Abstract: A system for analyzing multiple images is provided, such as to locate defects in a test component. The system includes a first light source, such as one that emits blue light, and a second light source, such as one that emits red light. The system also includes a camera, where the camera and the light sources are focused on an area where a test piece is to be placed. A multiple image processor is connected to the first light source, the second light source, and the camera. The multiple image processor causes the first light source and the second light source to turn on, such as in sequence, and also causes the camera to generate two or more sets of image data, such as one set when each of the light sources is illuminated, through the use of filters or tuned pixels, or otherwise.

Abstract: A system for inspecting a component is provided. The system includes an imaging system, such as a digital camera. A controller is connected to the digital camera. The controller receives the digital image data of a device that is generated by the camera. The controller processes the digital image data to generate control commands. A variable grid generation system is also connected to the controller. The variable grid generation system can receive commands from the controller, and can generate a grid in response to the commands that matches the component and that allows the component to be inspected.

Abstract: A variable intensity lighting system for use with a machine vision apparatus for capturing high contrast images of articles to be inspected, such as semiconductor packages, includes an LED or optical fiber element and flash lamp array configured in multiple segments which are operable to be controlled as to light output intensity by a programmable intensity control circuit operably connected to a microprocessor. The intensity control circuit includes multiple digital potentiometers operable to control selected segments of the lighting array. The control circuit is adapted to control up to 64 segments of the lighting array individually at 64 incremental intensity levels, respectively. The control circuit may include a light failure module to detect a segment failure or a reversed connection.