Patents by Inventor Tapani VIITALA

Tapani VIITALA has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20220206482
    Abstract: There is provided mechanisms for monitoring substation equipment. A method is performed by a SCADA system. The method comprises obtaining data/signal values of parameters monitored in the substation equipment. The method comprises associating each data/signal value with at least one attention indicator. The method comprises determining one attention indicator value for each of the attention indicators by processing those data/signal values that are associated with the respective attention indicators. All attention indicators for all monitored parameters have one and the same nominal attention indicator value acting as a threshold for abnormal behavior of the substation equipment. The method comprises providing an alert indication to a human machine interface (HMI) when at least one of the attention indicator values is above the nominal attention indicator value.
    Type: Application
    Filed: April 20, 2020
    Publication date: June 30, 2022
    Inventors: Nilanga ABEYWICKRAMA, Tord BENGTSSON, Subrat SAHOO, Anders BROKVIST, Marko Tapani VIITALA, Robert SAERS
  • Patent number: 10839558
    Abstract: An artifact for determining resolution of imaging based on electromagnetic radiation, mechanical waves, or both is presented. The artifact includes a substrate and layers on top of the substrate. The layers include organic material and are stacked on each other in a partially overlapping way so that an edge of a first one of the layers is arranged to intersect with an edge of a second one of the layers. The layers constitute a three-dimensional surface topography where a groove defined by the edges of the first and second ones of the layers is tapering towards a point of intersection between the edges. The resolution is a minimum width of the tapering groove which is revealed by the imaging so that a pre-determined criterion is fulfilled.
    Type: Grant
    Filed: May 8, 2017
    Date of Patent: November 17, 2020
    Assignee: NANOFORM FINLAND OYJ
    Inventors: Edward Hæggström, Ivan Kassamakov, Anton Nolvi, Niklas Sandler, Tapani Viitala, Johan Nyman
  • Publication number: 20200320741
    Abstract: An artifact for determining resolution of imaging based on electromagnetic radiation, mechanical waves, or both is presented. The artifact includes a substrate and layers on top of the substrate. The layers include organic material and are stacked on each other in a partially overlapping way so that an edge of a first one of the layers is arranged to intersect with an edge of a second one of the layers. The layers constitute a three-dimensional surface topography where a groove defined by the edges of the first and second ones of the layers is tapering towards a point of intersection between the edges. The resolution is a minimum width of the tapering groove which is revealed by the imaging so that a pre-determined criterion is fulfilled.
    Type: Application
    Filed: May 8, 2017
    Publication date: October 8, 2020
    Inventors: Edward HÆGGSTRÖM, Ivan KASSAMAKOV, Anton NOLVI, Niklas SANDLER, Tapani VIITALA, Johan NYMAN
  • Publication number: 20190323820
    Abstract: An artifact for improving the vertical resolution of radiation-based imaging is presented. The artifact has a stepped thickness profile with steps. Adjacent steps are arranged to interact differently with radiation used in the radiation-based imaging. Thus, it is possible to identify which step is, in each imaging situation, vertically closest to the imaging plane related to the radiation-based imaging. Thus, a pre-determined vertical position-value related to the closest one of the steps can be used as a vertical position-value related to a radiation-based imaging result obtained in the imaging situation.
    Type: Application
    Filed: December 12, 2017
    Publication date: October 24, 2019
    Inventors: Ivan KASSAMAKOV, Edward HAEGGSTRÖM, Niklas SANDLER, Anton NOLVI, Tapani VIITALA, Alejandro Garcia PEREZ
  • Patent number: 10234266
    Abstract: A method for calibrating electromagnetic radiation-based three-dimensional imaging includes: obtaining (501) a calibration imaging result at least partly on the basis of electromagnetic waves received from a calibration artifact, forming (502) calibration data on the basis of the calibration imaging result and a known thickness profile of the calibration artifact, and correcting (503), with the aid of the calibration data, an imaging result obtained at least partly on the basis of electromagnetic waves received from a sample to be imaged. The calibration artifact includes layers, for example Langmuir-Blodgett films, having pre-determined thicknesses and stacked on each other so as to achieve the pre-determined thickness profile of the calibration artifact. A three-dimensional imaging system configured to carry out the method.
    Type: Grant
    Filed: October 29, 2015
    Date of Patent: March 19, 2019
    Assignees: ABO AKADEMI (ABO AKADEMI UNIVERSITY), HELSINGIN YLIOPISTO
    Inventors: Edward Hæggstrom, Ivan Kassamakov, Anton Nolvi, Tuomo Ylitalo, Niklas Sandler, Tapani Viitala, Johan Nyman
  • Publication number: 20170261309
    Abstract: A method for calibrating electromagnetic radiation-based three-dimensional imaging includes: obtaining (501) a calibration imaging result at least partly on the basis of electromagnetic waves received from a calibration artifact, forming (502) calibration data on the basis of the calibration imaging result and a known thickness profile of the calibration artifact, and correcting (503), with the aid of the calibration data, an imaging result obtained at least partly on the basis of electromagnetic waves received from a sample to be imaged. The calibration artifact includes layers, for example Langmuir-Blodgett films, having pre-determined thicknesses and stacked on each other so as to achieve the pre-determined thickness profile of the calibration artifact. A three-dimensional imaging system configured to carry out the method.
    Type: Application
    Filed: October 29, 2015
    Publication date: September 14, 2017
    Inventors: Edward HÆGGSTROM, Ivan KASSAMAKOV, Anton NOLVI, Tuomo YLITALO, Niklas SANDLER, Tapani VIITALA, Johan NYMAN