Patents by Inventor Tarik Essif Eddine Bourouina

Tarik Essif Eddine Bourouina has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System, method and apparatus for a micromachined interferometer using optical splitting
    Patent number: 7796267
    Abstract: A micromachined interferometer is achieved using a half plane beam splitter. The beam splitter is optically coupled to receive an incident beam and operates to split the incident beam into two interfering beams, each propagating in a different medium. A fixed mirror embedded in one of the mediums reflects one of the interfering beams back towards the half plane beam splitter through such medium, while a moveable mirror, which is controlled by an actuator, reflects the other interfering beam back towards said half plane beam splitter through the other medium. A detection plane detects an interference pattern produced as a result of interference between the reflected interfering beams.
    Type: Grant
    Filed: September 13, 2007
    Date of Patent: September 14, 2010
    Assignee: Si-Ware Systems
    Inventors: Bassam Amanallah Saadany, Diaa Abdelmaguid Khalil, Tarik Essif Eddine Bourouina
  • System, method and apparatus for a micromachined interferometer using optical splitting
    Publication number: 20080080034
    Abstract: A micromachined interferometer is achieved using a half plane beam splitter. The beam splitter is optically coupled to receive an incident beam and operates to split the incident beam into two interfering beams, each propagating in a different medium. A fixed mirror embedded in one of the mediums reflects one of the interfering beams back towards the half plane beam splitter through such medium, while a moveable mirror, which is controlled by an actuator, reflects the other interfering beam back towards said half plane beam splitter through the other medium. A detection plane detects an interference pattern produced as a result of interference between the reflected interfering beams.
    Type: Application
    Filed: September 13, 2007
    Publication date: April 3, 2008
    Inventors: Bassam Amanallah Saadany, Diaa Abdelmaguid Khalil, Tarik Essif Eddine Bourouina