Abstract: Problem Provided is an electrolyte analyzer that allows reducing a load of a user in a replacement work compared with conventional one. Solution An electrolyte analyzer includes an ISE electrode 1 that includes at least one electrode, a reference electrode 2 that includes at least one electrode different from the ISE electrode 1, and a housing 200 that houses the electrodes of the ISE electrode 1 and the reference electrode 2. The housing 200 includes a pressing unit that presses the electrodes to one another, a first press switching unit 210 that switches the ISE electrode 1 between a secured state and a released state, and a second press switching unit 215 that switches the reference electrode 2 between a secured state and a released state. The ISE electrode 1 and the reference electrode 2 are each switched between the secured state and the released state. Selected Drawing: FIG.

Abstract: A sample holder and ion-beam processing system are offered which permit a good sample adapted for observation (such as TEM (transmission electron microscopy) observation). The sample holder has a sample placement portion having a sample adhering surface. The holder further includes a shielding material guide portion placed over the sample placement portion. The guide portion is fixedly mounted to the sample placement portion and has a shielding material guide surface. The sample adhering surface is in a position lower than the position of the shielding material guide surface by a given amount of 40 ?m. Therefore, when the sample having a thickness of 100 ?m is attached to the sample adhering surface, the sample protrudes 60 ?m ahead of the shielding material guide surface. The shielding material having a thickness of about 20 ?m is then placed in position over the shielding material guide surface.

Abstract: An ion source in which some of positive ions produced in the ionization chamber are accelerated toward a cathode and collide against a nonmagnetic member causing sputtering. Since the sputtered particles are not magnetic in nature, the particles uniformly deposit on the anode without being affected by the magnetic field produced in the ionization chamber.

Abstract: A sample holder and ion-beam processing system are offered which permit a good sample adapted for observation (such as TEM (transmission electron microscopy) observation). The sample holder has a sample placement portion having a sample adhering surface. The holder further includes a shielding material guide portion placed over the sample placement portion. The guide portion is fixedly mounted to the sample placement portion and has a shielding material guide surface. The sample adhering surface is in a position lower than the position of the shielding material guide surface by a given amount of 40 ?m. Therefore, when the sample having a thickness of 100 ?m is attached to the sample adhering surface, the sample protrudes 60 ?m ahead of the shielding material guide surface. The shielding material having a thickness of about 20 ?m is then placed in position over the shielding material guide surface.