Abstract: A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive member is formed with a plurality of first through holes having a first common diameter and communicating the first face with the second face. A first contact probe is provided with a first tubular body having a second diameter which is smaller than the first diameter, and a first plunger retractably projected from one end of the first tubular body. A second contact probe is provided with a second tubular body having a third diameter which is smaller than the second diameter, and a second plunger retractably projected from one end of the second tubular body.

Abstract: A conductive member has a first face adapted to be mounted on a board on which an inspection circuit is arranged and a second face adapted to be opposed to a device to be inspected. The conductive member being formed with a first through hole having a first diameter and communicating the first face with the second face. A contact probe is provided with a tubular body having a second diameter which is smaller than the first diameter, and a plunger retractably projected from one end of the tubular body. A first retainer is formed with a second through hole and opposing at least the second face of the conductive member so as to communicate the first through hole with the second through hole, so that the contact probe is retained in the conductive member while only the plunger is projected from one end of the second through hole. A second retainer is adapted to retain the one end of the tubular body concentrically with the first through hole.

Abstract: An IC socket receives an IC provided with arrayed terminals. In the IC socket, a conductive block is formed with a first face opposing to the received IC, and a plurality of holes arrayed in association with the terminals of the received IC. Each of a plurality of contact probes is disposed in each of the holes, and is provided with a conductive pipe, and a conductive plunger, retractably provided at a first end of the pipe, the plunger being to be brought into contact with an associated one of the terminals. A retainer provided with an insulative member through which the pipe is coaxially held within an associated one of the holes while forming a gap between an outer periphery of the pipe and an interior wall of the associated one of the holes. At least one of the contact probes to be brought into contact with an RF signal terminal among the terminals of the received IC is retained by the retainer.

Abstract: A plurality of probes such as a signal probe (3) and a power supply probe (4) are provided into a metal block (1) so as to penetrate. Each of the probes has a movable pin (11). A tip of the movable pin is projecting from one surface of the metal block (1). And a projection length of the tip is variable. A DUT 20 is pressed onto the surface of the metal block (1) to contact between electrode terminals (21 to 24) and tips of the probes to test characteristics of the DUT. At least one of the probes is capacity loaded probe having a capacitor by providing a dielectric layer and a metal film to peripheral of the probe. As a result, noise can be removed reliably. Additionally, when the capacity loaded probe is used as the power supply probe, a voltage drop is reduced at the power supply terminal in a case of change of the output.

Abstract: A conductive block is formed with a first face, a second face and a through hole connecting the first face and the second face. A contact probe is provided with a conductive pipe and a conductive plunger, retractably provided in at a first end of the pipe, the plunger being to be brought into contact with a device to be inspected. A first retainer includes a first insulative member through which the first end of the pipe is retained in the vicinity of the first face of the block, such that the pipe is coaxially held within the through hole while forming a gap between an outer periphery of the pipe and an interior wall of the through hole.

Abstract: An IC socket receives an IC provided with arrayed terminals. In the IC socket, a conductive block is formed with a first face opposing to the received IC, and a plurality of holes arrayed in association with the terminals of the received IC. Each of a plurality of contact probes is disposed in each of the holes, and is provided with a conductive pipe, and a conductive plunger, retractably provided at a first end of the pipe, the plunger being to be brought into contact with an associated one of the terminals. A retainer provided with an insulative member through which the pipe is coaxially held within an associated one of the holes while forming a gap between an outer periphery of the pipe and an interior wall of the associated one of the holes. At least one of the contact probes to be brought into contact with an RF signal terminal among the terminals of the received IC is retained by the retainer.