Patents by Inventor Tamotsu Mitsutani

Tamotsu Mitsutani has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6869482
    Abstract: A slurry raw material is applied onto a carrier film 3 in a coating section 4, and a predetermined property related to the thickness of the slurry raw material is measured in a property-measuring section 5 in a wet mode before the slurry raw material is dried in a drying section 6. A processing sub-section 7a calculates an estimated value t of the thickness of a sheet from the target thickness of the sheet, a measurement of the slurry raw material property, and the slurry raw material density, to compare the estimated value t with the target value T of the sheet thickness. An adjusting output sub-section 7b transmits signals for adjusting the thickness to a thickness-adjusting device 9 on the basis of the above comparison result, to efficiently and precisely control the thickness of the slurry raw material applied onto the carrier film 3.
    Type: Grant
    Filed: June 23, 2003
    Date of Patent: March 22, 2005
    Assignee: Murata Manufacturing Co., Ltd.
    Inventors: Norio Mutsui, Tamotsu Mitsutani
  • Publication number: 20040149207
    Abstract: A slurry raw material is applied onto a carrier film 3 in a coating section 4, and a predetermined property related to the thickness of the slurry raw material is measured in a property-measuring section 5 in a wet mode before the slurry raw material is dried in a drying section 6. A processing sub-section 7a calculates an estimated value t of the thickness of a sheet from the target thickness of the sheet, a measurement of the slurry raw material property, and the slurry raw material density, to compare the estimated value t with the target value T of the sheet thickness. An adjusting output sub-section 7b transmits signals for adjusting the thickness to a thickness-adjusting means 9 on the basis of the above comparison result, to control the thickness of the slurry raw material applied onto the carrier film 3.
    Type: Application
    Filed: June 23, 2003
    Publication date: August 5, 2004
    Applicant: Murata Manufacturing Co., Ltd.
    Inventors: Norio Mutsui, Tamotsu Mitsutani