Patents by Inventor Tarou Takagi
Tarou Takagi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7933441Abstract: It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.Type: GrantFiled: October 27, 2005Date of Patent: April 26, 2011Assignee: Hitachi, Ltd.Inventors: Shouhei Numata, Tarou Takagi, Noriyuki Sadaoka
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Patent number: 7640137Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.Type: GrantFiled: January 30, 2007Date of Patent: December 29, 2009Assignee: Hitachi, LtdInventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
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Patent number: 7468725Abstract: Disclosed is a solid shape describing apparatus provided with a function for defining both absolute coordinate system and floating coordinate system, a function for describing a relationship between the absolute coordinate system and the floating coordinate system, a function for defining a three-dimensional cell array, a function for describing the correspondence between the floating coordinate system and the three-dimensional cell array, and a function for converting the three-dimensional cell array to a solid model.Type: GrantFiled: March 23, 2004Date of Patent: December 23, 2008Assignee: Hitachi, Ltd.Inventor: Tarou Takagi
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Patent number: 7394922Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.Type: GrantFiled: March 6, 2007Date of Patent: July 1, 2008Assignee: Hitachi, Ltd.Inventors: Shouhei Numata, Tarou Takagi
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Patent number: 7260176Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first capacitor having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first capacitor, and an integrator having a second resistor and a second capacitor each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first capacitor are returned to a steady state after irradiation of the pulsed X-ray.Type: GrantFiled: September 13, 2006Date of Patent: August 21, 2007Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20070154076Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.Type: ApplicationFiled: March 6, 2007Publication date: July 5, 2007Inventors: Shouhei Numata, Tarou Takagi
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Patent number: 7228254Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.Type: GrantFiled: August 19, 2005Date of Patent: June 5, 2007Assignee: Hitachi, Ltd.Inventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
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Publication number: 20070124107Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.Type: ApplicationFiled: January 30, 2007Publication date: May 31, 2007Inventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
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Patent number: 7203352Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.Type: GrantFiled: September 25, 2006Date of Patent: April 10, 2007Assignee: Hitachi, Ltd.Inventors: Shouhei Numata, Tarou Takagi
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Publication number: 20070014465Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.Type: ApplicationFiled: September 25, 2006Publication date: January 18, 2007Inventors: Shouhei Numata, Tarou Takagi
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Publication number: 20070009082Abstract: An X-ray sensor signal processing circuit and method used in an industrial X-ray CT apparatus for processing an output signal of a semiconductor X-ray sensor which detects a pulsed X-ray emitted from an accelerator and passed through an object to be inspected. The circuit includes a first resistor having one terminal connected to the X-ray sensor and an other terminal connected to ground, a first condenser having one end terminal connected to a connection point of the X-ray sensor and the first resistor, an operational amplifier having an inverting input connected to an other terminal of the first condenser, and an integrator having a second resistor and a second condenser each connected to the operational amplifier in parallel. The circuit is configured so that at least bias conditions of the X-ray sensor and the first condenser are returned to a steady state after irradiation of the pulsed X-ray.Type: ApplicationFiled: September 13, 2006Publication date: January 11, 2007Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 7142702Abstract: A data processing apparatus comprising a display device for displaying the data; the first recording device for recording the large volume bit map data; the second recording device recording an index data formed as a two-dimensional image obtained by rendering the large volume bit map data; the first data processing device for reading the large volume bit map data from the first recording device and applying the image processing to the large volume bit map data; the second data processing device for reading the large volume bit map data from the first recording device, forming the two-dimensional image data by rendering the large volume bit map data and transferring the image data to the display device; the third data processing device for transmitting the index data to the display device; and the input device for sending the instructions to the first, second and third data processing devices.Type: GrantFiled: November 30, 2004Date of Patent: November 28, 2006Assignee: Hitachi, Ltd.Inventors: Shouhei Numata, Tarou Takagi
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Patent number: 7113563Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.Type: GrantFiled: October 17, 2005Date of Patent: September 26, 2006Assignee: Hitachi, Ltd.Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Publication number: 20060184819Abstract: A “session” is used to describe states of cluster computer middleware. The “session” is a sequence of coherent processes and satisfies the following two conditions. (a) A notification is issued to an application each time the session starts or terminates. (b) Two sessions maintain any of anteroposterior relation, inclusion relation, and no relation.Type: ApplicationFiled: January 13, 2006Publication date: August 17, 2006Inventor: Tarou Takagi
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Publication number: 20060093082Abstract: It is made possible to conduct inner defect inspection using spatial discrete data such as X-ray CT data with higher precision. An inner defect inspection method for inspecting inner defects in an object on the basis of spatial discrete data which describe spatial shape and structure of the object by using spatial elements includes the steps of: extracting an inner defect from the spatial discrete data by using an inner defect extraction unit, collecting the elements included in a neighborhood range, which is set with a predetermined spread around the inner defect extracted by the inner defect extraction unit, as related elements by using a related element collection unit; and measuring feature quantities such as a size and a position of center of gravity of the inner defect on the basis of the related elements collected by the related element collection unit, by using a feature quantity measurement unit.Type: ApplicationFiled: October 27, 2005Publication date: May 4, 2006Inventors: Shouhei Numata, Tarou Takagi, Noriyuki Sadaoka
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Patent number: 7031424Abstract: A CT imaging method and apparatus in which an object is to be imaged by the CT apparatus using an X-ray or radiation, and a tomographic image of the object is obtained, wherein the object includes a reference portion. The processing the tomographic image is processed and a relative positional relation between a reference coordinate system of the object and a coordinate system of the CT apparatus is obtained. The object is imaged by the CT apparatus, and based on the relative positional relation, a tomographic image of a desired position of the object is obtained.Type: GrantFiled: June 15, 2005Date of Patent: April 18, 2006Assignee: Hitachi, Ltd.Inventors: Tarou Takagi, Hiroshi Kamimura, Sadao Uchikawa
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Publication number: 20060069527Abstract: A shape model generation method or system for generating a shape model from shape description data such as X-ray CT data, including a process by virtual probe measuring unit of causing a virtual probe defined as an area having a finite expansion in a virtual space in the shape description data to sequentially scan a plurality of probe paths sequentially set by probe path setting unit, measuring the shape description data and thereby acquiring a characteristic value specific to the position in the virtual space of the virtual probe for each of the probe paths and a process by the probe path setting unit of generating a new probe path using the characteristic value obtained for the probe paths and thereby sequentially setting the plurality of probe paths.Type: ApplicationFiled: August 19, 2005Publication date: March 30, 2006Inventors: Shouhei Numata, Noriyuki Sadaoka, Tarou Takagi
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Patent number: 7006087Abstract: Disclosed is a solid shape describing apparatus provided with a function for defining both absolute coordinate system and floating coordinate system, a function for describing a relationship between the absolute coordinate system and the floating coordinate system, a function for defining a three-dimensional cell array, a function for describing the correspondence between the floating coordinate system and the three-dimensional cell array, and a function for converting the three-dimensional cell array to a solid model.Type: GrantFiled: March 23, 2004Date of Patent: February 28, 2006Assignee: Hitachi, Ltd.Inventor: Tarou Takagi
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Publication number: 20060034420Abstract: An X-ray CT apparatus having X-ray irradiator for irradiating an X-ray to an object to be inspected, an X-ray sensor for detecting an X-ray passed through the object to be inspected, an X-ray sensor signal processing circuit for processing an output signal from the X-ray sensor, and a CT control apparatus for reconstructing an image of the object to be inspected on the basis of an output signal of the X-ray sensor processed by the X-ray sensor signal processing circuit. The X-ray sensor signal processing circuit removes a DC component from the output signal of the X-ray sensor and integrates the output signal of the X-ray sensor having the DC component removed therefrom.Type: ApplicationFiled: October 17, 2005Publication date: February 16, 2006Inventors: Hiroshi Kamimura, Shigeru Izumi, Hiroshi Kitaguchi, Atsushi Yamagoshi, Katsutoshi Satoh, Noriyuki Sadaoka, Tarou Takagi, Kouji Kuwabara, Shouhei Numata
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Patent number: 6982711Abstract: Disclosed is a solid shape describing apparatus provided with a function for defining both absolute coordinate system and floating coordinate system, a function for describing a relationship between the absolute coordinate system and the floating coordinate system, a function for defining a three-dimensional cell array, a function for describing the correspondence between the floating coordinate system and the three-dimensional cell array, and a function for converting the three-dimensional cell array to a solid model.Type: GrantFiled: September 18, 2000Date of Patent: January 3, 2006Assignee: Hitachi, Ltd.Inventor: Tarou Takagi