Patents by Inventor Tamotsu Ashida

Tamotsu Ashida has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Dimension measuring apparatus and dimension measuring method
    Patent number: 7587840
    Abstract: A dimension measuring apparatus 1 which measures a dimension of a measurement subject 2 includes a conveying device 5 which convey the measurement subject 2, a temperature controlling device which control the temperature in a conveyance region 10, 11 to which the measurement subject 2 is conveyed, a dimension measuring device 15 which measure the dimension of the measurement subject 2 conveyed to a measurement portion 6 in the conveyance region 10, 11, and a temperature measuring device 14 which measure the temperature of the measurement subject 2 during dimension measurement by the dimension measuring device 15. The dimension of the measurement subject 2 measured by the dimension measuring device 15 is corrected to a dimension at a predetermined reference temperature using the temperature measured by the temperature measuring device 14.
    Type: Grant
    Filed: March 27, 2008
    Date of Patent: September 15, 2009
    Assignee: Kayaba Industry Co., Ltd.
    Inventors: Yoshito Sakai, Tamotsu Ashida
  • Dimension measuring apparatus and dimension measuring method
    Publication number: 20080235971
    Abstract: A dimension measuring apparatus 1 which measures a dimension of a measurement subject 2 includes a conveying device 5 which convey the measurement subject 2, a temperature controlling device which control the temperature in a conveyance region 10, 11 to which the measurement subject 2 is conveyed, a dimension measuring device 15 which measure the dimension of the measurement subject 2 conveyed to a measurement portion 6 in the conveyance region 10, 11, and a temperature measuring device 14 which measure the temperature of the measurement subject 2 during dimension measurement by the dimension measuring device 15. The dimension of the measurement subject 2 measured by the dimension measuring device 15 is corrected to a dimension at a predetermined reference temperature using the temperature measured by the temperature measuring device 14.
    Type: Application
    Filed: March 27, 2008
    Publication date: October 2, 2008
    Applicant: KAYABA INDUSTRY CO., LTD.
    Inventors: Yoshito Sakai, Tamotsu Ashida