Patents by Inventor Tamizo Matsuura

Tamizo Matsuura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4981804
    Abstract: A method and apparatus for determining, by use of ion chromatography, a microconstituent contained in a major constituent as impurities present in the major constituent. The invention causes only that portion of the effluent from the detector, shown on an ion chromatograph, that corresponds to the neighborhood of the microconstituent to be led again to the collecting valve. Thus, the microconstituent of the solution can be determined quickly and easily, without reference to the kind of microconstituent being tested.
    Type: Grant
    Filed: February 14, 1990
    Date of Patent: January 1, 1991
    Assignee: Yokogawa Electric Corporation
    Inventors: Yuzuru Hanaoka, Takeshi Murayama, Tamizo Matsuura
  • Patent number: 4952126
    Abstract: A method and apparatus for determining, by use of ion chromatography, a microconstituent contained in a major constituent as impurities present in the major constituent. The invention causes only that portion of the effluent from the detector, shown on an ion chromatograph, that corresponds to the neighborhood of the microconstituent to be led again to the collecting valve. Thus, the microconstituent of the solution can be determined quickly and easily, without reference to the kind of microconstituent being tested.
    Type: Grant
    Filed: April 10, 1985
    Date of Patent: August 28, 1990
    Assignee: Yokogawa Electric Corporation
    Inventors: Yuzuru Hanaoka, Takeshi Murayama, Tamizo Matsuura
  • Patent number: 4584276
    Abstract: Method and apparatus for analysis, by ion chromatography, of anions, in a sample solution, wherein accurate analysis of anions in the sample solution is obtained by passing carbonic acid, through a prescribed membrane, into the sample solution, thereby completely eliminating or sharply lessening the so-called water dip effect. The method and apparatus are further directed to enabling anions in the sample solution to be accurately analyzed by passing prescribed cations, through a prescribed membrane, into the sample solution, thereby depriving the sample solution of interfering anions otherwise abundantly present therein.
    Type: Grant
    Filed: February 15, 1985
    Date of Patent: April 22, 1986
    Assignee: Yokogawa Hokushin Electric Corporation
    Inventors: Yuzuru Hanaoka, Takeshi Murayama, Setsuo Muramoto, Tamizo Matsuura
  • Patent number: 4533518
    Abstract: Method and apparatus for analysis, by ion chromatography, of anions, in a sample solution, wherein accurate analysis of anions in the sample solution is obtained by passing carbonic acid, through a prescribed membrane, into the sample solution, thereby completely eliminating or sharply lessening the so-called water dip effect. The method and apparatus are further directed to enabling anions in the sample solution to be accurately analyzed by passing prescribed cations, through a prescribed membrane, into the sample solution, thereby depriving the sample solution of interfering anions otherwise abundantly present therein.
    Type: Grant
    Filed: June 7, 1982
    Date of Patent: August 6, 1985
    Assignee: Kokogawa Hokushin Electric Corporation
    Inventors: Yuzuru Hanaoka, Takeshi Murayama, Setsuo Muramoto, Tamizo Matsuura
  • Patent number: 4194118
    Abstract: A metallic block has a conical measuring-light inlet port and a conical reference-light inlet port formed therein. The ports intersect at a light sensor. The inlet ports are closed by respective multilayer interference filters. Temperature control means, which may be responsive to the light sensor output, maintains the metallic block, and thus the filters and sensor, at a fixed temperature.
    Type: Grant
    Filed: March 20, 1978
    Date of Patent: March 18, 1980
    Assignee: Yokogawa Electric Works, Ltd.
    Inventors: Mitsuo Kotaka, Hirotoshi Ishikawa, Kaisuke Muraki, Ryo Takahashi, Tamizo Matsuura
  • Patent number: 4157470
    Abstract: To detect the density of a measurement component of a sample gas, infrared light is directed alternately through a measuring-light optical system and a reference-light optical system to a heated light sensor. The measuring-light optical system includes a sample cell, a first filter for transmitting infrared rays of a fixed wave-length band, and a temperature compensating cell having a gas which has a part of its absorption wave-length band within the transmission wave-length band of the first filter but has a spectrum different from the spectrum of the measurement component. The reference-light optical system includes a light throttle, an interference cell having a gas containing a fixed density of the measurement component, an adjustable-length interference compensating cell filled with the sample gas, and a second filter for transmitting rays of a wave-length band that includes the major part of the transmission wave-length band of the first filter.
    Type: Grant
    Filed: March 20, 1978
    Date of Patent: June 5, 1979
    Assignee: Yokogawa Electric Works, Ltd.
    Inventors: Mitsuo Kotaka, Hisao Takahara, Kaisuke Muraki, Ryo Takahashi, Tamizo Matsuura