Abstract: The present invention is directed to a method of determining a strategic expression regime for a pump-dependent mother that optimizes the mother's milk production while minimizing the demands on the mother. The regime takes into account the impact of the interval between breast expressions on milk yield for individual breasts within the mother.

Abstract: The present invention relates to a human milk fortifier as well as to several uses and a method for the production of such a fortifier. A particularly beneficial fortifier can be realised in that at least one human component based on a product directly or indirectly derived from human mammary secretion during non-pregnant, pregnant, lactating and/or involuting periods is used, giving rise to an optimally adapted fortifying effect which is particularly useful in the context of feeding preterm infants.

Abstract: The present invention relates to a method for analysing and treating human milk to be fed to an infant comprising the steps of collecting own mother's milk, taking a sample of the collected own mother's milk, conducting nutritional analysis on said sample, using the collected own mother's milk as nutrition for the infant and using the collected own mother's milk in the form of at least one of the group of: unchanged own mother's milk, fortified own mother's milk, unchanged components of own mother's milk and fortified components of own mother's milk, wherein said form is chosen depending on at least some of said results of the analysis and said infant's condition, the infants condition being chosen from at least one of the following parameters: infant's age, infant's weight, infant's health, infant's shortcomings, infant's deficiencies, time of day when the milk is fed to the infant.

Abstract: A loop-back extender card is plugged into a memory module socket on a personal computer (PC) motherboard. The extender card has a test socket that receives a memory module under test. An Advanced Memory Buffer (AMB) on the memory module fully buffers DRAM chips on the memory module. The AMB inputs from and outputs to the test socket differential northbound lanes (toward a processor) and southbound lanes (away from the processor). The extender card has northbound loopback traces that connect northbound lane outputs from the memory module back to northbound-lane inputs to the memory module. Southbound loopback traces connect southbound lane outputs from the memory module back to southbound-lane inputs to the memory module. The loop-back extender card allows the AMB to perform loopback testing without modifying the PC motherboard. Series/shunt resistors can be placed on the loopback traces, or serpentine traces can be used to increase loopback delays.

Abstract: Two heat chambers are placed side-by-side. Heated air is blown upward through a first chamber and downward through a second heat chamber. An upper heating unit has a blower and heater that heat air exiting the first chamber and blows the heated air into the top of the second chamber. A lower heating unit has a blower and heater that heat air exiting the second chamber and blows the heated air into the top of the first chamber. Air is circulated in a loop through the two heat chambers by the two heating units. Inefficiencies from return pipes are eliminated by using the second chamber. The heated air is blown past memory modules under test in a heat chamber that has an insulated backplane. Pattern-generator cards outside the heat chamber exercise the memory modules and are cooled while memory modules in the heat chamber are heated.

Abstract: Memory modules with an extra dynamic-random-access memory (DRAM) chip for storing error-correction code (ECC) are tested on a personal computer (PC) motherboard tester using a cross-over extender card inserted into a memory module socket on the motherboard. ECC code generated on the motherboard is normally stored in the extra ECC DRAM chip, preventing test patterns such as checkerboards and walking-ones to be written directly to the ECC DRAM chip. During testing, the cross-over extender card routes signals from the motherboard for one of the data DRAM chips to the ECC DRAM chip, while the ECC code is routed to one of the data DRAM chips. The checkerboard or other test pattern is thus written and read from the ECC DRAM chip that normally stores the ECC code. The cross-over extender card can be hardwired, or can have a switch to allow normal operation or testing of the ECC DRAM chip.

Abstract: Hot air blown past memory modules under test in a heat chamber is improved. Hot air entering the chamber from an inlet pipe is split by a manifold and deflectors. Holes in the manifold allow for a relatively even air distribution within the chamber, minimizing temperature variations. Return air is collected by a heat-chamber bottom cover into a return pipe. A heating unit re-heats the return air and blows it into the inlet pipe. One side of the heat chamber is an insulated backplane. Memory modules are inserted into sockets on module motherboards, which are inserted into motherboard sockets on the backplane. On the other side of the backplane, card sockets receive pattern-generator cards outside the heat chamber but electrically connected to the module motherboards through the backplane. The pattern-generator cards exercise the memory modules. The pattern-generator cards are cooled while memory modules in the heat chamber are heated.