Abstract: A test system tests a semiconductor integrated circuit. The semiconductor integrated circuit including a signal terminal to and from a signal is input and output, an RF circuit which processes an RF signal, and a capacitor which is connected between the signal terminal and the RF circuit. The test system has a probe which applies a test signal to the signal terminal and a tester which tests the RF circuit. Before the RF circuit is tested, with the probe and the signal terminal in contact with each other, the tester determines whether the probe and the signal terminal are in a conductive state.

Abstract: A main driver and a sub-driver control circuit are provided respectively to receive a test pattern signal for testing a device. The main driver drives the test pattern signal to output a first driven signal. The sub-driver control circuit modifies the test pattern signal to output a modified pattern signal. The modified pattern signal is provided to a sub-driver. The first sub-driver drives the modified pattern signal to output a second driven signal. The first and the second driven signals are combined. The combined signal is provided to a terminal of the device as a test signal.