Patents by Inventor Takuro MORIYAMA
Takuro MORIYAMA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20230138268Abstract: A control system includes at least one processor and at least one memory. The at least one processor is configured to determine operation data by repeating a process of calculating control target data indicating a predicted value of a control target in a plant and the operation data indicating an operation value of a control device of the plant by a given calculation model based on observation data indicating an actual value of the plant.Type: ApplicationFiled: October 26, 2022Publication date: May 4, 2023Applicants: ENEOS Corporation, Preferred Networks, Inc.Inventors: Taichiro HIRAI, Kosei KANUMA, Hiroyuki HINO, Yu YOSHIMURA, Kazuki UEHARA, Akira KINOSHITA, Masahiro SAKAI, Keigo KAWAMURA, Kaizaburo KIDO, Keisuke YAHATA, Keisuke NAKATA, Yo IIDA, Takuro MORIYAMA, Masashi YOSHIKAWA, Tsutomu OGASAWARA
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Patent number: 11410059Abstract: A bias estimation apparatus according to an embodiment estimates a bias included in a measured values by each sensor. The bias estimation apparatus includes a reference model builder, a temporary bias generator, a corrected measured value calculator, a similarity calculator, a similarity selector, a score calculator, and an estimated bias determiner. The reference model builder builds a reference model of the measured value packs. The temporary bias generator generates a temporary bias pack. The corrected measured value calculator calculates corrected measured value packs. The similarity calculator calculates a similarity of each corrected measured value pack. The similarity selector selects a part of the similarities according to their values from among the similarities. The score calculator calculates a score based on the selected similarities. The estimated bias determiner determines an estimated bias which is an estimated value of the bias based on the score.Type: GrantFiled: January 31, 2017Date of Patent: August 9, 2022Assignee: KABUSHIKI KAISHA TOSHIBAInventors: Takuro Moriyama, Hideyuki Aisu, Hisaaki Hatano, Kenichi Fujiwara
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Patent number: 11132616Abstract: A characteristic value estimation device has a sensor data input unit to input sensor data detected by one or more sensors, a model input unit to input a first calculation model, a model learning unit to perform learning on a second calculation model, a model switch to select any one of the first calculation model and the second calculation model, a predictive value calculation unit to calculate an error of the calculation model, a probability distribution correction unit to correct the probability distribution of the uncertain parameter, a virtual sensor value estimation unit to estimate sensor data of a virtual sensor arranged virtually, a characteristic value distribution estimation unit to estimate a detailed distribution of the characteristic value, the sensor data of the virtual sensor, and the sensor data of the sensor, and a reliability calculation unit to calculate a reliability of the precise characteristic value distribution.Type: GrantFiled: March 17, 2017Date of Patent: September 28, 2021Assignee: KABUSHIKI KAISHA TOSHIBAInventors: Mikito Iwamasa, Takuro Moriyama, Tomoshi Otsuki
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Patent number: 11126519Abstract: According to one embodiment, a monitoring device includes a variable selector and an anomaly detector. The variable selector is configured to select context variables which indicate conditions when content variables were obtained based on values of the content variables and values of the context variables included in base data, and values of the content variables and values of the context variables included in target data. The anomaly detector is configured to detect anomalies in the target data using the context variables which were selected by the variable selector.Type: GrantFiled: September 12, 2018Date of Patent: September 21, 2021Assignee: KABUSHIKI KAISHA TOSHIBAInventors: Takuro Moriyama, Gaku Ishii
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Patent number: 11118947Abstract: According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration unit is configured to estimate the degree of drift anomaly accumulated within the monitored period based on the estimated degrees of drift anomaly accumulated within the sub-periods. Symptoms of a drift anomaly include mismatches between the actual values and measured values.Type: GrantFiled: January 3, 2019Date of Patent: September 14, 2021Assignee: KABUSHIKl KAISHA TOSHIBAInventors: Takuro Moriyama, Gaku Ishii
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Patent number: 10837809Abstract: According to one embodiment, a sensor failure diagnosis device includes a drift estimator and a global rank determiner. The drift estimator estimates, based on data on measured values from sensors contained in a plurality of sensor groups including a sensor under inspection, whether or not drift failure that is steady deviation of a measured value from a true value has occurred in the sensor under inspection or a degree of the drift failure. The global rank determiner determines global ranks that are priorities of the plurality of sensor groups in the inspection based on a plurality of estimated results by the drift estimator.Type: GrantFiled: February 28, 2018Date of Patent: November 17, 2020Assignee: Kabushiki Kaisha ToshibaInventors: Takuro Moriyama, Hideyuki Aisu, Hisaaki Hatano
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Publication number: 20190205234Abstract: According to one embodiment, a monitoring device includes a variable selector and an anomaly detector. The variable selector is configured to select context variables which indicate conditions when content variables were obtained based on values of the content variables and values of the context variables included in base data, and values of the content variables and values of the context variables included in target data. The anomaly detector is configured to detect anomalies in the target data using the context variables which were selected by the variable selector.Type: ApplicationFiled: September 12, 2018Publication date: July 4, 2019Applicant: Kabushiki Kaisha ToshibaInventors: Takuro MORIYAMA, Gaku ISHII
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Publication number: 20190204124Abstract: According to one embodiment, an information processing device includes an anomaly detector and an integration unit. The anomaly detector is configured to estimate a degree of drift anomaly based on measured values of a sensor during a sub-period which is a part of a monitored period. The integration unit is configured to estimate the degree of drift anomaly accumulated within the monitored period based on the estimated degrees of drift anomaly accumulated within the sub-periods. Symptoms of a drift anomaly include mismatches between the actual values and measured values.Type: ApplicationFiled: January 3, 2019Publication date: July 4, 2019Applicant: Kabushiki Kaish·a ToshibaInventors: Takuro MORIYAMA, Gaku ISHII
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Publication number: 20180188083Abstract: According to one embodiment, a sensor failure diagnosis device includes a drift estimator and a global rank determiner. The drift estimator estimates, based on data on measured values from sensors contained in a plurality of sensor groups including a sensor under inspection, whether or not drift failure that is steady deviation of a measured value from a true value has occurred in the sensor under inspection or a degree of the drift failure. The global rank determiner determines global ranks that are priorities of the plurality of sensor groups in the inspection based on a plurality of estimated results by the drift estimator.Type: ApplicationFiled: February 28, 2018Publication date: July 5, 2018Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Takuro MORIYAMA, Hideyuki AISU, Hisaaki HATANO
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Publication number: 20180082204Abstract: A characteristic value estimation device has a sensor data input unit to input sensor data detected by one or more sensors, a model input unit to input a first calculation model, a model learning unit to perform learning on a second calculation model, a model switch to select any one of the first calculation model and the second calculation model, a predictive value calculation unit to calculate an error of the calculation model, a probability distribution correction unit to correct the probability distribution of the uncertain parameter, a virtual sensor value estimation unit to estimate sensor data of a virtual sensor arranged virtually, a characteristic value distribution estimation unit to estimate a detailed distribution of the characteristic value, the sensor data of the virtual sensor, and the sensor data of the sensor, and a reliability calculation unit to calculate a reliability of the precise characteristic value distribution.Type: ApplicationFiled: March 17, 2017Publication date: March 22, 2018Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Mikito IWAMASA, Takuro MORIYAMA, Tomoshi OTSUKI
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Publication number: 20170140287Abstract: A bias estimation apparatus according to an embodiment estimates a bias included in a measured values by each sensor. The bias estimation apparatus includes a reference model builder, a temporary bias generator, a corrected measured value calculator, a similarity calculator, a similarity selector, a score calculator, and an estimated bias determiner. The reference model builder builds a reference model of the measured value packs. The temporary bias generator generates a temporary bias pack. The corrected measured value calculator calculates corrected measured value packs. The similarity calculator calculates a similarity of each corrected measured value pack. The similarity selector selects a part of the similarities according to their values from among the similarities. The score calculator calculates a score based on the selected similarities. The estimated bias determiner determines an estimated bias which is an estimated value of the bias based on the score.Type: ApplicationFiled: January 31, 2017Publication date: May 18, 2017Applicant: KABUSHIKI KAISHA TOSHIBAInventors: Takuro MORIYAMA, Hideyuki AISU, Hisaaki HATANO, Kenichi FUJIWARA