Patents by Inventor Taro SHIRAI

Taro SHIRAI has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10837922
    Abstract: The X-ray imaging apparatus is provided with a plurality of gratings including an X-ray source and a first grating, a detector, a grating rotation mechanism for rotating a plurality of gratings respectively, and an image processor for generating at least a dark field image. The image processor is configured to generate a dark field image captured by arranging the grating at a plurality of angles in a plane orthogonal to the optical axis direction.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: November 17, 2020
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto, Kenji Kimura, Hiroshi Mizushima
  • Publication number: 20200333265
    Abstract: The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.
    Type: Application
    Filed: March 30, 2020
    Publication date: October 22, 2020
    Inventors: Takahiro DOKI, Kenji KIMURA, Taro SHIRAI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO
  • Patent number: 10809210
    Abstract: This X-ray phase imaging apparatus (100) includes a controller (5) that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G1) changed by an adjustment mechanism (3) to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism (3) to adjust a relative position between the subject (S) and the imaging grating (G1) based on the acquired contrast.
    Type: Grant
    Filed: September 6, 2017
    Date of Patent: October 20, 2020
    Assignee: Shimadzu Corporation
    Inventors: Akira Horiba, Taro Shirai, Takahiro Doki, Satoshi Sano
  • Patent number: 10801971
    Abstract: An X-ray phase contrast imaging system includes an X-ray source, a detector, a plurality of gratings including a first grating and a second grating, and a grating positional displacement acquisition section configured to obtain a positional displacement of the grating based on a Fourier transform image obtained by Fourier transforming an interference fringe image detected by the detector.
    Type: Grant
    Filed: April 20, 2018
    Date of Patent: October 13, 2020
    Assignee: Shimadzu Corporation
    Inventors: Naoki Morimoto, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Patent number: 10786217
    Abstract: This X-ray phase-contrast imaging apparatus is equipped with a plurality of gratings and grating holders for holding the plurality of gratings. The plurality of gratings is arranged such that the extending direction of grating components of the plurality of gratings is oriented in a direction in which the positional displacement due to the grating holder becomes maximum in a plane orthogonal to an optical axis of the X-ray.
    Type: Grant
    Filed: June 7, 2018
    Date of Patent: September 29, 2020
    Assignee: Shimadzu Corporation
    Inventors: Akira Horiba, Taro Shirai, Takahiro Doki, Satoshi Sano, Naoki Morimoto
  • Patent number: 10772592
    Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1) that radiates continuous X-rays, a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects the continuous X-rays, and a third grating (2) arranged between the detector (5) and the first grating 3. The first grating (3), the second grating (4), and the third grating (2) are arranged so as to satisfy conditions of predetermined formulas.
    Type: Grant
    Filed: July 10, 2017
    Date of Patent: September 15, 2020
    Assignees: Shimadzu Corporation, OSAKA UNIVERSITY
    Inventors: Satoshi Sano, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Yukihisa Wada, Takuro Izumi, Taro Shirai, Takahiro Doki, Akira Horiba, Takayoshi Shimura, Heiji Watanabe, Takuji Hosoi
  • Patent number: 10739280
    Abstract: The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.
    Type: Grant
    Filed: August 29, 2018
    Date of Patent: August 11, 2020
    Assignee: Shimadzu Corporation
    Inventors: Takahiro Doki, Kenji Kimura, Taro Shirai, Satoshi Sano, Akira Horiba, Naoki Morimoto
  • Publication number: 20200249178
    Abstract: A phase contrast X-ray imaging system includes an X-ray source; a plurality of gratings; a detector; a grating movement mechanism; and an image processor that generates a phase contrast image. The image processor generates the phase contrast image by using a pitch of an intensity change and a function which has the pitch as a variable and expresses the intensity change in a pixel value as a grating moves.
    Type: Application
    Filed: September 19, 2018
    Publication date: August 6, 2020
    Applicant: Shimadzu Corporation
    Inventors: Naoki MORIMOTO, Kenji KIMURA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA
  • Patent number: 10729398
    Abstract: An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit 3b, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.
    Type: Grant
    Filed: July 28, 2017
    Date of Patent: August 4, 2020
    Assignees: Shimadzu Corporation, Osaka University
    Inventors: Satoshi Sano, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Hiroyuki Kishihara, Yukihisa Wada, Takuro Izumi, Taro Shirai, Takahiro Doki, Akira Horiba, Takayoshi Shimura, Heiji Watanabe, Takuji Hosoi
  • Patent number: 10732132
    Abstract: [PROBLEM TO BE SOLVED] To provide a radiation phase contrast imaging device having a small device configuration [SOLVING MEANS] The present invention focused on the findings that the distance between the phase grating 5 and the FPD 4 does not need to be the Talbot distance. The distance between the phase grating 5 and the FPD 4 can be more freely set. However, a self-image cannot be detected unless the self-image is sufficiently magnified with respect to the phase grating 5. The degree on how much the self-image is magnified on the FPD 4 with respect to the original phase grating 5 is determined by a magnification ratio X2/X1. Therefore, in the present invention, the magnification ratio is set to be the same as the magnification ratio in a conventional configuration. With this, even if the distance X2 between the radiation source 3 and the FPD 4 is reduced, a situation in which the self-image cannot be detected by the FPD 4 due to the excessively small size thereof does not occur.
    Type: Grant
    Filed: February 22, 2017
    Date of Patent: August 4, 2020
    Assignees: Shimadzu Corporation, OSAKA UNIVERSITY
    Inventors: Takahiro Doki, Koichi Tanabe, Toshinori Yoshimuta, Kenji Kimura, Akihiro Nishimura, Taro Shirai, Satoshi Sano, Akira Horiba, Takayoshi Shimura, Heiji Watanabe, Takuji Hosoi
  • Publication number: 20200205761
    Abstract: A radiation phase contrast imaging device includes an X-ray source, an X-ray detector configured to detect radiated X-rays, a plurality of gratings, an image processor configured to generate a reconstructed image from an X-ray image acquired from the X-ray detector, a display, and a controller configured or programmed to perform control to display, on the display, the X-ray image before reconstruction and the reconstructed image generated by the image processor.
    Type: Application
    Filed: October 12, 2018
    Publication date: July 2, 2020
    Applicant: Shimadzu Corporation
    Inventors: Kenji KIMURA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20200196969
    Abstract: This X-ray phase difference imaging system (100) includes an X-ray source (1), a plurality of gratings, a detector (4), and an image processor (6), in which the image processor (6) is configured to correct an artifact of a second phase contrast image (10b) that is reconstructed by using a first X-ray image (9a) and a third X-ray image (9c), on the basis of a first phase contrast image (10a) that is reconstructed by using the first X-ray image (9a) and a second X-ray image (9b).
    Type: Application
    Filed: September 18, 2018
    Publication date: June 25, 2020
    Applicant: Shimadzu Corporation
    Inventors: Taro SHIRAI, Kenji KIMURA, Takahiro DOKI, Satoshi SANO, Akira HORIBA, Naoki MORIMOTO
  • Publication number: 20200158662
    Abstract: This X-ray phase contrast imaging apparatus (100) includes an X-ray source (1), a first grating (3) that forms a self-image, a second grating (4), a detector (5) that detects X-rays, an adjustment mechanism (6), and a controller (7) that controls the adjustment mechanism (6) to adjust a misalignment of the first grating (3) or a misalignment of the second grating (4) based on Moire fringes detected by the detector (5).
    Type: Application
    Filed: July 10, 2017
    Publication date: May 21, 2020
    Inventors: Akira HORIBA, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Satoshi SANO, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
  • Patent number: 10656103
    Abstract: The X-ray phase imaging apparatus is configured to include an image generation unit that generates an X-ray phase-contrast image based on a phase-contrast between a step curve representing an intensity change of an X-ray when an object is placed between an X-ray source and a phase grating or between a phase grating and an absorption grating and a step curve when no object is placed therebetween, and is configured to obtain a displacement amount of relative positions of a plurality of gratings based on a plurality of step curves.
    Type: Grant
    Filed: September 14, 2017
    Date of Patent: May 19, 2020
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Taro Shirai, Takahiro Doki, Akira Horiba
  • Patent number: 10620140
    Abstract: The X-ray imaging apparatus is provided with an X-ray source, a plurality of gratings including a first grating and a second grating, a detector, a rotation mechanism for relatively rotating a subject including a fiber bundle and an imaging system, and an image processor for generating a dark field image. The image processor is configured to obtain a three-dimensional dark field image of the subject including at least the fiber bundle from a plurality of dark field images captured at a plurality of rotation angles.
    Type: Grant
    Filed: September 5, 2018
    Date of Patent: April 14, 2020
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto
  • Patent number: 10598611
    Abstract: This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.
    Type: Grant
    Filed: July 12, 2018
    Date of Patent: March 24, 2020
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto
  • Patent number: 10588591
    Abstract: The X-ray imaging apparatus is equipped with an image processing unit for performing a position adjustment of a first dark field image and a second dark field image based on a positional difference amount between a first absorption image of an object and a second absorption image of the object.
    Type: Grant
    Filed: June 7, 2018
    Date of Patent: March 17, 2020
    Assignee: Shimadzu Corporation
    Inventors: Satoshi Sano, Taro Shirai, Takahiro Doki, Akira Horiba, Naoki Morimoto
  • Publication number: 20190343472
    Abstract: An X-ray phase contrast imaging device of the present invention can change an arrangement pitch of slits related to a multi-slit and an arrangement pitch of phase shift sections related to a phase grating. A positional relationship among the multi-slit 3b, the phase grating, and an FPD is determined based on the arrangement pitch of the slits related to the multi-slit, the arrangement pitch of the phase shift sections related to the phase grating, and an arrangement pitch of detection elements related to the FPD. Among these arrangement pitches, by changing the arrangement pitch of the slits and the arrangement pitch of the phase shift sections, the present invention can change the positional relationship among the multi-slit, the phase grating, and the FPD.
    Type: Application
    Filed: July 28, 2017
    Publication date: November 14, 2019
    Inventors: Satoshi SANO, Koichi TANABE, Toshinori YOSHIMUTA, Kenji KIMURA, Hiroyuki KISHIHARA, Yukihisa WADA, Takuro IZUMI, Taro SHIRAI, Takahiro DOKI, Akira HORIBA, Takayoshi SHIMURA, Heiji WATANABE, Takuji HOSOI
  • Patent number: 10441234
    Abstract: An X-ray phase-contrast imaging device capable of easily performing imaging of an object using X-rays of plural energies is provided. The disclosed exemplary configuration includes an X-ray source of a dual energy output type, and an FPD having a high energy X-ray detection surface and a low energy X-ray detection surface so that two types of imaging, imaging by high energy X-ray and imaging by low energy X-ray, can be performed. By imaging so as to scan the object while changing the relative position of the imaging system and the object, two types of imaging can be completed at once.
    Type: Grant
    Filed: June 15, 2017
    Date of Patent: October 15, 2019
    Assignee: Shimadzu Corporation
    Inventors: Koichi Tanabe, Shingo Furui, Hiroyuki Kishihara, Kenji Kimura, Taro Shirai, Takahiro Doki, Satoshi Sano, Akira Horiba
  • Publication number: 20190293577
    Abstract: This X-ray phase imaging apparatus (100) includes a controller (5) that generates a dark field image (Iv) with respect to each of a plurality of relative positions between a subject (S) and an imaging grating (G1) changed by an adjustment mechanism (3) to acquire a contrast of a region of interest (ROI) in the dark field image (Iv), and controls the adjustment mechanism (3) to adjust a relative position between the subject (S) and the imaging grating (G1) based on the acquired contrast.
    Type: Application
    Filed: December 8, 2016
    Publication date: September 26, 2019
    Inventors: Akira HORIBA, Taro SHIRAI, Takahiro DOKI, Satoshi SANO