Abstract: An orthogonal acceleration time-of-flight (oa-TOF) mass spectrometer has an ion source producing ions, a first region of a low degree of vacuum, an ion reservoir, and a second region of a high degree of vacuum. A space for transporting the ions produced by the ion source is placed in the first region. The ion reservoir accelerates the ions transported in from the first region in a pulsed manner and extracts the ions. A time-of-flight mass analyzer for mass separating the ions extracted from the ion reservoir is disposed in the second region, together with the ion reservoir. An isolation valve is mounted in a hole that places the first and second regions in communication with each other to permit the first and second regions to be isolated from each other.

Abstract: An inexpensive electrospray mass spectrometer capable of performing measurements consecutively from the ESI mode to the cold-spray ionization mode and vice versa. The electrospray mass spectrometer has an electrospray ion source, a nebulization nozzle, and a sampling orifice. The axes of the nozzle and orifice intersect each other. The instrument has a movable cold-spray desolvation chamber. In the electrospray ionization mode, the desolvation chamber is placed off the axis of the nebulization nozzle. In the cold-spray ionization mode, the desolvation chamber is set on the axis of the nebulization nozzle.

Abstract: An inexpensive electrospray mass spectrometer capable of performing measurements consecutively from the ESI mode to the cold-spray ionization mode and vice versa. The electrospray mass spectrometer has an electrospray ion source, a nebulization nozzle, and a sampling orifice. The axes of the nozzle and orifice intersect each other. The instrument has a movable cold-spray desolvation chamber. In the electrospray ionization mode, the desolvation chamber is placed off the axis of the nebulization nozzle. In the cold-spray ionization mode, the desolvation chamber is set on the axis of the nebulization nozzle.

Abstract: A time-of-flight mass spectrometer capable of cutting out a major portion of carrier gas-derived ions ahead of the ion reservoir. The ion source is of the electron impact type and has source magnets for deflecting some of the produced ions away from the center axis of the ion reservoir. Electrostatic lenses for promoting the deflection of the ions caused by the source magnets and a differentially pumped slit for cutting off the deflected ions are mounted downstream of the ion source.

Abstract: An orthogonal acceleration time-of-flight (oa-TOF) mass spectrometer has an ion source producing ions, a first region of a low degree of vacuum, an ion reservoir, and a second region of a high degree of vacuum. A space for transporting the ions produced by the ion source is placed in the first region. The ion reservoir accelerates the ions transported in from the first region in a pulsed manner and extracts the ions. A time-of-flight mass analyzer for mass separating the ions extracted from the ion reservoir is disposed in the second region, together with the ion reservoir. An isolation valve is mounted in a hole that places the first and second regions in communication with each other to permit the first and second regions to be isolated from each other.

Abstract: The instrument cold sprays a solution sample at a low temperature and desolvates the sample. Under this condition, a mass analysis is performed. The instrument comprises a needle pipe (8) through which the solution sample is passed, a sheath tube (24) formed coaxially with the needle pipe (8) and passing a temperature-controlled nebulizing gas therethrough, the above-described desolvation block (3), means for cooling the block (15), means for heating the block (4), and a temperature sensor (5) for detecting the temperature of the block (3). The block (3) has a passage for charged liquid droplets of the solution sample cold sprayed from the tip of the needle pipe (8), and acts to remove the solvent from the charged liquid droplets flowing through the passage. A coldspray mass spectrometer is offered which has a desolvation block whose temperature can be easily controlled. In the instrument, condensation of water and electrical leakage are prevented for a long time.

Abstract: An orthogonal acceleration time-of-flight (oa-TOF) mass spectrometer is offered in which the repeller plate forming the ion reservoir is prevented from being electrically charged. This in turn prevents the mass spectral resolution and sensitivity from deteriorating. The mass spectrometer has an (a) external ion source for producing ions, (b) a space in which the ions are made to stay, (c) the ion reservoir consisting of the repeller plate and grids disposed on the opposite sides of the space to accelerate the ions in a pulsed manner out of the space, (d) a time-of-flight mass spectrometric portion for mass separating the ions taken out of the ion reservoir via its internal grids, (e) an ion detector for detecting the mass-separated ions, and (f) a heater for heating the repeller plate.

Abstract: A time-of-flight mass spectrometer capable of cutting out a major portion of carrier gas-derived ions ahead of the ion reservoir. The ion source is of the electron impact type and has source magnets for deflecting some of the produced ions away from the center axis of the ion reservoir. Electrostatic lenses for promoting the deflection of the ions caused by the source magnets and a differentially pumped slit for cutting off the deflected ions are mounted downstream of the ion source.

Abstract: An orthogonal acceleration time-of-flight (oa-TOF) mass spectrometer is offered in which the repeller plate forming the ion reservoir is prevented from being electrically charged. This in turn prevents the mass spectral resolution and sensitivity from deteriorating. The mass spectrometer has an (a) external ion source for producing ions, (b) a space in which the ions are made to stay, (c) the ion reservoir consisting of the repeller plate and grids disposed on the opposite sides of the space to accelerate the ions in a pulsed manner out of the space, (d) a time-of-flight mass spectrometric portion for mass separating the ions taken out of the ion reservoir via its internal grids, (e) an ion detector for detecting the mass-separated ions, and (e) a heater for heating the repeller plate.

Abstract: A good chip for repair is provided only in a position on the rear surface of a module substrate corresponding to the position of a bare chip that has been detected as being defective. In addition, the entirety of the rear surface of the module substrate is integrally molded regardless of whether or not a good chip is mounted. Thereby, a semiconductor memory module is formed so as to be in a form wherein gaps do not easily occur between a plurality of semiconductor memory modules when the semiconductor memory modules are packed in a box for transport of the semiconductor memory modules. As a result, damage can be prevented from occurring in a semiconductor module wherein good chips for repair are mounted at the time of transport in packaging.

Abstract: A semiconductor module is provided with a module substrate, a plurality of semiconductor chips formed on the module substrate, and a mold resin formed so as to integrally cover the plurality of semiconductor chips. Then, a plurality of trenches is formed on the main surface of the module substrate, so as to be parallel to one side forming the main surface, on the side on which the bare chips are formed. Thereby, a semiconductor module can be obtained wherein it is possible to restrict separation of the mold resin from the module substrate.

Abstract: The instrument cold sprays a solution sample at a low temperature and desolvates the sample. Under this condition, a mass analysis is performed. The instrument comprises a needle pipe (8) through which the solution sample is passed, a sheath tube (24) formed coaxially with the needle pipe (8) and passing a temperature-controlled nebulizing gas therethrough, the above-described desolvation block (3), means for cooling the block (15), means for heating the block (4), and a temperature sensor (5) for detecting the temperature of the block (3). The block (3) has a passage for charged liquid droplets of the solution sample cold sprayed from the tip of the needle pipe (8), and acts to remove the solvent from the charged liquid droplets flowing through the passage. A coldspray mass spectrometer is offered which has a desolvation block whose temperature can be easily controlled. In the instrument, condensation of water and electrical leakage are prevented for a long time.

Abstract: A semiconductor memory device by the shared sense amplifier system, including: a sense amplifier; a plurality of bit line pairs; a plurality of word lines; a plurality of dynamic RAM cells, each of the RAM cells being connected to one bit line pair and one word line which is selected when data is read or written; switch circuit, provided for each of the plural bit line pairs, for connecting the corresponding bit line pair to said sense amplifier when the switch circuit is turned on and for disconnecting the corresponding bit line pair from said sense amplifier when the switch circuit is turned off; and bit line connection control circuit for, in order to read data from a predetermined RAM cell of the plural RAM cells in a test for detecting faults due to margin deficiency, turning on the switch circuit for the bit line pair connected to the RAM cell, and thereafter, before the word line connected to the RAM cell is selected, turning on the switch circuit for bit line pairs other than the bit line pair connect

Abstract: An ion source for use in a mass spectrometer comprises a porous member arranged in the ionization chamber and bearing against the inlet tube so as to obstruct the open end of the inlet tube. A particle beam is directed to the effluent which exudes from the surface of the porous member after passing through the porous member. A cover shields a portion of the surface of the porous member from the particle beam so as only the most recently exuded effluent is irradiated. The effluent supplied into the porous member by the inlet tube is allowed to exude from surfaces of the porous member other than the surface bombarded with the particle beam so as to carry away stale effluents.

Abstract: There is disclosed an ion source for use in a mass spectrometer. The ion source has an ionization chamber, a pumping means for continuously pumping liquid sample, an inlet tube whose front end is located inside the ionization chamber to introduce the liquid sample delivered from the pumping means into the ionization chamber, a means for ionizing the sample introduced into the ionization chamber, and an exhaust pipe connected with the inlet tube. The ion source further includes a means for applying a pressure on the superfluous sample in the exhaust pipe by employing a gaseous material. Thus, the flow rate of the sample introduced into the ionization chamber through the inlet tube is stabilized.