Patents by Inventor Takuya Ido

Takuya Ido has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20110019183
    Abstract: Provided is an optical analyzer which can promote enhancement of measurement sensitivity, cost reduction, size reduction, structural flexibility, disturbance resistance, and the like, at the same time. A laser device to be used in such optical analyzer is also provided. An optical analyzer comprises a laser light source (2); a wavelength selection element (3) for selecting and leading out light having a wavelength substantially equal to the absorption wavelength of an analysis object from among light outputted from the laser light source (2); an optical detection means (5) for detecting the intensity of light red out from the wavelength selection element (3); and a drive current control means (6) for increasing or decreasing the drive current of the laser light source (2) near a specified current value thereof for outputting light of the absorption wavelength, and setting the drive current at such a current value as the intensity of light detected by the optical detection means (5) has a peak value.
    Type: Application
    Filed: March 27, 2009
    Publication date: January 27, 2011
    Applicant: HORIBA, LTD.
    Inventors: Juichiro Ukon, Takuya Ido, Susumu Mimura
  • Publication number: 20100242573
    Abstract: The measurement sensitivity is improved by suppressing the surrounding temperature influence as much as possible, while realizing scale reduction, and by enlarging the detection signal, while reducing the production errors in enclosing a reference gas. Provided is a thermal conductivity sensor that detects thermal conductivity of a sample gas by using a Wheatstone Bridge circuit constructed in such a manner that measurement resistors that are brought into contact with the sample gas are disposed on a first side, and reference resistors that are brought into contact with a reference gas are disposed on a second side, and comparing the potential difference between connection points of the reference resistors and the measurement resistors. The measurement resistors disposed on the first side are assembled in one measurement space, and the reference resistors disposed on the second side are assembled in one reference space.
    Type: Application
    Filed: March 18, 2010
    Publication date: September 30, 2010
    Applicant: HORIBA LTD.
    Inventors: Makoto Matsuhama, Tomoko Seko, Shuji Takada, Hiroshi Mizutani, Takuji Oida, Masahiko Endo, Takuya Ido