Patents by Inventor Tatsuaki Ataka
Tatsuaki Ataka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 7507957Abstract: A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.Type: GrantFiled: August 31, 2005Date of Patent: March 24, 2009Assignee: SII NanoTechnology Inc.Inventors: Masamichi Fujihira, Masatoshi Yasutake, Tatsuaki Ataka
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Publication number: 20070167690Abstract: A mind-body correlation data evaluation apparatus includes a stimulation providing section which provides stimulation to motivate an action of a subject, a physiological response data collecting section which collects physiological response data of the subject, a subjective rating and action rating data collecting section which collects subjective rating data and action rating data of the subject, a control and calculating section which evaluates a mind-body state of the subject based on the stimulation, and at least one of the physiological response data, the subjective rating data, and the action rating data, and a data feed-back section which feeds back to the subject at least the mind-body state of the subject.Type: ApplicationFiled: December 12, 2006Publication date: July 19, 2007Applicants: OLEMI Trading Inc., Olympus CorporationInventors: Masako Miyazaki, Tatsuaki Ataka, Miho Kameyama, Takayoshi Togino
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Publication number: 20060060778Abstract: A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.Type: ApplicationFiled: August 31, 2005Publication date: March 23, 2006Inventors: Masamichi Fujihira, Masatoshi Yasutake, Tatsuaki Ataka
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Patent number: 6589402Abstract: A part fabricating apparatus has a holder for holding an object to be machined immersed in an electrolytic solution. A machining electrode subjects a surface of the object to an electrochemical reaction to electrolytically machine the surface of the object. The machining electrode has a sharp-edged tip and is coated with an insulator except for the sharp-edged tip. A spacing changing unit detects and changes a spacing between the surface of the object and the machining electrode. A potential/current control unit controls a potential/current on the machining electrode. An electrolytic solution changing unit supplies a first electrolytic solution for subjecting the surface of the object to be machined to a removal process to fabricate a cast mold, supplies a second electrolytic solution for depositing a first metal on a surface of the cast mold to form a first metal layer, and supplies a third electrolytic solution for depositing a second metal inside the cast mold to form a part.Type: GrantFiled: January 19, 2001Date of Patent: July 8, 2003Assignee: Seiko Instruments Inc.Inventors: Reiko Irie, Masayuki Suda, Toshihiko Sakuhara, Tatsuaki Ataka
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Patent number: 6229609Abstract: An apparatus capable of measuring the topography and the optical characteristics of the surface of a sample at high resolution irrespective of the transmittance and the conductivity of the sample is realized. The apparatus comprises a probe, a light source for illuminating a sample with light, a photoelectric converter device and optics for receiving light transmitted through the sample or light reflected by the sample, a laser emitting laser light for detecting deflections of the probe, a condenser lens for directing the laser light to the rear surface of the probe, a detection system for detecting reflected light, a rough-motion mechanism and a fine-motion mechanism for moving the sample and the probe relative to each other, a control means for controlling the distance between the sample and the probe, and a computer for controlling the whole apparatus. The probe has a front end portion and a light-propagating body continuous with the front end portion.Type: GrantFiled: April 11, 1994Date of Patent: May 8, 2001Assignee: Seiko Instruments Inc.Inventors: Hiroshi Muramatsu, Tatsuaki Ataka, Masamichi Fujihira, Norio Chiba
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Patent number: 6221228Abstract: A part fabricating method comprises the steps of machining an object to fabricate a part cast mold, depositing a first metal on a surface of the cast mold to form a first metal layer, and depositing a second metal different in kind from the first metal inside the cast mold to form a part. The first metal layer is then selectively removed to take out the part formed inside the cast mold.Type: GrantFiled: December 2, 1998Date of Patent: April 24, 2001Assignee: Seiko Instruments Inc.Inventors: Reiko Irie, Masayuki Suda, Toshihiko Sakuhara, Tatsuaki Ataka
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Patent number: 6111342Abstract: A quartz oscillator for detecting a physicochemical change in a substance to be measured comprises a first electrode having at least two separate electrode portions for contact with the substance to be measured, and a second electrode. A chemical measuring instrument comprises a piezoelectric characteristic-measuring circuit having an output signal line connected to capacitors connected in parallel to the separate electrode portions of the first electrode of the quartz oscillator. An input signal line of the piezoelectric characteristic-measuring circuit is connected to the second electrode of the quartz oscillator. A voltage application circuit is connected to one of the separate electrode portions of the first electrode for applying a voltage between the separate electrode portions. An electrical current-measuring circuit is connected to the other of the separate electrode portions which is electrically grounded.Type: GrantFiled: March 10, 1994Date of Patent: August 29, 2000Assignee: Seiko Instruments Inc.Inventors: Hiroshi Muramatsu, Tatsuaki Ataka
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Patent number: 6059954Abstract: An electrochemical machining method in which a work piece and a machining electrode are opposed to each other and dipped in an electrolyte solution, and a surface of the work piece is machined by causing an electrolytic reaction between the surface of the work piece and a tip of the machining electrode in a state where a separating distance between the surface of the work piece and the tip of the machining electrode is adjusted and a desired separating distance is maintained, wherein a zero contact reference position where the surface of the work piece and the tip of the machining electrode are brought into contact with each other and the separating distance between the work piece and the machining electrode is nullified is electrically detected, moving distances of the work piece and the machining electrode from the zero contact reference position are detected, a relative separating distance between the surface of the work piece and the tip of the machining electrode is calculated based on a result of the deType: GrantFiled: March 25, 1998Date of Patent: May 9, 2000Assignee: Seiko Instruments Inc.Inventors: Masayuki Suda, Toshihiko Sakuhara, Tatsuaki Ataka
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Patent number: 6046053Abstract: A process is disclosed for sequencing proteins or peptides from the C-terminal end. The process comprises the steps of reacting the peptide or protein with an alkyl acid anhydride to convert the carboxy-terminal thereof into oxazolone, liberating the C-terminal amino acid by reaction with acid and alcohol or with ester, and identifying the liberated amino acid or amino acid derivative.Type: GrantFiled: May 23, 1997Date of Patent: April 4, 2000Assignee: Seiko Instruments Inc.Inventors: Akira Tsugita, Keiji Takamoto, Tatsuaki Ataka, Toshihiko Sakuhara, Toyoaki Uchida
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Patent number: 5962642Abstract: A protein or peptide which has an amino-terminus serine or threonine which has an acetylated alpha-amino group is allowed to react with an acid, and then allowed to react with an isothiocyanate under acidic conditions to thereby obtain a thiocarbamyl compound. Then the compound is to be analyzed using Edman degradation. Analysis can be performed with fewer operation steps and without using enzymes.Type: GrantFiled: May 9, 1997Date of Patent: October 5, 1999Assignee: Seiko Instruments Inc.Inventors: Akira Tsugita, Keiji Takamoto, Tatsuaki Ataka, Toshihiko Sakuhara, Toyoaki Uchida
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Patent number: 5885434Abstract: A method for performing fine working of a material by electrochemical reaction comprises a two-step scanning operation in which a surface topography of the material is obtained during a first scan which is used to control the position of a probe during a second scan in which an electrochemical reaction is performed. During the first scan, an electrochemical cell is constructed with a four-electrode system, including the probe, a material to be worked, a reference electrode and a counter electrode. The potential of each of the probe and the material to be worked is set so that no electrochemical reaction occurs during the first scan. Data representative of the surface topography is stored and used to control the position of the probe during the second scan in which an electrochemical cell is constructed with a three-electrode system, including the probe, the material, and the reference electrode.Type: GrantFiled: April 1, 1997Date of Patent: March 23, 1999Assignee: Seiko Instruments Inc.Inventors: Masayuki Suda, Toshihiko Sakuhara, Tatsuaki Ataka
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Patent number: 5876581Abstract: A process for synthesizing iron(III) hexacyanoferrate(II) as a blue insoluble product on the surface of a working electrode is disclosed which comprises immersing a pair of electrodes in a solution mixture of an iron(III) ion-containing solution and a hexacyanoferrate(III) ion-containing solution and effecting electrolysis with one of the electrodes as an anode and the other as a cathode, whereby iron(III) hexacyanoferrate(II) is deposited on the surface of the cathode.Type: GrantFiled: May 22, 1995Date of Patent: March 2, 1999Assignee: Seiko Instruments Inc.Inventors: Kingo Itaya, Kimio Shibayama, Shinobu Toshima, Tatsuaki Ataka, Koji Iwasa
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Patent number: 5825182Abstract: In order to enhance the sensitivity of a nondestructive testing system, a pair of superconducting coils are disposed in the same plane such that a current flowing through the respective coils when exposed to a uniform magnetic field cancels out. As a result of this configuration, the detection coils are immune to noise, offset fields or other uniform ambient phenomena. In one embodiment, the nondestructive testing unit includes a plurality of detection coils, a SQUID having a pair of connectors for connection to the detection coils, a probe for supporting the detection coils and the SQUID in a coolant, a cryostat for supporting the probe and for keeping the coolant constant, a controller for processing a signal transmitted from the SQUID, and a display device for displaying the result of the processing. At least two detection coils are disposed in the same plane, are directly connected to the SQUID and are integrated on a semiconductor substrate.Type: GrantFiled: October 19, 1994Date of Patent: October 20, 1998Assignee: Seiko Instruments Inc.Inventors: Satoshi Nakayama, Kazuo Chinone, Akikazu Odawara, Tatsuaki Ataka
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Patent number: 5686207Abstract: A method of forming a mask for photolithography comprises forming a transparent conductive film on a transparent substrate. The substrate and an electrode having a sharp front end are immersed in an electrolytic solution. The sharp front end of the electrode and the transparent film are then positioned close to each other while controlling a distance therebetween. The substrate and the electrode are then scanned relative to each other in two-dimensions while maintaining the distance between the sharp front end of the electrode and the transparent film constant. Thereafter, an electrochemical reaction is processed on the substrate while a voltage is applied between the transparent film and the electrode to form a mask pattern on the substrate. During repair of the mask thus formed, the substrate and the electrode are immersed in the electrolytic solution.Type: GrantFiled: July 19, 1995Date of Patent: November 11, 1997Assignee: Seiko Instruments Inc.Inventors: Masayuki Suda, Akito Ando, Tatsuaki Ataka
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Patent number: 5654131Abstract: There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole.Type: GrantFiled: February 1, 1996Date of Patent: August 5, 1997Assignee: Seiko Instruments Inc.Inventors: Masamichi Fujihira, Hiroshi Muramatsu, Norio Chiba, Tatsuaki Ataka
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Patent number: 5513168Abstract: There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole.Type: GrantFiled: October 18, 1994Date of Patent: April 30, 1996Assignees: Seiko Instruments Inc., Masamichi FujihiraInventors: Masamichi Fujihira, Hiroshi Muramatsu, Norio Chiba, Tatsuaki Ataka
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Patent number: 5449901Abstract: An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and an optical detecting system 15.Type: GrantFiled: July 22, 1993Date of Patent: September 12, 1995Assignees: Seiko Instruments Inc., Masamichi FujihiraInventors: Masamichi Fujihira, Tatsuaki Ataka, Hiroshi Muramatsu
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Patent number: 5304795Abstract: A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample and detects detailed distribution of optical constants of the sample. Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiates to the sample material coated on the top surface of the optical prism. The apparatus includes means for maintaining a predetermined distance between the sample and an optical fiber tip or means for detecting a positioning signal. Further, it becomes possible to detect fluorescent condition of the sample.Type: GrantFiled: September 30, 1992Date of Patent: April 19, 1994Assignees: Seiko Instruments Inc., Masamichi FujihiraInventors: Masamichi Fujihira, Tatsuaki Ataka, Toshihiro Sakuhara
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Patent number: 5049657Abstract: Peptide or protein are immobilized on a solid surface and exposed to acid mixture for hydrolysis. The acid mixture comprises mainly hydrocloride and trifruoracetic acid. The temperature of it is in the range of 100.degree. to 180.degree. C. The time period of exposing is in the range of 5 to 120 min.Type: GrantFiled: December 24, 1985Date of Patent: September 17, 1991Assignee: Seiko Instruments & Electronics Ltd.Inventors: Akira Tsugita, Hans W. Mewes, Tatsuaki Ataka
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Patent number: 4962480Abstract: An output section comprising a needle which has a fine tip portion. A data stored in a memory is read out by applying electrical stimulation between the tip portion of the needle and the memory. A memory reading apparatus enables non-contact reading on an atomic or molecular scale.Type: GrantFiled: September 12, 1988Date of Patent: October 9, 1990Assignee: Seiko Instruments, Inc.Inventors: Manabu Ooumi, Toshihiko Sakuhara, Tatsuaki Ataka