Patents by Inventor Tamoru Inoue

Tamoru Inoue has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150046688
    Abstract: A test instruction sequence generating method for a processor includes classifying registers used for executing test instructions into two register groups, generating a test instruction executed by the processor, amending a register specified in a result value register field of the test instruction to a register of a first register group when a first instruction is specified in an arithmetic type field of the test instruction and a register of a second register group is specified in the result value register field of the test instruction, and further amending a register specified in a input value register field of the test instruction to a register of the second register group when a second instruction is specified in the arithmetic type field of the test instruction and a register of the first register group is specified in the input value register field of the test instruction.
    Type: Application
    Filed: July 2, 2014
    Publication date: February 12, 2015
    Inventor: TAMORU INOUE
  • Publication number: 20130346813
    Abstract: A memory testing support method includes executing a procedure using a plurality of test patterns on a memory to be tested; recording an observation result of a current value flowing in the memory during the execution of the procedure using each of the test patterns into a storing section; and determining superiority or inferiority of the test patterns in terms of effectiveness of testing the memory based on the observation results of the test patterns recorded in the storing section.
    Type: Application
    Filed: August 27, 2013
    Publication date: December 26, 2013
    Applicant: FUJITSU LIMITED
    Inventor: Tamoru INOUE
  • Patent number: 8402316
    Abstract: A method of testing a computer, the method has designating a register as an input-only register having a setting of a value which does not cause an exception interruption with an execution of a specific type of instruction, generating a test instruction array having a plurality of instructions for a test, by assigning a register excluding the input-only register as an output destination of an execution result of each of the plurality of instructions, executing the plurality of instructions included in the generated test instruction array, and evaluating the execution results by the computer.
    Type: Grant
    Filed: April 13, 2011
    Date of Patent: March 19, 2013
    Assignee: Fujitsu Limited
    Inventors: Fumio Ichikawa, Tamoru Inoue
  • Publication number: 20110296147
    Abstract: A method of testing a computer, the method has designating a register as an input-only register having a setting of a value which does not cause an exception interruption with an execution of a specific type of instruction, generating a test instruction array having a plurality of instructions for a test, by assigning a register excluding the input-only register as an output destination of an execution result of each of the plurality of instructions, executing the plurality of instructions included in the generated test instruction array, and evaluating the execution results by the computer.
    Type: Application
    Filed: April 13, 2011
    Publication date: December 1, 2011
    Applicant: FUJITSU LIMITED
    Inventors: Fumio Ichikawa, Tamoru Inoue