a super-resolved image having higher resolution in an X direction than a first fluoroscopic X-ray image and a second fluoroscopic X-ray image by dividing, in the X direction, a pixel value of a first pixel in the first fluoroscopic X-ray image based on pixel values of two pixels in the second fluoroscopic X-ray image that overlap the first pixel when the first fluoroscopic X-ray image and the second fluoroscopic X-ray image are shifted in the X direction by an amount corresponding to a movement amount (of an X-ray detection position) and displayed in an overlapping manner
    Type: Application
    Filed: December 20, 2018
    Publication date: February 24, 2022
    Applicant: Shimadzu Corporation
    Inventor: Takuma NIIZAKA
  • Patent number: 11002690
    Abstract: Between an X-ray source and a rotating stage 13, a marker member including a flat plate 21 formed with markers M and a support part 22 supporting the flat plate 21 is arranged. The formation positions of the markers M on the flat plate 21 are set to positions that allow the distance between the markers M to be most separated in an area in which both of the markers M are not superimposed on a projection image of a subject within the detection range of an X-ray detector 12 and that is constantly included within the detection range even when an X-ray focal point is moved. Also, the length of the support part 22 is adjusted to a length resulting in a side end of the detection range of the X-ray detector where the flat plate 21 and the markers M are not superimposed on the subject W on a projection image.
    Type: Grant
    Filed: July 3, 2017
    Date of Patent: May 11, 2021
    Assignee: Shimadzu Corporation
    Inventors: Takuma Niizaka, Yasuyuki Keyaki
  • Publication number: 20200124545
    Abstract: Between an X-ray source and a rotating stage 13, a marker member including a flat plate 21 formed with markers M and a support part 22 supporting the flat plate 21 is arranged. The formation positions of the markers M on the flat plate 21 are set to positions that allow the distance between the markers M to be most separated in an area in which both of the markers M are not superimposed on a projection image of a subject within the detection range of an X-ray detector 12 and that is constantly included within the detection range even when an X-ray focal point is moved. Also, the length of the support part 22 is adjusted to a length resulting in a side end of the detection range of the X-ray detector where the flat plate 21 and the markers M are not superimposed on the subject W on a projection image.
    Type: Application
    Filed: July 3, 2017
    Publication date: April 23, 2020
    Inventors: Takuma NIIZAKA, Yasuyuki KEYAKI
  • Patent number: 9336598
    Abstract: An unknown surface shape of a physical object can be extracted with good precision. Image data of a projective image that has been acquired by radiation projection to an object is acquired. Next, a predetermined mesh structure is used to acquire cross-sectional images of the subject from image data of the projective images by reconstruction using tomography. Lattice points constituting the mesh structure are then moved in conformity with the surface shape of the object, based on the cross-sectional image that has been acquired by reconstruction. Reconstruction is carried out again using the mesh whose lattice point positions have been corrected. Movement on the reconstruction of the lattice points is then repeated as many times as required.
    Type: Grant
    Filed: February 28, 2012
    Date of Patent: May 10, 2016
    Assignee: The University of Tokyo
    Inventors: Yutaka Ohtake, Hiromasa Suzuki, Takuma Niizaka, Daiki Yamanaka
  • Publication number: 20140169651
    Abstract: An unknown surface shape of a physical object can be extracted with good precision. Image data of a projective image that has been acquired by radiation projection to an object is acquired. Next, a predetermined mesh structure is used to acquire cross-sectional images of the subject from image data of the projective images by reconstruction using tomography. Lattice points constituting the mesh structure are then moved in conformity with the surface shape of the object, based on the cross-sectional image that has been acquired by reconstruction. Reconstruction is carried out again using the mesh whose lattice point positions have been corrected. Movement on the reconstruction of the lattice points is then repeated as many times as required.
    Type: Application
    Filed: February 28, 2012
    Publication date: June 19, 2014
    Applicant: The University of Tokyo
    Inventors: Yutaka Ohtake, Hiromasa Suzuki, Takuma Niizaka, Daiki Yamanaka