Abstract: A core power detection circuit and an associated input/output (I/O) control system are provided, where the core power detection circuit is utilized for performing power detection in the I/O control system to generate a core power detection signal to control the I/O control system, and the I/O control system operates according to a plurality of supply voltages with respect to a first reference voltage. The core power detection circuit includes: a reference power bias circuit arranged for generating a second reference voltage according to a first supply voltage of the plurality of supply voltages; and a comparison circuit, coupled to the reference power bias circuit, arranged for performing a comparison operation according to the second reference voltage and a second supply voltage of the plurality of supply voltages, to generate a third reference voltage.

Abstract: A core power detection circuit and an associated input/output (I/O) control system are provided, where the core power detection circuit is utilized for performing power detection in the I/O control system to generate a core power detection signal to control the I/O control system, and the I/O control system operates according to a plurality of supply voltages with respect to a first reference voltage. The core power detection circuit includes: a reference power bias circuit arranged for generating a second reference voltage according to a first supply voltage of the plurality of supply voltages; and a comparison circuit, coupled to the reference power bias circuit, arranged for performing a comparison operation according to the second reference voltage and a second supply voltage of the plurality of supply voltages, to generate a third reference voltage.

Abstract: An integrated circuit (IC) including a unit area, a first input/output (IO) cell, a second IO cell, an electrostatic discharge (ESD) component, a first IO pad and a second IO pad is provided. The unit area is divided into several subareas, wherein a subarea of an ith column and a jth row of those subareas is defined as SA(i,j). The first IO cell is arranged in subareas SA(i,j) and SA(i,j+1) of those subareas. The second IO cell is arranged in a subarea SA(i+1,j+1) of those subareas. The ESD component is arranged in at lease one of the subareas of the jth row. The first IO pad is arranged on the first IO cell, and electrically connected to the first IO cell. The second IO pad is arranged on the second IO cell, and electrically connected to the second IO cell.