Patents by Inventor Takuya Hisaizumi

Takuya Hisaizumi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20120221586
    Abstract: An inspection system is provided that can efficiently perform the management of data obtained from a plurality of apparatuses. An inspection system includes inspection apparatuses to inspect products that are produced in a factory, and a management server that is connected via a communication line to the inspection apparatuses. The inspection apparatus includes an apparatus-side inspection result DB (database) 14a. The apparatus-side inspection result DB stores the inspection result data, which is data representing the result of inspecting a substrate with the inspection apparatus 11a. The apparatus-side inspection result DB is a key-value database that is constituted by keys and values.
    Type: Application
    Filed: October 25, 2011
    Publication date: August 30, 2012
    Applicant: OMRON CORPORATION
    Inventors: Akihiro Kawata, Tsuyoshi Sato, Takuya Hisaizumi