Abstract: A serial I/F has: a FIFO portion to which m- or n-bit (m<n) parallel data is written based on PCLK; a FIFO reader that reads the parallel data written to the FIFO portion m bits at a time based on FCLK; a parallel/serial converter that converts the m-bit parallel data read by the FIFO reader into 1-bit serial data based on PLLCLK; a PLL circuit that produces PLLCLK by multiplying PCLK by a factor of m or n; and a frequency divider circuit that produces FCLK by dividing the frequency of PLLCLK by m. Here, the multiplication factor of the PLL circuit is so controlled as to be changed according to the number of bits of the parallel data written to the FIFO portion. This makes it possible to flexibly deal with parallel inputs having different bus widths without unduly increasing a device scale and cost.

Abstract: A serial I/F has: a FIFO portion to which m- or n-bit (m<n) parallel data is written based on PCLK; a FIFO reader that reads the parallel data written to the FIFO portion m bits at a time based on FCLK; a parallel/serial converter that converts the m-bit parallel data read by the FIFO reader into 1-bit serial data based on PLLCLK; a PLL circuit that produces PLLCLK by multiplying PCLK by a factor of m or n; and a frequency divider circuit that produces FCLK by dividing the frequency of PLLCLK by m. Here, the multiplication factor of the PLL circuit is so controlled as to be changed according to the number of bits of the parallel data written to the FIFO portion. This makes it possible to flexibly deal with parallel inputs having different bus widths without unduly increasing a device scale and cost.

Abstract: A test circuit employs hardware to test a memory cell in a memory block. The address of an error cell detected is stored in a first or second error address register. Access made by a processor to the address of the error cell would be detected by a first or second address comparator. Data is then written to a first or second correction register, which serves as an alternative cell, or data is read from one of the registers.

Abstract: An apparatus for processing a block of image data at a high speed, in which two items of data consecutive in data scan are simultaneously written in different memories and are processed as a set of data having a valid portion and an invalid portion and in which the subsequent process is differentiated depending on the frequency of occurrence of the data to suppress any increase in the scale of the circuit and to increase the speed of the same.

Abstract: A test circuit employs hardware to test a memory cell in a memory block. The address of an error cell detected is stored in a first or second error address register. Access made by a processor to the address of the error cell would be detected by a first or second address comparator. Data is then written to a first or second correction register, which serves as an alternative cell, or data is read from one of the registers.