Patents by Inventor Tan Van Chu

Tan Van Chu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for detecting single event latchup in integrated circuits
    Patent number: 7830165
    Abstract: A method for testing an integrated circuit for potential latchup sites includes applying a voltage to the integrated circuit, measuring a current through the integrated circuit, applying at least one radiation beam to at least one area of the integrated circuit, and detecting an occurrence of a latchup by detecting an increase of the current through the integrated circuit upon applying the at least one radiation beam to the at least one area of the integrated circuit.
    Type: Grant
    Filed: March 31, 2006
    Date of Patent: November 9, 2010
    Assignee: Integrated Device Technology, Inc.
    Inventors: Tan Van Chu, Ken-Chuen Mui