Abstract: A system for testing a high speed integrated circuit includes a test device having a test clock with a first maximum frequency for performing level sensitive scan design (LSSD) testing of the integrated circuit device under test, a frequency multiplier circuit for multiplying the test clock signal to a higher second frequency capable of operating the device under test, and a finite state machine for generating a first internal clock for testing the device under test. In a practical embodiment, the internal clock speed may be running at a frequency many multiples of the test clock.

Abstract: A test apparatus and method for design verification of at least one microprocessor chip includes a compatible Joint Task Action Group (JTAG) terminal for access to a plurality of computer functional units contained in the chip. A test input terminal included in the JTAG terminal receives a scan string, the string being coupled to each computer functional unit through a first multiplexer. The scan input string is separated by the JTAG terminal under program control into a series of dedicated scan strings, each dedicated scan string being supplied to a selected functional unit through the first multiplexer. Each functional unit includes start and stop scan clocks for testing the functional under program control using the dedicated scan train for the functional unit. A test output terminal included in the JTAG terminal is coupled to each functional unit through a second multiplexer.

Abstract: A high performance register that can be used as a pipelined register in logic chips that are designed using a pulsed logic methodology is described. The register features minimal setup time, pulse catching and pulse launching. The register circuitry complies with and implements a circuit-level test methodology for pulsed logic that features the ability to inhibit the reset of pulses, to force resets and to operate the circuits in a pseudo static mode. The register also complies with the level sensitive scan design (LSSD) methodology. Also described is a state-holding static master-slave register that complies with a pulsed logic design methodology, the register exhibiting an automatic power reduction feature and a simplified modular register bit design which can easily be adapted to either static domino or pulsed logic. The register is also LSSD compliant. Also described is the means and method for allowing static transmission gate input registers to comply with the static evaluate test mode.

Abstract: A pulsed logic circuit test methodology and circuitry therefor are disclosed. The methodology and circuitry allow the inhibiting of reset pulses, the ability to force resets and the ability to test the circuit in a pseudo-static mode of operation.