Patents by Inventor Takuya Kera

Takuya Kera has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor memory device, test circuit and test method
    Patent number: 7652943
    Abstract: Disclosed is a semiconductor memory device having memory cells that are in need of refresh for data retention, includes control circuits for necessarily generating the refresh immediately before the read/write operation, and for setting the latency to a first fixed value at all times, for the first mode during the testing, and for necessarily generating the refresh immediately after the read/write operation, and for setting the latency to a second fixed value at all times, for the second mode during the testing.
    Type: Grant
    Filed: August 17, 2005
    Date of Patent: January 26, 2010
    Assignee: NEC Electronics Corporation
    Inventors: Hiroyuki Takahashi, Atsushi Nakagawa, Takuya Kera, Masaki Miyata, Yasunari Kawaguchi, Kouichi Gotou
  • Semiconductor memory device, test circuit and test method
    Publication number: 20060039220
    Abstract: Disclosed is a semiconductor memory device having memory cells that are in need of refresh for data retention, includes control circuits for necessarily generating the refresh immediately before the read/write operation, and for setting the latency to a first fixed value at all times, for the first mode during the testing, and for necessarily generating the refresh immediately after the read/write operation, and for setting the latency to a second fixed value at all times, for the second mode during the testing.
    Type: Application
    Filed: August 17, 2005
    Publication date: February 23, 2006
    Inventors: Hiroyuki Takahashi, Atsushi Nakagawa, Takuya Kera, Masaki Miyata, Yasunari Kawaguchi, Kouichi Gotou