Patents by Inventor Tanveer Shaik

Tanveer Shaik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20240303975
    Abstract: A method includes obtaining an authentic image of an assembly and a boundary label provided with the authentic image. The boundary label is associated with a selected region of the authentic image depicting a selected object. The method includes generating an augmented image based on the authentic image and an augmentation model employing one or more augmentation parameters, defining a model boundary label on a blank image at a region that correlates with the selected region of the authentic image, generating an augmented blank image based on the one or more augmentation parameters employed for the augmented image, identifying, as an augmented boundary label associated with augmented image, the model boundary label in the augmented blank image, and outputting an augmented image data, wherein the augmented image data incudes data indicative of the augmented image and of the augmented boundary label.
    Type: Application
    Filed: March 7, 2023
    Publication date: September 12, 2024
    Applicant: Ford Global Technologies, LLC
    Inventors: Raj Sohmshetty, Vikas Rajendra, Surya Gandikota, Tanveer Shaik
  • Patent number: 12023722
    Abstract: A method of inspecting stamped blanks on a stamping line includes identifying at least one target defect location for a given stamped blank configuration where a unique defect type is associated with each of the at least one target defect locations. One or more images of each of the least one identified target defect locations on blanks stamped per the given stamped blank configuration are acquired with one or more cameras assigned to each of the identified target defect locations. The method includes analyzing the one or more images of each of the least one identified target defect locations and detecting if the unique defect type associated with each of the at least one target defect locations is present. Also, each unique defect type is identified with a corresponding unique defect identification algorithm.
    Type: Grant
    Filed: October 23, 2020
    Date of Patent: July 2, 2024
    Assignee: Ford Global Technologies, LLC
    Inventors: Raj Sohmshetty, Tanveer Shaik, Elizabeth Bullard, Francis Maslar, Brodie Schultz
  • Publication number: 20220126345
    Abstract: A method of inspecting stamped blanks on a stamping line includes identifying at least one target defect location for a given stamped blank configuration where a unique defect type is associated with each of the at least one target defect locations. One or more images of each of the least one identified target defect locations on blanks stamped per the given stamped blank configuration are acquired with one or more cameras assigned to each of the identified target defect locations. The method includes analyzing the one or more images of each of the least one identified target defect locations and detecting if the unique defect type associated with each of the at least one target defect locations is present. Also, each unique defect type is identified with a corresponding unique defect identification algorithm.
    Type: Application
    Filed: October 23, 2020
    Publication date: April 28, 2022
    Applicant: Ford Global Technologies, LLC
    Inventors: Raj Sohmshetty, Tanveer Shaik, Elizabeth Bullard, Francis Maslar, Brodie Schultz