Abstract: Provided is a bending angle calculation method capable of saving a worker time and effort. The bending angle calculation method includes: an image capturing step (S1) of capturing an image of a pipe in which a first pipe and a second pipe are joined together by a joint; a derivation step (S3) of deriving, from the image, a laying direction straight line corresponding to a laying direction of the pipe; and a calculation step (S4) of calculating, as a bending angle at the joint, a crossing angle between a laying direction straight line of the first pipe and a laying direction straight line of the second pipe.

Abstract: Provided is a bending angle calculation method capable of saving a worker time and effort. The bending angle calculation method includes: an image capturing step (S1) of capturing an image of a pipe in which a first pipe and a second pipe are joined together by a joint; a derivation step (S3) of deriving, from the image, a laying direction straight line corresponding to a laying direction of the pipe; and a calculation step (S4) of calculating, as a bending angle at the joint, a crossing angle between a laying direction straight line of the first pipe and a laying direction straight line of the second pipe.

Abstract: The present invention provides a light source device for emitting concentrated light, which is prepared by concentrating light emitted from a light source, including: the light source; a reflective box in which the light source is provided; a plurality of light guides having a circular column shape or a polygonal column shape and having two end surfaces being different in area; and light separating means, the reflective box having a plurality of openings, each opening being provided with one of the light guides in such a way that the end surface smaller in area faces the light source, and each light separating means being provided at a position between the adjacent ones of the openings. With this, a small-sized light source device for emitting light with high output and high directivity, and a simulated solar light irradiation device including the same are provided.

Abstract: The present invention provides a light source device for emitting concentrated light, which is prepared by concentrating light emitted from a light source, including: the light source; a reflective box in which the light source is provided; a plurality of light guides having a circular column shape or a polygonal column shape and having two end surfaces being different in area; and light separating means, the reflective box having a plurality of openings, each opening being provided with one of the light guides in such a way that the end surface smaller in area faces the light source, and each light separating means being provided at a position between the adjacent ones of the openings. With this, a small-sized light source device for emitting light with high output and high directivity, and a simulated solar light irradiation device including the same are provided.

Abstract: A simulated solar light irradiation device (30) includes (i) a light source section including a first light source (1) and a second light source (2), (ii) light selection means (7) for selecting and emitting (a) light, having shorter-wavelengths than a predetermined boundary wavelength, in first light irradiated by the first light source (1) and (b) light, having longer-wavelengths than the predetermined boundary wavelength, in second light irradiated by the second light source (2), and (iii) control means (5, 6) for controlling a directivity of the first light or a directivity of the second light so that the first light or the second light enters the light selection means (7) at a predetermined incident angle. In this way, it is possible to irradiate designed simulated solar light without increasing a size of the device.

Abstract: An undulation inspection device of the present invention includes: illumination means (line light source 2) that subjects, to illumination, an object to be inspected; light intensity acquisition means (area sensor 3) that acquires light intensity distribution of light that comes, in response to the illumination, from a surface of the object to be inspected; image capturing means (line sensor 4) that obtains only predetermined light out of light that comes from the surface of the object to be inspected; adjustment means (image processing section 20 and light source drive controlling section 21) that adjusts the illumination means (line light source 2), based on the light intensity distribution that is obtained from the light intensity acquisition means; and determination means (defect determination processing means 23) that determines a state of undulation that is formed on the surface of the object to be inspected, based on a result of capturing an image by the image capturing means after adjustment of the il

Abstract: The method of measuring a peripheral tilt angle in accordance with the present invention, to address the problems, is a method of measuring a peripheral tilt angle on an inspection object having surface mounds, the method including: the step A of projecting light onto the inspection object; the step B of sensing distribution of light reflected off the inspection object; the step C of obtaining a feature point of the distribution of the reflected light from result of the sensing of the distribution of the reflected light; and the step D of obtaining a peripheral tilt angle which is a tilt angle near a periphery of each of the surface mounds based on an angle of projection of the light in step A to a position which, on the inspection object, corresponds to the feature point and an angle of sensing of the reflected light in step B off a position which, on the inspection object, corresponds to the feature point.

Abstract: An inspection device of the present invention includes: a linear irregularity detecting section for detecting linear irregularities individually in an image L of dots on a substrate being inspected by projecting light from a first direction and in an image R of the dots by projecting light from a second direction, which differs from the first direction; a specific-cycle irregularity extracting section for extracting linear irregularities detected at predetermined intervals T in the individual mages L and R, the intervals being taken vertical to the linear irregularities on the substrate; and a detection-target-irregularity extracting section for extracting a linear irregularity detected in both the images L and R as a detection-target linear irregularity. The device therefore is capable of detecting only linear irregularities of a specific cycle which are caused by the presence of dots having irregular thickness when compared to a dot with normal thickness.