Patents by Inventor Tasuku Shimizu

Tasuku Shimizu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11964361
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Grant
    Filed: March 3, 2020
    Date of Patent: April 23, 2024
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Takahiro Iida, Teruhiko Nishikawa, Tasuku Shimizu
  • Publication number: 20240077304
    Abstract: The alignment method includes detecting an extending direction of a groove formed on a wafer, based on an image of the wafer picked up by a camera, and performing alignment so as to adjust the extending direction of the groove to be parallel to an array direction of pixels of the camera by relatively rotating the wafer and the camera.
    Type: Application
    Filed: August 9, 2023
    Publication date: March 7, 2024
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventor: Tasuku SHIMIZU
  • Patent number: 11919533
    Abstract: An alert apparatus starts alerting a driver of a host vehicle, when an oncoming vehicle, that is an other vehicle traveling in an oncoming lane with respect to a traveling lane in which the host vehicle is traveling so as to approach the host vehicle and that is predicted to pass through on a specific direction side with respect to a current position of the host vehicle, is present, a turn signal indicator of the host vehicle corresponding to the specific direction side is being operated, and it is likely that the host vehicle starts turning to the specific direction side.
    Type: Grant
    Filed: September 2, 2021
    Date of Patent: March 5, 2024
    Assignee: TOYOTA JIDOSHA KABUSHIKI KAISHA
    Inventors: Mafune Kakeshita, Chen Xi, Kohei Morotomi, Yuto Shimbo, Tasuku Usui, Kenichi Shimizu, Wataru Ike, Tsunekazu Yasoshima
  • Publication number: 20240068798
    Abstract: A measuring device includes a table on which a workpiece is to be mounted, a first imaging unit configured to image the surface of the workpiece on the table, a second imaging unit configured to image the surface of the workpiece on the table, the second imaging unit allowing measurement of a shape and/or roughness of the surface of the workpiece according to a plurality of images taken by scanning the surface of the workpiece in a Z-axis direction, and an image processing unit configured to process the image of the surface of the workpiece taken by the first imaging unit and the plurality of images taken by scanning the surface of the workpiece in the Z-axis direction by the second imaging unit, so as to measure the shape and/or the roughness of the surface of the workpiece.
    Type: Application
    Filed: August 24, 2023
    Publication date: February 29, 2024
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventor: Tasuku SHIMIZU
  • Patent number: 11911850
    Abstract: A pillar delivery method is a method for delivering a plurality of pillars onto a substrate, including a glass panel, to manufacture a glass panel unit. The pillar delivery method includes an irradiation step, a holding step, and a mounting step. The irradiation step includes setting, over a holder, a sheet for use to form pillars and irradiating the sheet with a laser beam to punch out the plurality of pillars. The holding step includes having the plurality of pillars, which have been punched out of the sheet, held by the holder. The mounting step includes picking up some or all of the plurality of pillars from the holder and mounting the pillars onto the substrate.
    Type: Grant
    Filed: May 16, 2019
    Date of Patent: February 27, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Masataka Nonaka, Eiichi Uriu, Takeshi Shimizu, Kazuya Hasegawa, Tasuku Ishibashi, Hiroyuki Abe, Haruhiko Ishikawa
  • Patent number: 11913277
    Abstract: A method for manufacturing a glass panel unit includes an assembling step, a bonding step, a gas exhausting step, a sealing step, and an activating step. The bonding step includes melting a peripheral wall in a baking furnace at a first predetermined temperature to hermetically bond a first glass pane and a second glass pane together with the peripheral wall thus melted. The gas exhausting step includes exhausting a gas from an internal space through an exhaust port in the baking furnace to turn the internal space into a vacuum space. The sealing step includes locally heating to a temperature higher than a second predetermined temperature, and thereby melting, either a port sealing material or an exhaust pipe to seal the exhaust port and thereby obtain a work in progress. The activating step includes activating a gas adsorbent after the sealing step to obtain a glass panel unit.
    Type: Grant
    Filed: June 19, 2019
    Date of Patent: February 27, 2024
    Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
    Inventors: Hiroyuki Abe, Eiichi Uriu, Kazuya Hasegawa, Tasuku Ishibashi, Masataka Nonaka, Takeshi Shimizu, Haruhiko Ishikawa
  • Publication number: 20230136714
    Abstract: A console box includes a box main body having an upper opening, and a lid that opens and closes the upper opening. The lid includes a lid main body, a pivot, and an operation portion. The pivot is provided at one side in a width direction of the lid main body and couples the lid main body to the box main body. The operation portion is provided to correspond to the pivot, and decouples the pivot and the box main body from each other when operated. The lid is configured to be pivotal about the pivot and to be detached from the box main body when the operation portion is operated.
    Type: Application
    Filed: October 28, 2022
    Publication date: May 4, 2023
    Inventors: Naoyuki FUKUI, Yu HISHIDA, Etsuo OZAWA, Tasuku SHIMIZU
  • Patent number: 11571785
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Grant
    Filed: May 28, 2021
    Date of Patent: February 7, 2023
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Takahiro Iida, Teruhiko Nishikawa, Tasuku Shimizu
  • Patent number: 11504869
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Grant
    Filed: February 26, 2021
    Date of Patent: November 22, 2022
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Takahiro Iida, Teruhiko Nishikawa, Tasuku Shimizu
  • Patent number: 11472055
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Grant
    Filed: February 26, 2021
    Date of Patent: October 18, 2022
    Assignee: TOKYO SEIMITSU CO., LTD.
    Inventors: Takahiro Iida, Teruhiko Nishikawa, Tasuku Shimizu
  • Publication number: 20210283745
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Application
    Filed: May 28, 2021
    Publication date: September 16, 2021
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Takahiro IIDA, Teruhiko NISHIKAWA, Tasuku SHIMIZU
  • Publication number: 20210245324
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Application
    Filed: March 3, 2020
    Publication date: August 12, 2021
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Takahiro IIDA, Teruhiko NISHIKAWA, Tasuku SHIMIZU
  • Publication number: 20210178621
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Application
    Filed: February 26, 2021
    Publication date: June 17, 2021
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Takahiro IIDA, Teruhiko NISHIKAWA, Tasuku SHIMIZU
  • Publication number: 20210178550
    Abstract: A workpiece processing device includes a workpiece supporting unit configured to support a workpiece so that the workpiece is rotatable around a first axis parallel to a central axis of the workpiece, a cutting unit having a blade configured to cut a surface of the workpiece, a detecting unit configured to calculate a position of a vertex of the surface in a direction along a second axis which is perpendicular to the first axis and parallel to the blade, and a control unit configured to control the workpiece supporting unit so that a cutting position on the surface is located at a vertex in the direction along the second axis, and relatively move the workpiece supporting unit and the cutting unit so that an incision direction of the blade is on a plane defined by the central axis and the cutting position, thereby forming a groove at the cutting position.
    Type: Application
    Filed: February 26, 2021
    Publication date: June 17, 2021
    Applicant: Tokyo Seimitsu Co., Ltd.
    Inventors: Takahiro IIDA, Teruhiko NISHIKAWA, Tasuku SHIMIZU
  • Patent number: 5414356
    Abstract: A fluxmeter includes an application unit for applying a magnetic field, a superconducting quantum interference element and a flux transmitting circuit. The flux transmitting circuit includes a pickup coil formed of a superconducting print coil and a core for the pickup coil. The core is formed of a soft magnetic material. The core serves to suppress the leakage of magnetic flux to magnetically couple the pickup coil and the superconducting quantum interference element efficiently to improve the sensitivity and resolution of the fluxmeter. The pickup coil may be manufactured by photolithography, sputtering, laser beam deposition, MBE deposition, MOCVD or spray pyrolysis.
    Type: Grant
    Filed: July 30, 1991
    Date of Patent: May 9, 1995
    Assignee: Hitachi, Ltd.
    Inventors: Toshihiko Yoshimura, Tasuku Shimizu, Yuichi Ishikawa, Masahiro Otaka, Yuko Koguchi, Kunio Enomoto, Kunio Hasegawa, Makoto Hayashi, Kazuo Takaku
  • Patent number: 5134368
    Abstract: On the basis of a finding that a magnetic hysteresis of a metal material, among magnetization characteristics changing with secular degradation of the metal material, shows a clear correspondence with the degree of degradation of the metal material, a change in such a magnetization characteristic is measured to estimate the degree of secular degradation of the metal material. In a typical embodiment, a superconducting quantum interference device is used to detect the magnetization characteristic of a measuring object. According to the present invention, the degree of embrittlement of a metal material used in an environment of high temperatures can be quickly detected in a non-destructive fashion so that the danger of brittle fracture of the metal material can be reliably prevented.
    Type: Grant
    Filed: November 8, 1990
    Date of Patent: July 28, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Otaka, Kunio Enomoto, Kunio Hasegawa, Makoto Hayashi, Tasuku Shimizu, Kazuo Takaku
  • Patent number: 5110537
    Abstract: A method and apparatus for inspecting the change in a water quality in terms of the change in a corrosion rate by detecting the capacity change between opposed electrodes due to the corrosion of electrode surfaces. As a result, the water quality can be continuously monitored over a long time while leaving the electrodes in the water to be inspected. Thus, the method and apparatus are suited for controlling the water quality especially in an atomic reactor vessel.
    Type: Grant
    Filed: February 26, 1990
    Date of Patent: May 5, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Hideo Miura, Asao Nishimura, Shinji Sakata, Tasuku Shimizu, Shigeo Hattori
  • Patent number: 5059903
    Abstract: On the basis of a finding that a magnetic hysteresis of a metal material, among magnetization characteristics changing with secular degradation of the metal material, shows a clear correspondence with the degree of degradation of the metal material, a change in such a magnetization characteristic is measured to estimate the degree of secular degradation of the metal material, In a typical embodiment, a superconducting quantum interference device is used to detect the magnetization characteristic of a measuring object. According to the present invention, the degree of embrittlement of a metal material used in an environment of high temperatures can be quickly detected in a non-destructive fashion so that the danger of brittle fracture of the metal material can be reliably prevented.
    Type: Grant
    Filed: September 21, 1988
    Date of Patent: October 22, 1991
    Assignee: Hitachi, Ltd.
    Inventors: Masahiro Otaka, Kunio Enomoto, Kunio Hasegawa, Makoto Hayashi, Tasuku Shimizu, Kazuo Takaku
  • Patent number: 4987367
    Abstract: Measurement of a physical property such as coercive force of a member to be inspected is performed at a plurality of locations in one region of the member. Similar measurement is performed in a plurality of different regions of the member and a maximum or minimum value (extreme value) is determined for each of the regions. On the basis of the extreme values thus determined, a recurrence period is determined in accordance with an extreme value statistic theory with the aid of a computer, whereon an estimated maximum value of the physical property of the member as a whole is determined from the recurrence period. On the basis of the estimated maximum value, the degree of deterioration of the member is predicted by the computer by consulting the data indicating the previously determined relation between the physical property and the degree of deterioration.
    Type: Grant
    Filed: September 12, 1989
    Date of Patent: January 22, 1991
    Assignee: Hitachi, Ltd
    Inventors: Yuichi Ishikawa, Toshihiko Yoshimura, Tasuku Shimizu, Masahiro Otaka, Kazuo Takaku
  • Patent number: 4772336
    Abstract: A method for improving residual stress in a circumferential weld zone of a piping and the like which includes preventing deformation of the weld zone, and causing a local expansion or contraction of a portion of the piping axially spaced from the weld zone thereby effecting a plastic working so as to increase or decrease the diameter of piping. The method can effectively be applied to apparatus and pipe system which are used in a corrosive environment and under action of a static or dynamic outer load.
    Type: Grant
    Filed: February 17, 1987
    Date of Patent: September 20, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Kunio Enomoto, Tasuku Shimizu, Shinji Sakata, Terunobu Koike, Nobuo Shimizu, Tsukasa Ikegami