Patents by Inventor Tanuj Chawla

Tanuj Chawla has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240143239
    Abstract: A memory circuit includes an array of memory cells arranged in rows and columns. A word line is connected to the memory cells of each row. A row decoder circuit operates in response to an internal clock and an address to selectively apply a word line signal to one word line and further generate a dummy word line signal. A control circuit includes a clock generator that generates the internal clock which is reset in response to a reset signal. A first delay circuit receives the dummy word line signal and outputs a first delayed dummy word line signal. A second delay circuit receives the dummy word line signal and outputs a second delayed dummy word line signal. A multiplexer circuit selects between the first and second delayed dummy word line signals for output as the reset signal in response to a logic state of a mode control signal.
    Type: Application
    Filed: October 12, 2023
    Publication date: May 2, 2024
    Applicant: STMicroelectronics International N.V.
    Inventors: Bhupender SINGH, Hitesh CHAWLA, Tanuj KUMAR, Harsh RAWAT, Kedar Janardan DHORI, Promod KUMAR, Manuj AYODHYAWASI, Nitin CHAWLA
  • Publication number: 20240112748
    Abstract: A memory circuit includes an address port, a data input port and a data output port. An upstream shadow logic circuit is coupled to provide address data to the address port of the memory circuit and input data to the data input port of the memory circuit. A downstream shadow logic circuit is coupled to receive output data from the data output port of the memory circuit. The memory circuit includes a bypass path between the address port and the data output port. This bypass path is activated during a testing operation to pass bits of the address data (forming test data) applied by upstream shadow logic circuit from the address port to the data output port.
    Type: Application
    Filed: July 31, 2023
    Publication date: April 4, 2024
    Applicant: STMicroelectronics International N.V.
    Inventors: Tanuj KUMAR, Hitesh CHAWLA, Bhupender SINGH, Harsh RAWAT, Kedar Janardan DHORI, Manuj AYODHYAWASI, Nitin CHAWLA, Promod KUMAR
  • Publication number: 20240071546
    Abstract: The memory array of a memory includes sub-arrays with memory cells arranged in a row-column matrix where each row includes a word line and each sub-array column includes a local bit line. A row decoder circuit supports two modes of memory circuit operation: a first mode where only one word line in the memory array is actuated during a memory read and a second mode where one word line per sub-array are simultaneously actuated during the memory read. An input/output circuit for each column includes inputs to the local bit lines of the sub-arrays, a column data output coupled to the bit line inputs, and a sub-array data output coupled to each bit line input. Both BIST and ATPG testing of the input/output circuit are supported. For BIST testing, multiple data paths between the bit line inputs and the column data output are selectively controlled to provide complete circuit testing.
    Type: Application
    Filed: July 28, 2023
    Publication date: February 29, 2024
    Applicant: STMicroelectronics International N.V.
    Inventors: Hitesh CHAWLA, Tanuj KUMAR, Bhupender SINGH, Harsh RAWAT, Kedar Janardan DHORI, Manuj AYODHYAWASI, Nitin CHAWLA, Promod KUMAR
  • Publication number: 20240069096
    Abstract: An array of a memory includes sub-arrays with memory cells arranged in a row-column matrix where each row includes a word line and each sub-array column includes a local bit line. A row decoder supports two modes of memory operation: a first mode where only one word line in the memory array is actuated during a read and a second mode where one word line per sub-array are simultaneously actuated during the read. An input/output circuit for each column includes inputs to the local bit lines of the sub-arrays, a column data output coupled to the bit line inputs, and a sub-array data output coupled to each bit line input. BIST testing of the input/output circuit is supported through data at both the column data output and the sub-array data outputs in order to confirm proper memory operation in support of both the first and second modes of operation.
    Type: Application
    Filed: July 31, 2023
    Publication date: February 29, 2024
    Applicant: STMicroelectronics International N.V.
    Inventors: Bhupender SINGH, Hitesh CHAWLA, Tanuj KUMAR, Harsh RAWAT, Kedar Janardan DHORI, Manuj AYODHYAWASI, Nitin CHAWLA, Promod KUMAR
  • Publication number: 20230037894
    Abstract: A system and method for upgrading an executable chatbot is disclosed. The system may include a processor including a fallout utterance analyzer, a response identifier, a deviation identifier, a flow generator and enhancer. The fallout utterance analyzer may receive chats logs comprising a plurality of utterances and corresponding bot responses. The fallout utterance analyzer may classify the plurality of utterances into multiple buckets pertaining to at least one of an out-of-scope intent, a newly identified intent, and a new variation of an existing intent. The response identifier may generate auto-generated responses corresponding to new intents for upgrading the executable chatbot. The deviation identifier may overlay corresponding intent in the chat logs with the prestored flow dialog network to designate an extent of deviation with respect to flow prediction performance by the executable chatbot.
    Type: Application
    Filed: August 4, 2021
    Publication date: February 9, 2023
    Applicant: ACCENTURE GLOBAL SOLUTIONS LIMITED
    Inventors: Rinki ARYA, Tanuj Chawla, Shruti Chhabra, Sonam Gupta, Kiran Cskumar, Krishna Kummamuru, Vinay Narayana, Thomas Mammen Tharakan, Anurag Tripathi